Apparatus of plural charged-particle beams

Patent metadata

Field	Value
Publication number	US-9691588-B2
Application number	US-201615065342-A
Country	US
Kind code	B2
Filing date	Mar 9, 2016
Priority date	Mar 10, 2015
Publication date	Jun 27, 2017
Grant date	Jun 27, 2017

Abstract

A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single electron source into a virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample, and a condenser lens adjusts the currents of the plural probe spots. In the source-conversion unit, the image-forming means is on the upstream of the beamlet-limit means, and thereby generating less scattered electrons. The image-forming means not only forms the virtual multi-source array, but also compensates the off-axis aberrations of the plurality of probe spots.

First claim

What is claimed is:

1. A multi-beam apparatus for observing a surface of a sample, comprising:
an electron source;
a condenser lens below said electron source;
a source-conversion unit below said condenser lens;
a primary projection imaging system below said source-conversion unit and comprising an objective lens;
a deflection scanning unit inside said primary projection imaging system;
a sample stage below said primary projection imaging system;
a beam separator above said objective lens;
a secondary projection imaging system above said beam separator; and
an electron detection device with a plurality of detection elements,
wherein said source-conversion unit comprises an image-forming means with a plurality of micro-deflectors and a beamlet-limit means with a plurality of beam-limit openings, and said image-forming means is above said beamlet-limit means,
wherein said electron source, said condenser lens, said source-conversion unit, said primary projection imaging system, said deflection scanning unit and said beam separator are aligned with a primary optical axis of said apparatus, said sample stage sustains said sample so that said surface faces to said objective lens, said secondary projection imaging system and said electron detection device are aligned with a secondary optical axis of said apparatus, and said secondary optical axis is not parallel to said primary optical axis,
wherein said electron source generates a primary electron beam along said primary optical axis, said plurality of micro-deflectors deflects said primary electron beam to form a plurality of parallel virtual images of said electron source and therefore a virtual multi-source array is converted from said electron source, a plurality of beamlets which includes said virtual multi-source array passes through said plurality of beam-limit openings respectively, a current of each beamlet is therefore limited by one corresponding beam-limit opening, and currents of said plurality of beamlets can be varied by adjusting said condenser lens,
wherein said primary projection imaging system images said virtual multi-source array onto said surface, a plurality of probe spots is therefore formed thereon, and said deflection scanning unit deflects said plurality of beamlets to scan said plurality of probe spots respectively over a plurality of scanned regions within an observed area on said surface,
wherein a plurality of secondary electron beams is generated by said plurality of probe spots respectively from said plurality of scanned regions and in passing focused by said objective lens, said beam separator then deflects said plurality of secondary electron beams to said secondary projection imaging system, said secondary projection imaging system focuses and keeps said plurality of secondary electron beams to be detected by said plurality of detection elements respectively, and each detection element therefore provides an image signal of one corresponding scanned region.

2. The multi-beam apparatus according to claim 1 , further comprising a main aperture plate below said electron source, which has a main opening aligned with said primary optical axis and functions as a beam-limit aperture for said primary electron beam.

3. The multi-beam apparatus according to claim 2 , wherein said primary projection imaging system comprise a transfer lens above said objective lens, which focuses said plurality of beamlets to land on said surface perpendicularly.

4. The multi-beam apparatus according to claim 3 , wherein each of said plurality of micro-deflectors has a 4-pole structure which can generate a deflection field in any radial direction.

5. The multi-beam apparatus according to claim 4 , further comprising a single-beam electron detector above said beam separator, which can be used in a single-beam mode.

6. The multi-beam apparatus according to claim 5 , further comprising an in-lens electron detector with a beamlet-passing hole aligned with said primary optical axis, which is below said beam separator and can be used in said single-beam mode.

7. The multi-beam apparatus according to claim 4 , further comprising an in-lens electron detector with a beamlet-passing hole aligned with said primary optical axis, which can be used in a single-beam mode.

8. A multi-beam apparatus for observing a surface of a sample, comprising:
an electron source;
a condenser lens below said electron source;
a source-conversion unit below said condenser lens;
a primary projection imaging system below said source-conversion unit and comprising an objective lens;
a deflection scanning unit inside said primary projection imaging system;
a sample stage below said primary projection imaging system;
a beam separator above said objective lens;
a secondary projection imaging system above said beam separator; and
an electron detection device with a plurality of detection elements,
wherein said source-conversion unit comprises an image-forming means with a plurality of micro-deflector-and-compensator elements and a beamlet-limit means with a plurality of beam-limit openings, each micro-deflector-and-compensator element comprises one micro-deflector and one micro-compensator which has one micro-lens and one micro-stigmator, and said image-forming means is above said beamlet-limit means,
wherein said electron source, said condenser lens, said source-conversion unit, said primary projection imaging system, said deflection scanning unit and said beam separator are aligned with a primary optical axis of said apparatus, said sample stage sustains said sample so that said surface faces to said objective lens, said secondary projection imaging system and said electron detection device are aligned with a secondary optical axis of said apparatus, and said secondary optical axis is not parallel to said primary optical axis,
wherein said electron source generates a primary electron beam along said primary optical axis, said plurality of micro-deflectors deflects said primary electron beam to form a plurality of parallel virtual images of said electron source and therefore a virtual multi-source array is converted from said electron source, a plurality of beamlets which includes said virtual multi-source array passes through said plurality of beam-limit openings respectively, a current of each beamlet is therefore limited by one corresponding beam-limit opening, and currents of said plurality of beamlets can be varied by adjusting said condenser lens,
wherein said primary projection imaging system images said virtual multi-source array onto said surface and a plurality of probe spots is therefore formed thereon, said one micro-lens and said one micro-stigmator of said one micro-compensator respectively compensates field curvature and astigmatism aberrations of one corresponding probe spot, and said deflection scanning unit deflects said plurality of beamlets to scan said plurality of probe spots respectively over a plurality of scanned regions within an observed area on said surface,
wherein a plurality of secondary electron beams is generated by said plurality of probe spots respectively from said plurality of scanned regions and in passing focused by said objective lens, said beam separator then deflects said plurality of secondary electron beams to enter said secondary projection imaging system, said secondary projection imaging system focuses and keeps said plurality of secondary electron beams to be detected by said plurality of detection elements respectively, and each detection element therefore provides an image signal of one corresponding scanned region.

9. The multi-beam apparatus according to claim 8 , further comprising a main aperture plate below said electron source, which has a main

Assignees

• Hermes Microvision Inc

Inventors

• Ren Weiming
• Li Shuai
• Liu Xuedong
• Chen Zhongwei

Classifications

• H01J37/1472

  Deflecting along given lines · CPC title

• H01J2237/1205

  Microlenses · CPC title

• H01J2237/1516

  Multipoles · CPC title

• H01J37/28 Primary

  with scanning beams {(H01J37/268, H01J37/292, H01J37/2955 take precedence)} · CPC title

• H01J2237/2817

  Pattern inspection · CPC title