Integrated computational element with multiple frequency selective surfaces

Patent metadata

Field	Value
Publication number	US-9708908-B2
Application number	US-201414762194-A
Country	US
Kind code	B2
Filing date	Jun 13, 2014
Priority date	Jun 13, 2014
Publication date	Jul 18, 2017
Grant date	Jul 18, 2017

Abstract

An optical analysis tool includes an integrated computational element (ICE). The ICE includes a plurality of layers stacked along a first axis. Constitutive materials of the layers are electrically conductive and patterned with corresponding patterns. An arrangement of the patterns with respect to each other is related to a characteristic of a sample.

First claim

What is claimed is:

1. A measurement tool for measuring a characteristic of a sample, the measurement tool comprising: an integrated computational element (ICE) comprising a plurality of layers stacked along a first axis, wherein each of the layers has a plane perpendicular to the first axis, the layers being laterally offset from each other along the first axis, and a constitutive material of each of the layers being electrically conductive and patterned with a corresponding pattern, wherein an arrangement of the patterns with respect to each other is related to a characteristic of a sample, wherein the plurality of layers of the ICE comprises a first layer of electrically conductive material patterned with a first pattern and a second layer of electrically conductive material patterned with a second pattern, and the arrangement of the first and second patterns with respect to each other comprises the lateral offset in the plane perpendicular to the first axis, such that the offset causes a Moiré pattern related to the characteristic of the sample.

2. The measurement tool of claim 1 , wherein the lateral offset comprises a translation or a rotation in the plane perpendicular to the first axis.

3. The measurement tool of claim 1 , wherein the first pattern is substantially the same as the second pattern.

4. The measurement tool of claim 3 , wherein a pattern difference between the first and second patterns is less than a target pattern difference.

5. The measurement tool of claim 1 , wherein
the plurality of layers of the ICE comprises three or more layers of electrically conductive material, and
the arrangement of the patterns of the three or more layers of material with respect to each other has translational symmetry along the first axis to form a three dimensional (3D) lattice of the patterns, such that the 3D lattice is related to the characteristic of the sample.

6. The measurement tool of claim 5 , wherein the constitutive electrically conductive materials of the three or more layers are patterned with a same pattern.

7. The measurement tool of claim 5 , wherein the three or more layers comprise
a first layer of electrically conductive material patterned with a first pattern,
a third layer of electrically conductive material patterned with a third pattern, and
a second layer of electrically conductive material between the first and third layers, the second layer being patterned with a second pattern different from the first pattern.

8. The measurement tool of claim 7 , wherein a separation between the first and second patterns is different from a separation between the second and third patterns.

9. The measurement tool of claim 7 , wherein the third pattern is the same as the first pattern.

10. The measurement tool of claim 5 , wherein the constitutive electrically conductive material of at least some adjacent layers are different materials.

11. The measurement tool of claim 1 , wherein the ICE comprises one or more substrates, wherein the substrates of the ICE are formed from materials that are transparent to light in at least a portion of a wavelength range.

12. The measurement tool of claim 11 , wherein adjacent layers of the ICE are separated by a respective one of the substrates.

13. The measurement tool of claim 11 , wherein
a first layer of the ICE is patterned on a surface of a single substrate, and
remaining layers of the ICE are patterned on a surface of a respective previous layer.

14. The measurement tool of claim 11 , wherein each pattern of the constitutive electrically conductive materials of the plurality of layers comprises the same features forming a periodic array associated with the pattern and arranged parallel to the one or more substrates.

15. The measurement tool of claim 14 , wherein the features each comprise one or more geometric shapes selected from the group consisting of polygons and circles.

16. The measurement tool of claim 14 , wherein the constitutive electrically conductive materials of the layers of the ICE comprise one or more electrically conductive inks.

17. The measurement tool of claim 16 , wherein the one or more electrically conductive inks comprise metal flakes.

18. The measurement tool of claim 17 , wherein the metal flakes comprise silver or gold.

19. The measurement tool of claim 16 , wherein the one or more electrically conductive inks comprise graphite or conductive polymers.

20. A method comprising:
printing the patterns associated with the layers of the ICE of the measurement tool of claim 18 on the one or more substrates of the ICE using the one or more electrically conductive inks.

21. The method of claim 20 , wherein said printing of the electrically conductive ink patterns on the respective separator substrates is performed using a jet printer.

22. The method of claim 20 , wherein said printing of the electrically conductive ink patterns on the respective separator substrates is performed using micro-contact printing with a stamp.

23. The measurement tool of claim 1 , wherein the arrangement of the patterns causes the ICE to selectively transmit or reflect, during operation of the measurement tool, light in at least a portion of a wavelength range by differing amounts, the differing amounts being related to the characteristic of the sample.

24. The measurement tool of claim 23 , wherein
the wavelength range comprises a first wavelength sub-range and a second wavelength sub-range adjacent to the first wavelength sub-ranged, and
the arrangement of the patterns comprises
a first arrangement of the patterns that causes the ICE to selectively transmit or reflect, during operation of the measurement tool, light in the first wavelength sub-range by first differing amounts, and
a second arrangement of the patterns that causes the ICE to selectively transmit or reflect, during operation of the measurement tool, light in the second wavelength sub-range by second differing amounts, such that a combination of the first differing amounts over the first wavelength sub-range and the second differing amounts over the second wavelength sub-range is related to the characteristic of the sample.

25. The measurement tool of claim 24 , wherein wavelengths in the first wavelength sub-range are shorter than wavelengths in the second wavelength sub-range.

26. The measurement tool of claim 24 , wherein the combination is a weighted sum of the first differing amounts over the first wavelength sub-range and the second differing amounts over the second wavelength sub-range.

27. The measurement tool of claim 24 , wherein the light is reflected or transmitted concurrently by the first and second arrangements of patterns.

28. The measurement tool of claim 24 , wherein the light is reflected or transmitted sequentially by the first and second arrangements of patterns.

29. The measurement tool of claim 23 , wherein the wavelength range comprises wavelengths from 15 μm to 10 mm.

30. The measurement tool of claim 23 , further comprising:
a light source positioned to illuminate the sample with light having a first spectrum over the wavelength range, wherein the ICE is positioned to receive light from the sample in response to the illumination, such that the light received from the sample has a second spectrum over the wavelength range, the second spectrum corresponding to the first

Assignees

• Halliburton Energy Services Inc

Inventors

• Gao Li
• Pelletier Michael T
• Perkins David L

Classifications

• G01N21/01

  Arrangements or apparatus for facilitating the optical investigation · CPC title

• H05K3/125

  by ink-jet printing · CPC title

• E21B49/08 Primary

  Obtaining fluid samples or testing fluids, in boreholes or wells · CPC title

• G01J2003/1213

  Filters in general, e.g. dichroic, band · CPC title

• G01B11/25 Primary

  by projecting a pattern, e.g. {one or more lines,} moiré fringes on the object (G01B11/255 takes precedence {; image analysis for depth or shape recovery G06T7/50}) · CPC title