Structure to reduce chip shift during assembly
US-2024395758-A1 · Nov 28, 2024 · US
US9693453B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9693453-B2 |
| Application number | US-201314019863-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 6, 2013 |
| Priority date | Sep 7, 2012 |
| Publication date | Jun 27, 2017 |
| Grant date | Jun 27, 2017 |
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Official abstract text for this publication.
A wiring board includes a base layer, a plurality of connection terminals and a surface layer. The base layer is electrically insulative. The plurality of connection terminals are conductive and formed on the base layer. The surface layer is electrically insulative, and fills gaps between the plurality of connection terminals on the base layer. The connection terminals include a base portion made of a conductive first metal and a coating portion made of a conductive second metal that is different from the first metal. The coating portion penetrates the surface layer, and coats the base portion to the base layer.
Opening claim text (preview).
What is claimed is: 1. A wiring board, comprising: an electrically insulating base layer; a plurality of conductive connection terminals formed on the base layer; and an electrically insulating surface layer filling gaps between the plurality of connection terminals on the base layer, the electrically insulating surface layer formed in a state in which the connection terminals are exposed therefrom with an upper surface of the electrically insulating surface layer lower than a top surface of the plurality of conductive connection terminals, wherein the connection terminals include: a base portion made of a conductive first metal that includes copper, and a coating portion made of a conductive second metal that is different from the first metal, and that penetrates the electrically insulating surface layer and coats the base portion to the base layer; wherein the base portion is a copper-plated layer; and wherein progress of migration of the second metal occurring between the respective connection terminals in the plurality of connection terminals is slower than migration of the first metal. 2. The wiring board according to claim 1 , wherein: the second metal includes nickel (Ni) or tin (Sn).
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