Modulation of instrument resolution dependant upon the complexity of a previous scan

Patent metadata

Field	Value
Publication number	US-9691595-B2
Application number	US-201514964417-A
Country	US
Kind code	B2
Filing date	Dec 9, 2015
Priority date	May 18, 2012
Publication date	Jun 27, 2017
Grant date	Jun 27, 2017

Abstract

Systems and methods are used to analyze a sample using variable detection scan resolutions. A tandem mass spectrometer is instructed to perform at least two scans of a sample with different detection scan resolutions using a processor. The tandem mass spectrometer includes a mass analyzer that allows variable detection scan resolutions. The selection of the different detection scan resolutions can be based on one or more properties of sample compounds. The properties may include a sample compound molecular weight distribution that is calculated from a molecular weight distribution of expected compounds or is determined from a list of molecular weights for one or more known compounds. The tandem mass spectrometer can also be instructed to perform an analysis of the sample before instructing the tandem mass spectrometer to perform the at least two scans of the sample.

First claim

What is claimed is:

1. A system for analyzing a sample using variable detection scan resolutions, comprising:
a tandem mass spectrometer that includes a mass analyzer that allows variable detection scan resolutions; and
a processor in communication with the tandem mass spectrometer that instructs the tandem mass spectrometer to
divide a mass range of a sample into a collection of precursor ion windows,
define different detection scan resolutions using information about the distribution of precursor ions across the mass range, and
perform different detection scans of at least two different detection scan resolutions across the mass range to analyze fragment ions of at least two different precursor ion windows of the collection of precursor ion windows, which maintains the selectivity of fragment ion analysis while increasing the speed of the fragment ion analysis across the mass range.

2. The system of claim 1 , wherein the at least two different detection scan resolutions include a higher resolution and a lower resolution, the at least two different precursor ion windows include a precursor ion window with a large number of precursor ions and a precursor ion window with a sparse number of precursor ions, and, using information about the distribution of precursor ions across the mass range, the processor instructs the tandem mass spectrometer to use the higher resolution to analyze fragment ions of the precursor ion window with a large number of precursor ions and to use the lower resolution to analyze fragment ions of the precursor ion window with a sparse number of precursor ions in order to maintain the selectivity of fragment ion analysis while increasing the speed of the fragment ion analysis across the mass range.

3. The system of claim 1 , wherein the processor further instructs the tandem mass spectrometer to use at least two different accumulation times to analyze fragment ions of the at least two different precursor ion windows of the collection of precursor ion windows using information about the distribution of precursor ions across the mass range.

4. The system of claim 1 , wherein the processor further instructs the tandem mass spectrometer to use at least two different collision energies to fragment the at least two different precursor ion windows of the collection of precursor ion windows using information about the distribution of precursor ions across the mass range.

5. The system of claim 1 , wherein the processor further instructs the tandem mass spectrometer to perform a precursor ion survey scan of the mass range before instructing the tandem mass spectrometer to select and fragment all precursor ions in each precursor ion window of the collection of precursor ions windows in order to obtain the information about the distribution of precursor ions across the mass range.

6. The system of claim 1 , wherein the information about the distribution of precursor ions across the mass range comprises a sample compound molecular weight distribution.

7. The system of claim 6 , wherein the processor calculates the sample compound molecular weight distribution from a molecular weight distribution of expected compounds in the sample.

8. The system of claim 6 , wherein the processor determines the sample compound molecular weight distribution from a list of molecular weights for one or more known compounds.

9. The system of claim 1 , wherein the processor further instructs the tandem mass spectrometer to perform a precursor ion pre scan of each precursor ion window of the collection of precursor ions windows before fragmenting each precursor ion window of the collection of precursor ions windows, wherein the results of the pre scan of each precursor ion window of the collection of precursor ions windows provide the information about the distribution of precursor ions across the mass range.

10. The system of claim 5 , wherein the processor receives data from the precursor ion survey scan and calculates the sample compound molecular weight distribution from the data.

11. The system of claim 10 , wherein the processor calculates the sample compound molecular weight distribution by obtaining a spectrum from the data and calculating the sample compound molecular weight distribution from the spectrum.

12. The system of claim 10 , wherein the processor receives the data, interprets the data, and determines the sample compound molecular weight distribution from a pre-calculated compound molecular weight distribution found from the interpretation of the data.

13. The system of claim 5 , wherein the processor instructs the tandem mass spectrometer to perform a precursor ion survey scan of the mass range, a selection and fragmentation all precursor ions in each precursor ion window of the collection of precursor ions windows, and an analysis of fragment ions of each precursor ion window of the collection of precursor ions windows two or more times in a looped manner in real-time.

14. A method for analyzing a sample using variable detection scan resolutions, comprising:
dividing a mass range of a sample into a collection of precursor ion windows, wherein the tandem mass spectrometer includes a mass analyzer that allows variable detection scan resolutions;
defining different detection scan resolutions using information about the distribution of precursor ions across the mass range; and
performing different detection scans of at least two different detection scan resolutions across the mass range to analyze fragment ions of at least two different precursor ion windows of the collection of precursor ion windows, which maintains the selectivity of fragment ion analysis while increasing the speed of the fragment ion analysis across the mass range.

15. The method of claim 14 , wherein the at least two different detection scan resolutions include a higher resolution and a lower resolution, the at least two different precursor ion windows include a precursor ion window with a large number of precursor ions and a precursor ion window with a sparse number of precursor ions, and, using information about the distribution of precursor ions across the mass range, the higher resolution is used to analyze fragment ions of the precursor ion window with a large number of precursor ions and the lower resolution is used to analyze fragment ions of the precursor ion window with a sparse number of precursor ions in order to maintain the selectivity of fragment ion analysis while increasing the speed of the fragment ion analysis across the mass range.

16. The method of claim 14 , further comprising using at least two different accumulation times to analyze fragment ions of the at least two different precursor ion windows of the collection of precursor ion windows using information about the distribution of precursor ions across the mass range.

17. The method of claim 14 , further comprising using at least two different collision energies to fragment the at least two different precursor ion windows of the collection of precursor ion windows using information about the distribution of precursor ions across the mass range.

18. The method of claim 14 , further comprising performing a precursor ion survey scan of the mass range before selecting and fragmenting all precursor ions in each precursor ion window of the collection of precursor ions windows in order to obtain the information about the distribution of precursor ions across the mass range.

19. The method of claim 14 , further comprising performing a precursor ion pre scan of each precursor ion window of the collection of p

Assignees

• Dh Technologies Dev Pte Ltd

Inventors

• Campbell John Lawrence
• Tate Stephen A

Classifications

• H01J49/004

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/0081 Primary

  Tandem in time, i.e. using a single spectrometer · CPC title

• H01J49/0027

  Methods for using particle spectrometers · CPC title