XRF analyzer rotational filter

Patent metadata

Field	Value
Publication number	US-9689815-B2
Application number	US-201514806975-A
Country	US
Kind code	B2
Filing date	Jul 23, 2015
Priority date	Sep 12, 2014
Publication date	Jun 27, 2017
Grant date	Jun 27, 2017

Abstract

An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point.
An XRF analyzer can include a rotatable source filter wheel between an x-ray source and a focal point and a rotatable detector filter wheel between an x-ray detector and the focal point. The source filter wheel can include multiple x-ray source modification regions. The detector filter wheel can include multiple x-ray detector modification regions. A gear wheel can mesh with a gear on the source filter wheel and with a gear on the detector filter wheel and can cause the source filter wheel and the detector filter wheel to rotate together.

First claim

What is claimed is:

1. An x-ray fluorescence (XRF) analyzer comprising:
a. an x-ray source having an x-ray emission end, and an x-ray detector having an x-ray receiving end, both carried by a housing;
b. the x-ray source positioned and oriented to emit x-rays from the x-ray emission end towards a focal point;
c. the x-ray detector positioned and oriented to face the focal point, and configured to receive, through the x-ray receiving end, fluoresced x-rays emitted from a sample disposed at the focal point;
d. a rotatable filter cup disposed between the x-ray emission end and the focal point and disposed between the x-ray receiving end and the focal point;
e. the filter cup being rotatable to separately position:
i. at least two different x-ray source modification regions (defining source modification regions) between the x-ray emission end and the focal point; and
ii. at least two different x-ray detector modification regions (defining detector modification regions) between the x-ray receiving end and the focal point.

2. The XRF analyzer of claim 1 , wherein:
a. the filter cup includes an inner cup disposed at least partially inside of an outer cup;
b. the inner cup and the outer cup each have at least two of the source modification regions and at least one of the detector modification regions;
c. the inner cup, the outer cup, or both have at least two of the detector modification regions;
d. the inner cup and the outer cup are rotatable to separately position the source modification regions between the x-ray emission end and the focal point and the detector modification regions between the x-ray receiving end and the focal point;
e. the inner cup and the outer cup each have a base end opposite of an open end;
f. the open ends of both the inner cup and the outer cup are disposed between the x-ray emission end and the focal point and between the x-ray receiving end and the focal point; and
g. a convex portion of the inner cup nests within a concave portion of the outer cup.

3. The XRF analyzer of claim 2 , further comprising:
a. dual, concentric, tubes comprising an inner tube and an outer tube;
b. the inner tube connected to the inner cup and configured to rotate with the inner cup; and
c. the outer tube connected to the outer cup and configured to rotate with the outer cup.

4. The XRF analyzer of claim 2 , wherein:
a. the source modification regions on one of the inner cup or the outer cup includes multiple, different solid x-ray filters; and
b. the source modification regions on the other of the inner cup or the outer cup includes multiple, different collimators sized to collimate x-ray emissions.

5. The XRF analyzer of claim 1 , wherein the source modification regions include multiple, different solid x-ray filters.

6. The XRF analyzer of claim 1 , wherein the source modification regions include a solid blocking structure having a material and thickness configured to substantially block x-rays from being emitted through the blocking structure.

7. The XRF analyzer of claim 1 , wherein the source modification regions include a protective structure comprising a solid, protective material configured to protect the x-ray source from damage by solid objects.

8. The XRF analyzer of claim 1 , wherein:
a. the source modification regions include a first collimator having a first diameter and a second collimator having a second diameter; and
b. the first diameter is substantially different from the second diameter in order to provide a different x-ray collimation at the first collimator relative to the second collimator.

9. The XRF analyzer of claim 1 , wherein the detector modification regions include:
a. a protective structure comprising a solid, protective material configured to protect the x-ray detector from damage by solid objects; and
b. an aperture configured to allow x-rays to pass therethrough.

10. The XRF analyzer of claim 9 , wherein the aperture is a solid x-ray window having a material and thickness to allow x-rays to substantially pass therethrough and to substantially protect the x-ray detector against corrosive chemicals.

11. The XRF analyzer of claim 1 , wherein:
a. the filter cup is hollow with an open end facing the focal point and a base end opposite the open end; and
b. the filter cup tapers down in diameter from the open end to the base end.

12. The XRF analyzer of claim 11 , wherein a cross section of the filter cup at any point from the open end to the base end has a circular shape.

13. The XRF analyzer of claim 11 , wherein a cross section of the filter cup at any point between the open end and the base end has a polygon shape.

14. The XRF analyzer of claim 11 , further comprising a shaft attached to the base end of the filter cup, the shaft and the filter cup being rotatable to separately position the source modification regions between the x-ray emission end and the focal point and the detector modification regions between the x-ray receiving end and the focal point.

15. The XRF analyzer of claim 1 , wherein:
a. the filter cup is shaped and located to position the source modification regions such that a plane of the source modification regions is substantially parallel to a face of the x-ray emission end; and
b. the filter cup is shaped and located to position the detector modification regions such that a plane of the detector modification regions is substantially parallel to a face of the x-ray receiving end.

16. The XRF analyzer of claim 1 , wherein the XRF analyzer further comprises an electronic processor configured to receive a program, input by a user, and to select and position the source modification regions based on the program.

17. The XRF analyzer of claim 1 , wherein the XRF analyzer further comprises an electronic processor configured to analyze x-rays received by the x-ray detector (defining an analysis) and to select and position the source modification regions based on the analysis.

18. A method of using the XRF analyzer of claim 1 , the method comprising:
a. inputting a guess of a material of a sample to be analyzed into the XRF analyzer;
b. allowing the XRF analyzer to automatically select one of the source modification regions based on the guess;
c. analyzing the sample (defining an analysis); and
d. changing the selected source modification region based on the analysis.

19. An x-ray fluorescence (XRF) analyzer comprising:
a. an x-ray source having an x-ray emission end, and an x-ray detector having an x-ray receiving end, both carried by a housing, wherein:
i. the x-ray source is positioned and oriented to emit x-rays from the x-ray emission end towards a focal point; and
ii. the x-ray detector is positioned and oriented to face the focal point, and configured to receive, through the x-ray receiving end, fluoresced x-rays emitted from a sample disposed at the focal point;

b. a source filter wheel, wherein the source filter wheel:
i. is rotatable;
ii. is carried by the housing and is disposed between the x-ray emission end and the focal point;
iii. has a gear at an outer perimeter; and
iv. comprises multiple x-ray source modification regions including at least one of:
1. a first, solid x-ray filter configured to filter x-rays for one x-ray energy band and a second, solid x-ray filter configured to filter x-rays for a different x-ray energy band;
2. a first, solid x-ray filter having a different thickness than a second, solid x-ray filter;
3. a first collimator having a first diameter and a second collimator having a second diameter where

Assignees

• Moxtek Inc

Inventors

• Jones Vincent Floyd

Classifications

• G01N2223/313

  filters, rotating filter disc · CPC title

• G21K1/02

  using diaphragms, collimators · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title

• G21K1/10

  Scattering devices; Absorbing devices; Ionising radiation filters · CPC title

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title