Display substrate and display panel in each of which distance from convex structure to a substrate and distance from alignment layer to the substrate has preset difference therebetween
US-12164187-B2 · Dec 10, 2024 · US
US9690155B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9690155-B2 |
| Application number | US-201515304114-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 9, 2015 |
| Priority date | Apr 16, 2014 |
| Publication date | Jun 27, 2017 |
| Grant date | Jun 27, 2017 |
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A TFT substrate ( 100 A) of a liquid crystal display panel includes: an organic interlayer insulating layer ( 24 ) covering a TFT; a first transparent electrically-conductive layer ( 25 ) provided in the first region of a surface of the organic interlayer insulating layer ( 24 ); and an inorganic dielectric layer ( 26 ) covering the first transparent electrically-conductive layer ( 25 ) and provided in a second region of the surface of the organic interlayer insulating layer ( 24 ) which is different from the first region, the inorganic dielectric layer ( 26 ) containing SiN, wherein an arithmetic mean roughness Ra of the first region and the second region of the surface of the organic interlayer insulating layer ( 24 ) is not less than 3.45 nm and not more than 5.20 nm.
Opening claim text (preview).
The invention claimed is: 1. A liquid crystal display panel, comprising: a liquid crystal layer; first and second substrates arranged so as to oppose each other via the liquid crystal layer; a thin film transistor supported on the first substrate; an organic interlayer insulating layer covering the thin film transistor; a first transparent electrically-conductive layer provided in a first region of a surface of the organic interlayer insulating layer; and an inorganic dielectric layer covering the first transparent electrically-conductive layer and provided in a second region of the surface of the organic interlayer insulating layer which is different from the first region, the inorganic dielectric layer containing SiN, wherein an arithmetic mean roughness Ra of the first region and the second region of the surface of the organic interlayer insulating layer is not less than 3.45 nm and not more than 5.20 nm. 2. The liquid crystal display panel of claim 1 , wherein an arithmetic mean roughness Ra of a surface of the first transparent electrically-conductive layer is not less than 3.75 nm and not more than 6.30 nm. 3. The liquid crystal display panel of claim 1 , further comprising a second transparent electrically-conductive layer on the inorganic dielectric layer. 4. The liquid crystal display panel of claim 3 , wherein the second transparent electrically-conductive layer is connected with a drain electrode of the thin film transistor in a contact hole which includes a first contact hole of the organic interlayer insulating layer and a second contact hole of the inorganic dielectric layer, an inner perimeter surface of the first contact hole being covered with the inorganic dielectric layer. 5. The liquid crystal display panel of claim 3 , wherein the second transparent electrically-conductive layer is connected with a drain electrode of the thin film transistor in a contact hole which includes a first contact hole of the organic interlayer insulating layer and a second contact hole of the inorganic dielectric layer, the first contact hole and the second contact hole intersecting with each other when viewed in a direction normal to the first substrate. 6. A manufacturing method of a liquid crystal display panel which includes a liquid crystal layer and first and second substrates arranged so as to oppose each other via the liquid crystal layer, the method comprising the steps of: providing a first substrate; forming a thin film transistor on the first substrate; forming an organic interlayer insulating layer so as to cover the thin film transistor; ashing a surface of the organic interlayer insulating layer, thereby forming a first region and a second region of which an arithmetic mean roughness Ra is not less than 3.45 nm and not more than 5.20 nm; forming a first transparent electrically-conductive layer on the first region of the organic interlayer insulating layer; and forming, by CVD, an inorganic dielectric layer so as to cover the first transparent electrically-conductive layer and to be provided in the second region of the surface of the organic interlayer insulating layer which is different from the first region, the inorganic dielectric layer containing SiN. 7. The method of claim 6 , wherein the ashing is performed in a gas atmosphere which contains oxygen.
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