Heatable gas analysis device

US9689851B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9689851-B2
Application numberUS-201314391043-A
CountryUS
Kind codeB2
Filing dateMar 26, 2013
Priority dateApr 20, 2012
Publication dateJun 27, 2017
Grant dateJun 27, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A heatable gas analysis device which is monitored in a simply way, wherein a gas analysis device contains a monitoring unit which, after the device is switched on and until a predefined operating temperature is reached, generates a two-dimensional temperature profile from temperature progressions measured at different measuring points within the device, in which temperature profile one dimension indicates time and another dimension indicates the different measuring points, where the monitoring unit compares the temperature profile to a reference temperature profile generated and stored under reference conditions and, in the event of any deviation exceeding a predefined amount, generates an error message.

First claim

Opening claim text (preview).

The invention claimed is: 1. A heatable gas analysis device comprising: a testing unit configured to produce, from temperature variations measured at various measurement points inside the device after the device is switched on and until a predetermined operating temperature is reached, a two-dimensional temperature profile in which one dimension denotes time and another dimension denotes a plurality of the various measurement points, and further configured to compare the two-dimensional temperature profile with a reference temperature profile produced under reference conditions and stored, and to generate an error message in an event of a difference between the two-dimensional temperature profile and the reference temperature profile exceeding a predetermined amount. 2. The gas analysis device as claimed in claim 1 , wherein the time is subdivided into discrete time intervals and the two-dimensional temperature profile contains a temperature value for each time interval of the discrete time intervals and each measurement point of the plurality of the various measurement points, so that the two-dimensional temperature profile forms a pattern consisting of temperature values, and wherein the testing unit performs comparisons based on pattern recognition. 3. The gas analysis device as claimed in claim 2 , further comprising: a communication interface for transmitting at least one of (i) the pattern consisting of the temperature values and (ii) a difference between patterns of the two-dimensional temperature profile and a pattern of the reference temperature profile. 4. The gas analysis device as claimed in claim 2 , further comprising: a display for visualizing at least one of (i) the pattern consisting of the temperature values and (ii) a difference between patterns of the two-dimensional temperature profile and a pattern of the reference temperature profile. 5. The gas analysis device as claimed in claim 4 , further comprising: a communication interface for transmitting at least one of (i) the pattern consisting of the temperature values and (ii) the difference between the patterns of the two-dimensional temperature profile and the pattern of the reference temperature profile.

Assignees

Inventors

Classifications

  • Temperature · CPC title

  • in respect of time, e.g. reacting only to a quick change of temperature · CPC title

  • using specially adapted T(t) profile · CPC title

  • of temperature · CPC title

  • Laser diodes · CPC title

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What does patent US9689851B2 cover?
A heatable gas analysis device which is monitored in a simply way, wherein a gas analysis device contains a monitoring unit which, after the device is switched on and until a predefined operating temperature is reached, generates a two-dimensional temperature profile from temperature progressions measured at different measuring points within the device, in which temperature profile one dimensio…
Who is the assignee on this patent?
Siemens Ag
What technology area does this patent fall under?
Primary CPC classification G01N33/0016. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 27 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).