X-ray backscatter system and method for detecting discrepancies in items

Patent metadata

Field	Value
Publication number	US-9709514-B2
Application number	US-201213437459-A
Country	US
Kind code	B2
Filing date	Apr 2, 2012
Priority date	Apr 2, 2012
Publication date	Jul 18, 2017
Grant date	Jul 18, 2017

Abstract

A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.

First claim

The invention claimed is:

1. A method for detecting foreign object debris in an item comprising:
directing, with an emitter of a scanner system, an x-ray fan beam at the item during a scan along a single scan axis, wherein the x-ray fan beam is oriented along an axis that is orthogonal to the single scan axis, and wherein the x-ray fan beam penetrates the item and a portion of energy from the x-ray fan beam is backscattered from the item;
detecting, with a detector of the scanner system, energy intensities of the portion of the energy from the x-ray fan beam backscattered from the item while scanning along the single scan axis;
forming, with an image-former, a one-dimensional image of the item, wherein the one-dimensional image includes a correspondence between a plurality of different points along the single scan axis and the energy intensities detected at each of the plurality of different points along the single scan axis; and
comparing, with a comparator, the one-dimensional image with a reference one-dimensional image to determine whether foreign object debris is present behind or within the item, wherein the comparing includes determining a difference between each point of the reference image and a corresponding different point of the plurality of different points along the single scan axis.

2. The method of claim 1 , wherein the one-dimensional image is a detected wave intensity plot.

3. The method of claim 1 , wherein the detecting the reflected energy waves from the item along the at least one dimension further comprises detecting the backscattered X-rays with a one-dimensional backscatter X-ray scanner.

4. The method of claim 1 , wherein the comparing the one-dimensional image of the item with the reference image further comprises subtracting the reference image from the one-dimensional image to form a subtracted image.

5. The method of claim 1 , wherein the reference image comprises a second one-dimensional image of the item without the foreign object debris or of a model of the item without the foreign object debris.

6. The method of claim 1 , further comprising subjecting the item to a modification, forming the reference image of the item before the modification, and forming the one-dimensional image of the item after the modification.

7. The method of claim 1 , wherein the item comprises an aircraft panel having foreign object debris located behind or within the aircraft panel, and further comprising determining that the foreign object debris is present behind or within the item based on the one-dimensional image of the item.

8. The method of claim 1 , further comprising using a linear motion device to direct the energy waves at the item along the single scan axis.

9. A system for detecting foreign object debris in an item, the system comprising:
an emitter configured to emit an x-ray fan beam at an item during a scan along a single scan axis, wherein the emitter includes an x-ray tube with a rectangular slit oriented along an axis perpendicular to the single scan axis, and wherein the x-ray fan beam penetrates the item and the item is configured to backscatter a portion of energy from the x-ray fan beam;
a detector configured to detect energy intensities of the portion of the x-ray fan beam backscattered from the item while scanning along the single scan axis;
an image-former configured to form a one-dimensional image of the item, wherein the one-dimensional image includes a correspondence between a plurality of different points along the single scan axis and the energy intensities detected at each of the plurality of different points along the single scan axis; and
a comparator configured to compare the one-dimensional image of the item with a reference one-dimensional image to determine whether foreign object debris is present behind or within the item, wherein the comparing includes determining a difference between each point of the reference image and a corresponding different point of the plurality of different points along the single scan axis.

10. The system of claim 9 , wherein the image-former is configured to form a detected wave intensity plot.

11. The system of claim 9 , further comprising a database, accessible by the comparator, of known characteristics of the foreign object debris.

12. The system of claim 9 , further comprising a linear motion device which is configured to move at least one of: the emitter and the detector.

13. A software product for detecting foreign object debris in an item, the software product including computer program instructions stored on a non-transitory computer-readable medium, which when the computer program instructions are executed by a processor cause the processor to perform operations, the operations comprising:
directing, with an emitter of a scanner system, an x-ray fan beam at the item during a scan along a single scan axis, wherein the x-ray scan beam is oriented along an axis perpendicular to the single scan axis, and wherein the x-ray fan beam penetrates the item and a portion of energy from the x-ray fan beam is backscattered from the item;
detecting, with a detector of a scanner system, energy intensities of the portion of the x-ray fan beam backscattered from the item while scanning along the single scan axis;
generating, with an image processor, a one-dimensional image of the item, wherein the one-dimensional image includes a correspondence between a plurality of different points along the single scan axis and the energy intensities detected at each of the plurality of different points along the single scan axis; and
comparing, with a comparator, the one-dimensional image with a reference one-dimensional image to determine whether foreign object debris is present behind or within the item, wherein the comparing includes determining a difference between each point of the reference image and a corresponding different point of the plurality of different points along the single scan axis.

14. The software product of claim 13 , wherein the operations further comprise moving, with a linear motion device, at least one of: the emitter and the one-dimensional detector.

Assignees

• Edwards William Talion
• Georgeson Gary E
• Engel James E
• Boeing Co

Inventors

• Edwards William Talion
• Georgeson Gary E
• Engel James E

Classifications

• G01N2223/426

  image comparing, unknown with known substance · CPC title

• G01N2223/631

  large structures, walls · CPC title

• G01N23/203 Primary

  Measuring back scattering · CPC title

• G01N2223/6466

  flaws comparing to predetermined standards · CPC title

• G01N2223/652

  impurities, foreign matter, trace amounts · CPC title