Material differentiation with phase contrast imaging
US-9494534-B2 · Nov 15, 2016 · US
US9700267B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9700267-B2 |
| Application number | US-201514621823-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 13, 2015 |
| Priority date | Dec 21, 2012 |
| Publication date | Jul 11, 2017 |
| Grant date | Jul 11, 2017 |
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A method for assembling a phase contrast x-ray imaging system includes fabricating a phase grating and an absorption grating according to a preselected pitch of the gratings. The actual obtained pitches are measured and a source grating is then fabricated according to a desired design point of the imaging system.
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What is claimed is: 1. A method comprising: fabricating a phase grating and an absorption grating according to a preselected pitch; measuring an actual pitch of the fabricated phase grating and absorption grating; and fabricating a source grating based on the actual pitch of the fabricated phase grating and absorption grating. 2. The method of claim 1 , further comprising disposing the fabricated source grating, phase grating and absorption grating in a phase contrast imaging system, wherein the phase grating and absorption grating are each disposed in one of a pair of parallel planes. 3. The method of claim 2 , further comprising tilting one of the fabricated phase grating and absorption grating with respect to the other at a preselected tilt angle. 4. The method of claim 3 , further comprising maintaining the phase grating and absorption grating in each of the parallel planes after the step of tilting. 5. The method of claim 2 , further comprising placing an object to be imaged in the phase contrast imaging system and capturing a radiographic image of the object. 6. The method of claim 3 , further comprising placing an object to be imaged in the phase contrast imaging system and capturing a radiographic image of the object. 7. The method of claim 2 , wherein the step of fabricating the source grating includes selecting a dimension of the source grating according to p int =p 1 (p 0 +p 2 )/(2p 0 ), wherein p 0 , p 1 , and p 2 are the selected dimensions of the source, phase, and absorption grating, and wherein p int is the period of the Moire pattern. 8. A method of assembling a phase contrast imaging system, the method comprising: fabricating a phase grating and an absorption grating according to a preselected pitch; measuring an actual pitch of the fabricated phase grating and absorption grating; and selecting a source grating based on the actual pitch of the fabricated phase grating and absorption grating, wherein the step of selecting comprising moving one of a plurality of source gratings secured in a gratings holder of the imaging system into a path of an x-ray beam. 9. The method of claim 8 , further comprising disposing the selected source grating, the fabricated phase grating and absorption grating in a phase contrast imaging system, wherein the phase grating and absorption grating are each disposed in one of a pair of parallel planes. 10. The method of claim 9 , further comprising tilting one of the fabricated phase grating and absorption grating with respect to the other at a preselected tilt angle. 11. The method of claim 10 , further comprising maintaining the phase grating and absorption grating in each of the parallel planes after the step of tilting. 12. The method of claim 9 , further comprising placing an object to be imaged in the phase contrast imaging system and capturing a radiographic image of the object. 13. The method of claim 10 , further comprising placing an object to be imaged in the phase contrast imaging system and capturing a radiographic image of the object. 14. The method of claim 8 , wherein the step of selecting the source grating includes selecting a source grating from the plurality of source gratings that either: satisfies p 0 /L=p 2 /d, wherein p 0 is the selected dimension of the source grating, L is a distance between the source grating and the phase grating in the phase contrast imaging system, p 2 is the period of the absorption grating, and wherein d is a distance between the phase grating and the absorption grating in the phase contrast imaging system, or provides a minimum difference between p 0 /L and p 2 /d from among the plurality of source gratings. 15. The method of claim 8 , wherein the step of selecting the source grating includes selecting a source grating from the plurality of source gratings that satisfies p 0 /L −p 2 /d=x wherein p 0 is the selected dimension of the source grating, L is a distance between the source grating and the phase grating in the phase contrast imaging system, p 2 is the period of the absorption grating, d is a distance between the phase grating and the absorption grating in the phase contrast imaging system, and wherein x is a preselected design value.
Alignment of source unit to detector unit · CPC title
involving phase contrast X-ray imaging · CPC title
the detector being combined with a grid or grating · CPC title
the source being combined with a filter or grating · CPC title
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