Power semiconductor module

US9704768B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9704768-B2
Application numberUS-201315021836-A
CountryUS
Kind codeB2
Filing dateDec 17, 2013
Priority dateDec 17, 2013
Publication dateJul 11, 2017
Grant dateJul 11, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

It is an object of the present invention to achieve reduced faults in manufacturing steps and increased reliability by relieving electric field strength of a surface of a power semiconductor chip. The present invention includes: a power semiconductor chip disposed on an insulating substrate; wiring connected to a surface conductor pattern in an element region of the power semiconductor chip; a low dielectric constant film disposed between the wiring and the peripheral region; and a sealing material formed so as to cover the insulating substrate, the power semiconductor chip, the wiring, and the low dielectric constant film. The low dielectric constant film has a dielectric constant lower than that of the sealing material.

First claim

Opening claim text (preview).

The invention claimed is: 1. A power semiconductor module, comprising: an insulating substrate; a power semiconductor chip disposed on said insulating substrate; said insulating substrate having a surface on which an upper electrode is formed, said power semiconductor chip having a surface on which a surface conductor pattern is formed, said power semiconductor chip having a back surface on which a back-surface conductor pattern is formed, said power semiconductor chip having the surface in which an element region and a peripheral region surrounding said element region in plan view are defined, said upper electrode on said insulating substrate and said back-surface conductor pattern on said power semiconductor chip being connected to each other with solder therebetween, wiring connected to said surface conductor pattern in said element region of said power semiconductor chip; a low dielectric constant film disposed between said wiring and said peripheral region and only above said surface of said power semiconductor chip; and a sealing material formed so as to cover said insulating substrate, said power semiconductor chip, said wiring, and said low dielectric constant film, wherein said low dielectric constant film has a dielectric constant lower than that of said sealing material, and said low dielectric constant film is formed so as to cover only a part of said peripheral region of the surface of said power semiconductor chip overlapping a wiring path of said wiring in plan view. 2. A power semiconductor module, comprising: an insulating substrate; a power semiconductor chip disposed on said insulating substrate; said insulating substrate having a surface on which an upper electrode is formed, said power semiconductor chip having a surface on which a surface conductor pattern is formed, said power semiconductor chip having a back surface on which a back-surface conductor pattern is formed, said power semiconductor chip having the surface in which an element region and a peripheral region surrounding said element region in plan view are defined, said upper electrode on said insulating substrate and said back-surface conductor pattern on said power semiconductor chip being connected to each other with solder therebetween, wiring connected to said surface conductor pattern in said element region of said power semiconductor chip; a low dielectric constant film disposed between said wiring and said peripheral region; and a sealing material formed so as to cover said insulating substrate, said power semiconductor chip, said wiring, and said low dielectric constant film, wherein said low dielectric constant film has a dielectric constant lower than that of said sealing material, and said low dielectric constant film is formed so as to cover only a surface of said wiring.

Assignees

Inventors

Classifications

  • between a chip and a stacked insulating package substrate, interposer or RDL · CPC title

  • comprising aluminium [Al] · CPC title

  • multiple bond wires connected to common bond pads at both ends of the wires · CPC title

  • Forming coatings · CPC title

  • Die-attach connectors and bond wires · CPC title

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Frequently asked questions

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What does patent US9704768B2 cover?
It is an object of the present invention to achieve reduced faults in manufacturing steps and increased reliability by relieving electric field strength of a surface of a power semiconductor chip. The present invention includes: a power semiconductor chip disposed on an insulating substrate; wiring connected to a surface conductor pattern in an element region of the power semiconductor chip; a …
Who is the assignee on this patent?
Mitsubishi Electric Corp
What technology area does this patent fall under?
Primary CPC classification H10W40/255. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 11 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).