Lead-free solder ball

US9700963B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9700963-B2
Application numberUS-201615196227-A
CountryUS
Kind codeB2
Filing dateJun 29, 2016
Priority dateMar 28, 2011
Publication dateJul 11, 2017
Grant dateJul 11, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a process for mounting a BGA (Ball Grid Array) or CSP (Chip Size Package) on a printed circuit board. The process includes melting and fusing together solder paste and a solder ball. The solder ball has a solder composition that includes 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. In the process, the solder ball is placed on an electrode of the BGA or CSP substrate and the solder paste is applied onto an opposing electrode of the printed circuit board.

First claim

Opening claim text (preview).

The invention claimed is: 1. A process for mounting a BGA or CSP on a printed circuit board, the process comprising: melting and fusing together solder paste and a solder ball which has a solder composition comprising 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn, wherein the solder ball is placed on an electrode of the BGA or CSP substrate and the solder paste is applied onto an opposing electrode of the printed circuit board. 2. The process according to claim 1 , wherein the solder composition comprises 0.9-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. 3. The process according to claim 1 , wherein the solder composition comprises 1.0 mass % of Ag, 0.75 mass % of Cu, 0.07 mass % of Ni, and a remainder of Sn. 4. The process according to claim 1 , wherein the solder composition further comprises at least one element selected from Fe, Co, and Pt in a total amount of 0.003-0.1 mass %. 5. The process according to claim 1 , wherein the solder composition further comprises at least one element selected from Bi, In, Sb, P, and Ge in a total amount of 0.003-0.1 mass %. 6. The process according to claim 1 , wherein the solder ball has a diameter of at least 0.1 mm. 7. The process according to claim 1 , wherein the solder ball has a diameter of at least 0.3 mm. 8. The process according to claim 1 , wherein the solder ball has a diameter of at least 0.5 mm. 9. The process according to claim 1 , wherein the solder composition consists of 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, optionally at least one element selected from Fe, Co, Pt, Bi, In, Sb, P, and Ge, and a remainder of Sn. 10. The process according to claim 1 , wherein the solder composition consists of 0.9-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, optionally at least one element selected from Fe, Co, Pt, Bi, In, Sb, P, and Ge, and a remainder of Sn. 11. The process according to claim 1 , wherein the solder composition consists of 1.0 mass % of Ag, 0.75 mass % of Cu, 0.07 mass % of Ni, optionally at least one element selected from Fe, Co, Pt, Bi, In, Sb, P, and Ge, and a remainder of Sn. 12. A method of forming a solder bump on a module substrate having electrodes selected from electroplated Ni/Au electrodes, electroless Ni/Pd/Au electrodes, and Cu—OSP electrodes using a lead-free solder ball wherein the lead-free solder ball is used for electrodes by mounting on a module substrate for a BGA or CSP and which has a solder composition comprising 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. 13. The method according to claim 12 , wherein the solder composition consists of 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, optionally at least one element selected from Fe, Co, Pt, Bi, In, Sb, P, and Ge, and a remainder of Sn. 14. The method according to claim 12 , wherein the solder composition consists of 0.9-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, optionally at least one element selected from Fe, Co, Pt, Bi, In, Sb, P, and Ge, and a remainder of Sn.

Assignees

Inventors

Classifications

  • comprising metals or metalloids, e.g. PbSn, Ag or Cu · CPC title

  • Bond pads specially adapted therefor · CPC title

  • comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu · CPC title

  • Structures or relative sizes · CPC title

  • in solid form, e.g. by using a powder or by stud bumping · CPC title

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What does patent US9700963B2 cover?
Provided is a process for mounting a BGA (Ball Grid Array) or CSP (Chip Size Package) on a printed circuit board. The process includes melting and fusing together solder paste and a solder ball. The solder ball has a solder composition that includes 0.5-1.1 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. In the process, the solder ball is placed on an electrod…
Who is the assignee on this patent?
Senju Metal Industry Co
What technology area does this patent fall under?
Primary CPC classification B23K35/0244. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jul 11 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).