Rf receiver with testing capability
US-2016233969-A1 · Aug 11, 2016 · US
US9689954B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9689954-B2 |
| Application number | US-201314041092-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 30, 2013 |
| Priority date | Sep 28, 2012 |
| Publication date | Jun 27, 2017 |
| Grant date | Jun 27, 2017 |
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An integrated electron spin resonance (ESR) circuit chip includes a chip substrate, a transmitter circuit, and a receiver circuit. The transmitter circuit and receiver circuit are disposed on the chip substrate. The transmitter circuit includes an oscillator circuit configured to generate an oscillating output signal and a power amplifier (PA) circuit configured to generate an amplified oscillating output signal based on the oscillating output signal. The receiver circuit receives an ESR signal from an ESR probe. The receiver circuit includes a receiver amplifier circuit configured to generate an amplified ESR signal based on the received ESR signal, a mixer circuit configured to receive the amplified ESR signal and to down-convert the amplified ESR signal to a baseband signal, and a baseband amplifier circuit configured to generate an amplified baseband signal based on the baseband signal.
Opening claim text (preview).
What is claimed is: 1. A integrated electron spin resonance (ESR) circuit chip, the chip comprising: a chip substrate; a transmitter circuit provided by the chip substrate, the transmitter circuit comprising: an oscillator circuit configured to generate an oscillating output signal; and a power amplifier (PA) circuit configured to generate an amplified oscillating output signal based on the oscillating output signal; a receiver circuit provided by the chip substrate that receives an ESR signal from an ESR probe, the receiver circuit comprising: a receiver amplifier circuit configured to generate an amplified ESR signal based on the received ESR signal received by the ESR probe before down conversion; a mixer circuit configured to receive the amplified ESR signal and to down-convert the amplified ESR signal to a baseband signal; and a baseband amplifier circuit configured to generate an amplified baseband signal based on the baseband signal; and wherein the transmitter circuit and receiver circuit are disposed on the chip substrate. 2. The chip of claim 1 , further comprising: an integrated digital pulse generator circuit, wherein the integrated digital pulse generator circuit is disposed on the chip substrate. 3. The chip of claim 2 , wherein the integrated digital pulse generator circuit is configured to provide a voltage pulse to a gate terminal of a switching transistor to switch the amplified oscillating output signal. 4. The chip of claim 3 , wherein the switching transistor is connected to an input terminal of the PA circuit and the switching transistor is configured to pull down a bias voltage of an input transistor of the PA circuit to switch the amplified oscillating output signal in response to the voltage pulse from the integrated digital pulse generator circuit. 5. The chip of claim 4 , wherein the switching transistor is an integrated N-channel metal-oxide-semiconductor field effect transistor driver configured to switch off the PA circuit by pulling down the bias voltage of the input transistor of the PA circuit to substantially zero volts. 6. The chip of claim 1 , wherein the ESR probe is disposed on the chip substrate. 7. The chip of claim 1 , wherein the ESR probe is external to the chip substrate. 8. An integrated ESR spectrometer comprising: an ESR probe comprising: a magnet configured to generate a bias magnetic field in a bias field direction; and a resonator configured to generate an oscillating magnetic field having a direction that is substantially perpendicular to the bias field direction; and an integrated ESR transceiver chip comprising: a chip substrate; a transmitter circuit provided by the chip substrate, the transmitter circuit comprising: an oscillator circuit configured to generate an oscillating output signal; and a power amplifier (PA) circuit configured to generate an amplified oscillating output signal, based on the oscillating output signal; a receiver circuit provided by the chip substrate configured to receive an ESR signal from the resonator, the receiver circuit comprising: a receiver amplifier circuit configured to generate an amplified ESR signal based on the received ESR signal a receiver amplifier circuit configured to generate an amplified ESR signal based on the received ESR signal received by the ESR probe before down conversion; a mixer circuit configured to receive the amplified ESR signal and down-converts the amplified ESR signal to a baseband signal; and a baseband amplifier circuit configured to generate an amplified baseband signal based on the baseband signal; and wherein the transmitter circuit and receiver circuit are disposed on the chip substrate. 9. The integrated ESR spectrometer of claim 8 , wherein the resonator is external to the chip substrate. 10. The integrated ESR spectrometer of claim 8 , wherein the resonator is disposed on the chip substrate. 11. The integrated ESR spectrometer of claim 9 , further comprising a circulator and an active leakage cancellation circuit configured to cancel a leakage signal that leaks from the transmitter circuit to the receiver circuit by: generating a cancellation signal based on an amplitude and a phase of the leakage signal, wherein the cancellation signal has an amplitude that is substantially equal to the amplitude of the leakage signal and a phase difference with the phase of the leakage signal of 180 degrees; and adding the cancellation signal to the input of the receiver circuit to cancel the leakage signal. 12. The integrated ESR spectrometer of claim 8 , wherein the integrated ESR transceiver chip further comprises: an integrated digital pulse generator circuit, wherein the integrated digital pulse generator circuit is disposed on the chip substrate. 13. The integrated ESR spectrometer of claim 12 , wherein the integrated digital pulse generator circuit is configured to provide a voltage pulse to a gate terminal of a switching transistor to switch the amplified oscillating output signal. 14. The integrated ESR spectrometer of claim 13 , wherein the switching transistor is connected to an input terminal of the PA circuit and the switching transistor is configured to pull down a bias voltage of an input transistor of the PA circuit to switch the amplified oscillating output signal in response to the voltage pulse from the integrated digital pulse generator circuit. 15. The integrated ESR spectrometer of claim 14 , wherein the switching transistor is an integrated NMOSFET driver configured to switch off the PA circuit by pulling down the bias voltage of the input transistor of the PA circuit to substantially zero volts. 16. The integrated ESR spectrometer of claim 9 , wherein the resonator is a planar loop gap resonator. 17. The integrated ESR spectrometer of claim 10 , wherein the resonator comprises a transmitter resonator and a receiver resonator. 18. The integrated ESR spectrometer of claim 17 , wherein the transmitter resonator is a planar loop gap resonator. 19. The integrated ESR spectrometer of claim 17 , wherein the receiver resonator is a planar loop gap resonator. 20. The integrated ESR spectrometer of claim 17 , wherein the transmitter resonator is a transmission-line based resonator. 21. The integrated ESR spectrometer of claim 17 , wherein the receiver resonator is a transmission-line resonator.
using electron paramagnetic resonance (G01R33/24, G01R33/62 take precedence) · CPC title
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