Method for forming a self-aligned Mach-Zehnder interferometer

US9696604B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-9696604-B1
Application numberUS-201615261669-A
CountryUS
Kind codeB1
Filing dateSep 9, 2016
Priority dateSep 9, 2016
Publication dateJul 4, 2017
Grant dateJul 4, 2017

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Abstract

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A method of forming a waveguide for a self-aligned Mach-Zehnder-Interferometer. The method includes forming a waveguide on a substrate and providing a first mask with a first opening exposing a first width and a pair of second widths towards opposite sides of the first width. Additionally, the method includes doping a first dopant of a first concentration through the first opening into a first thickness of the waveguide to form a first semiconducting phase thereof. The method includes providing a second mask with a second opening exposing part of the waveguide and doping a second dopant of a second concentration through the second opening into the part of the waveguide to form a second semiconductor phase thereof sharing a boundary with the first semiconducting phase to form a PN junction across the boundary. The boundary is allowed to vary with a margin of tolerance within the first width.

First claim

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What is claimed is: 1. A MZ electro-optic-modulator device comprising: a laser device configured to output an optical signal with a wavelength within a range of 1300 nm to 1550 nm; a pair of single crystal silicon material of a first length coupled to the laser device respectively receiving an optical wave split from the optical signal, each single crystal silicon material comprising: a ridge structure having a first edge and a second edge in parallel with each other, and having a length defined normal to each of the first edge and the second edge; a top-hat shape formed from the ridge structure; an upper surface region defined over the first edge and the second edge; a bottom surface region defined underlying the first edge and the second edge; a p-type impurity region comprising a concentration ranging from 3×10 17 /cm 3 to 1×10 18 /cm 3 provided in a first region of the ridge structure; an n-type impurity region comprising a concentration ranging from 3×10 17 /cm 3 to 1×10 18 /cm 3 provided in a second region of the ridge structure; a depletion region formed between the p-type impurity region and the n-type impurity region, the depletion region having a first state and a second state, the depletion region having a first narrow width ranging from 30 nm to 90 nm in the first state and extending from the upper surface to the bottom surface region, and depletion region having a second narrow width of 150 nm-300 nm in the second state, and extending from the upper surface to the bottom surface; a first variation provided by the first narrow width during the first state; a second variation provided by the second narrow width during the second state; a first refractive index characterizing the depletion region in the first state; a second refractive index characterizing the depletion region in the second state; whereupon the first state is different from the second state by a ratio of 1×10 −5 ; a first electrode coupled to the p-type impurity region; a second electrode coupled to the n-type impurity region; and a voltage applied between the first electrode and the second electrode, the voltage ranging from 0 to 10V to form the depletion region in the first state and increasing a size of the depletion region from the first narrow width to the second narrow width in a linear manner dependent on a magnitude of the voltage applied between the first electrode and the second electrode. 2. The MZ electro-optic-modulator device of claim 1 , further comprising an optical combiner to combine the two optical waves passing through the pair of single crystal silicon material to an output signal being modulated in amplitude with a non-return-to-zero (NRZ) format. 3. The MZ electro-optic-modulator device of claim 1 , wherein the depletion region comprises four or more states respectively associated with four or more different depletion widths to yield a combined optical signal being modulated in amplitude with one modulation format selected from a group of PAM4, PAM8, PAM16, PAM 64, BPSK, QPSK, DPSK, DQPSK, 8QAM, 16QAM, and 64QAM.

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What does patent US9696604B1 cover?
A method of forming a waveguide for a self-aligned Mach-Zehnder-Interferometer. The method includes forming a waveguide on a substrate and providing a first mask with a first opening exposing a first width and a pair of second widths towards opposite sides of the first width. Additionally, the method includes doping a first dopant of a first concentration through the first opening into a first …
Who is the assignee on this patent?
Inphi Corp
What technology area does this patent fall under?
Primary CPC classification G02F1/2257. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 04 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).