Thickness and convexity detection device for plate strip

US9689670B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9689670-B2
Application numberUS-201214009123-A
CountryUS
Kind codeB2
Filing dateMar 29, 2012
Priority dateApr 2, 2011
Publication dateJun 27, 2017
Grant dateJun 27, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The invention relates to a device for detecting the thickness and crown of plates and strips, belonging to the field of nuclear technology applications. The device comprises a C-frame; two ray source mounted in an upper arm of the C-frame and distributed at an interval along the width direction of a steel plate/strip; two rows of gas-pressurized ionization chamber detector arrays mounted in a lower arm of the C-frame and distributed at an interval along the moving direction of the plate/strip; collimators mounted below the two ray source, the collimators enabling the rays of each ray source to only irradiate to a corresponding row of detectors; pre-amplifier modules connected with the detector arrays; a data collector connected with the pre-amplifier modules; a data processing and displaying computer connected with the data collector; and a cooling water and pressurized air service system and a control system for ensuring system operation and monitoring. The device of the invention is simple in structure and high in dynamic measurement accuracy, and the detectors have the advantages of small temperature drift, irradiation resistance, high spatial resolution, high cost performance and the like.

First claim

Opening claim text (preview).

The invention claimed is: 1. A device for detecting the thickness and crown of plates and strips, comprising: a C-frame; two ray sources mounted in the upper arm of C-frame and distributed at an interval along the width direction of a steel plate/strip; two rows of gas-pressurized ionization chamber detector arrays mounted in the lower arm of C-frame and distributed at an interval along the moving direction of the plate/strip; collimators mounted below the two ray sources, the collimators enabling ray of each source to only irradiate to a corresponding row of detectors; pre-amplifier modules connected with the detector arrays; a data collector connected with the pre-amplifier modules; a data processing and image displaying computer connected with the data collector; and a cooling water and pressurized air service system and a control system for ensuring system operation and monitoring; wherein each of the two rows of detector arrays are corresponding to a ray source, and the two rows of detector arrays are symmetrically fixed on the both sides of a support seat; wherein each row of detector arrays are composed of hundreds of gas-pressurized ionization chamber units which are centripetally arranged with the target of the corresponding ray source as the circle center, the detector arrays being in linear arrangement, and the dimension of each gas-pressurized ionization chamber unit meets the requirement of spatial resolution of the plate/strip; wherein the dimension of the gas-pressurized ionization chamber units in the width direction of the plate/strip to be detected is smaller than 20 mm; wherein the rays emitted by the two ray source are respectively collimated to narrow sheet-like sector beams by the collimators mounted below and irradiate to the plate/strip to be detected, and the rays, after penetrating the steel plate/strip to be detected, pass through a rear collimator for removing scattered rays and enter the corresponding detector array, and signals generated by the detector arrays are amplified by the pre-amplifier modules connected therewith; wherein the data collector collects the signals of the two rows of detector arrays amplified by the pre-amplifier modules at regular time intervals, and transmits the measured data to the data processing and image displaying computer; wherein the data processing and image displaying computer calculates the inclination angles and the thicknesses of points on the cross section, and finally calculates the true thickness at each point on the cross section, and obtains a crown value C of the plate/strip to be detected according to the following formula: C = e - 1 2 ⁢ ( e 1 + e 2 ) in the formula, e represents the thickness at the center of the plate/strip to be detected; and e 1 and e 2 represent respectively the thicknesses at both ends of the plate/strip. 2. The detection device according to claim 1 , characterized in that the used ray source are any of X-ray source and isotope γ-ray source, and the field angle of each ray source covers the width of the whole plate/strip. 3. The detection device according to claim 1 , characterized in that the plate/strip to be detected is a plate/strip on an industrial hot rolling or cold rolling production line.

Assignees

Inventors

Classifications

  • for measuring contours or curvatures · CPC title

  • Metals · CPC title

  • G01B15/02Primary

    for measuring thickness · CPC title

  • G01B15/025Primary

    by measuring absorption · CPC title

  • thickness, density, surface weight (unit area) · CPC title

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Frequently asked questions

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What does patent US9689670B2 cover?
The invention relates to a device for detecting the thickness and crown of plates and strips, belonging to the field of nuclear technology applications. The device comprises a C-frame; two ray source mounted in an upper arm of the C-frame and distributed at an interval along the width direction of a steel plate/strip; two rows of gas-pressurized ionization chamber detector arrays mounted in a l…
Who is the assignee on this patent?
Wu Zhifang, An Jigang, Zhang Yuai, and 11 more
What technology area does this patent fall under?
Primary CPC classification G01B15/02. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 27 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).