Magnetic measurement device

US9702945B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9702945-B2
Application numberUS-201214374640-A
CountryUS
Kind codeB2
Filing dateDec 13, 2012
Priority dateJan 26, 2012
Publication dateJul 11, 2017
Grant dateJul 11, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and a second region of the magnetic sample in reciprocally opposite directions and reducing the demagnetizing field. Specifically, a magnetic field generating part with at least a pair of magnetic poles is used to perform the magnetization of multiple poles, or the magnetic field generating part applies a damped oscillation magnetic field to perform the magnetization, or a local magnetic field generating part which applies an alternating magnetic field and scans the surface of the sample at the same time is used to perform the magnetization.

First claim

Opening claim text (preview).

What is claimed is: 1. A magnetic measurement device for measuring remanent magnetization of a plate magnetic sample, the plate magnetic sample having a flat shape with a flat major surface and a magnetization direction perpendicular to the flat major surface, the magnetic measurement device comprising: a magnetic field generating part which comprises at least a pair of adjacent magnetic poles with different signs, and magnetizes said magnetic sample by the magnetic poles by applying a magnetic field and magnetizing a first region of the flat major surface of the magnetic sample in a first direction and a second region of the flat major surface of the magnetic sample in a second direction, the first direction and the second direction being perpendicular to the flat major surface of the magnetic sample and opposite to each other, and forming a boundary in the magnetic sample between the first region and the second region, the first region and the second region being adjacent to each other via the boundary; and a measuring part which measures the magnetic field of the magnetic sample magnetized by the magnetic field generating part and outputs the magnetic field as the remanent magnetization of the magnetic sample. 2. The magnetic measurement device of claim 1 , wherein, the magnetic field generating part produces a damped oscillation magnetic field to magnetize the magnetic sample. 3. The magnetic measurement device of claim 1 , wherein, the magnetic field generating part scans the flat major surface of the magnetic sample while simultaneously produces an alternating magnetic field to magnetize the magnetic sample.

Assignees

Inventors

Classifications

  • G01R33/10Primary

    Plotting field distribution {; Measuring field distribution} · CPC title

  • G01R33/12Primary

    Measuring magnetic properties of articles or specimens of solids or fluids (involving magnetic resonance G01R33/20) · CPC title

  • Measuring magnetisation; Particular magnetometers therefor (G01R33/14 takes precedence; electrodynamic magnetometers G01R33/028) · CPC title

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What does patent US9702945B2 cover?
A magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and…
Who is the assignee on this patent?
Tdk Corp
What technology area does this patent fall under?
Primary CPC classification G01R33/10. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 11 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).