Chemically amplified positive resist composition and resist pattern forming process
US-12164231-B2 · Dec 10, 2024 · US
US9704710B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9704710-B2 |
| Application number | US-201314371293-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 31, 2013 |
| Priority date | Feb 9, 2012 |
| Publication date | Jul 11, 2017 |
| Grant date | Jul 11, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
It is intended to provide a photocured product that is prepared using the photo-imprint method and has favorable pattern precision and improvement in pattern defects. The present invention provides a photocured product obtained by irradiating a coating film in contact with a mold with light, the photocured product containing a fluorine atom-containing surfactant, wherein of secondary ion signals obtained by the surface analysis of the photocured product based on time-of-flight secondary ion mass spectrometry, the intensity of a C 2 H 5 O + ion signal is higher than that of a C 3 H 7 O + ion signal.
Opening claim text (preview).
The invention claimed is: 1. A photocured product obtained by irradiating a photocurable composition in contact with a mold with light, the photocured product containing a fluorine atom-containing surfactant represented by: R 1 - x 1 -R 2 - x 2 -R 3 (1), wherein R 1 represents a perfluoroalkyl group, R 2 represents a divalent substituent containing ethylene oxide, R 3 represents a polar functional group selected from an alkylhydroxyl group, a carboxyl group, a thiol group, a pyridyl group, a silanol group, and a sulfo group, and x 1 and x 2 each represent a single bond or a divalent substituent, wherein a ratio of the fluorine atom-containing surfactant to the photo cured product is 0.001% by weight to 5% by weight, and wherein of secondary ion signals obtained by a surface analysis of the photocured product based on time-of-flight secondary ion mass spectrometry, an intensity of a C 2 H 5 O + ion signal is higher than that of a C 3 H 7 O + ion signal. 2. The photocured product according to claim 1 , wherein the fluorine atom-containing surfactant is F(CF 2 ) 6 CH 2 (OCH 2 CH 2 ) 6 OH.
characterised by their composition, e.g. multilayer masks or materials · CPC title
Photolithographic processes · CPC title
Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic · CPC title
with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title
Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.