Electron emission device

Patent metadata

Field	Value
Publication number	US-9685295-B2
Application number	US-201214235380-A
Country	US
Kind code	B2
Filing date	Jul 26, 2012
Priority date	Jul 28, 2011
Publication date	Jun 20, 2017
Grant date	Jun 20, 2017

Abstract

Provided herein are electron emission devices and device components for optical, electronic and optoelectronic devices, including cantilever-based MEMS and NEMS instrumentation. Devices of certain aspects of the invention integrate a dielectric, pyroelectric, piezoelectric or ferroelectric film on the receiving surface of a substrate having an integrated actuator, such as a temperature controller or mechanical actuator, optionally in the form of a cantilever device having an integrated heater-thermometer. Also provided are methods of making and using electron emission devices for a range of applications including sensing and imaging technology.

First claim

We claim:

1. An electron emission device comprising:
a substrate having a receiving surface;
a thin film comprising a pyroelectric material provided on at least a portion of said receiving surface or provided on one or more intermediate structures supported by said receiving surface; wherein said thin film comprises a crystalline material, has a thickness from 0.1 nm to 10 μm, has a first side facing said receiving surface and a second side opposite to said first side and said second side of said thin film comprises one or more probe tip relief features wherein each probe tip relief feature terminates at a distal end having lateral cross sectional dimensions greater than zero and less than or equal to 250 nm; and
an actuator operationally coupled to said thin film for selectively modulating an applied electric field in said thin film so as to generate electron emission from an external surface of said thin film; wherein said actuator comprises an extraction electrode positioned sufficiently close to said second side of said thin film so as to establish a selected applied electric field on a surface of said thin film so as to modulate said electron emission from said external surface of said thin film.

2. The device of claim 1 , wherein said external surface of said thin film is characterized by one or more relief features each independently terminating at a distal end having lateral cross sectional dimensions greater than zero and less than or equal to 50 nm.

3. The device of claim 1 , wherein said substrate comprises one or more probe tips on said receiving surface, wherein each probe tip independently terminates at a distal end having lateral cross sectional dimensions less than or equal to 250 nm; wherein said thin film is provided on at least a portion of said one or more probe tips or provided on one or more intermediate structures supported by said one or more probe tips, thereby forming said relief features of said thin film.

4. The device of claim 1 further comprising an additional actuator operationally coupled to said thin film for selectively modulating a temperature in said thin film so as to generate electron emission from an external surface of said thin film; wherein said thin film is provided on one or more probe tips supported by said additional actuator.

5. The device of claim 4 , wherein said additional actuator is a temperature controller in thermal communication with said thin film; wherein said temperature controller selectively modulates said temperature of said thin film so as to generate said electron emission from said external surface of said thin film.

6. The device of claim 5 , wherein said temperature controller comprises a heating component, cooling component or a combination of a heating component and cooling component for selectively increasing, decreasing or both increasing and decreasing the temperature of said thin film and wherein said temperature controller provides heating or cooling of said thin film at a rate equal to or greater than 1×10 5 ° C. s −1 or −1×10 5 ° C. s −1 .

7. The device of claim 5 , wherein said temperature controller comprises a heater-thermometer in thermal communication with said thin film, wherein said heater-thermometer comprises a resistive heater, a thermistor or both a resistive heater and thermistor.

8. The device of claim 1 , wherein further comprising a mechanical resonator for selectively modulating said state of mechanical strain of said thin film so as to generate said electron emission from said external surface of thin film and wherein said mechanical resonator compresses, expands, bends or flexes said thin film so as to generate said electron emission from said external surface of said thin film.

9. The device of claim 8 , wherein said mechanical resonator changes the state of mechanical strain of said thin film by a value selected from the range of 0.01% to 5% in a time period less than or equal to 2 milliseconds.

10. The device of claim 1 , wherein said thin film comprises a single crystalline material, polycrystalline material or doped crystalline material.

11. The device of claim 1 , wherein said thin film is deposited, grown or epitaxially grown directly on said receiving surface of said substrate or is deposited, grown or epitaxially grown on one or more intermediate structures supported by said receiving surface of said substrate.

12. The device of claim 2 , wherein said distal end of each of said at least one probe tip relief features has a cylindrical or conical shape.

13. The device of claim 1 , wherein said pyroelectric material has a pyroelectric coefficient greater than or equal to 0.000005 C/m 2 K.

14. The device of claim 1 , wherein said pyroelectric material comprises a ferroelectric material.

15. The device of claim 1 , wherein said thin film comprises:
a perovskite or a perovskite-based compound; or
a tungsten-bronze type oxide; or
a pyrochlore-type compound; or
a layered-structure oxide; or
a barium-fluoride type compound; or
a molybdate, a boracite, a halide, an antimony sulphide iodide compound, a potassium dihydrogen phosphate type compound, or a sulphate; or
a polymer ferroelectric material.

16. The device of claim 1 , wherein said substrate is a cantilever, a nanomechanical resonator beam or a cantilever bridge.

17. The cantilever of claim 16 , wherein said additional actuator is a heater-thermometer in thermal contact with said thin film.

18. A method for generating electron emission; said method comprising the steps of:
a. providing an electron emission device comprising: a substrate having a receiving surface; a thin film comprising a pyroelectric material provided on at least a portion of said receiving surface or provided on one or more intermediate structures supported by said receiving surface; wherein said thin film comprises a crystalline material, has a thickness from 0.1 nm to 10 μm, has a first side facing said receiving surface and a second side opposite to said first side and said second side of said thin film comprises one or more probe tip relief features wherein each probe tip relief feature terminates at a distal end having lateral cross sectional dimensions greater than zero and less than or equal to 250 nm; and an actuator operationally coupled to said thin film for selectively modulating an applied electric field said thin film so as to generate electron emission from an external surface of said thin film wherein said actuator comprises an extraction electrode positioned sufficiently close to said second side of said thin film so as to establish a selected applied electric field on a surface of said thin film so as to modulate said electron emission from said external surface of said thin film; and
b. applying a change in applied electric field to said thin film, so as to generate said electron emission from said external surface of thin film.

19. A method for making an electron emission device; said method comprising the steps of:
a. providing a substrate having a receiving surface;
b. providing a thin film comprising a pyroelectric material on at least a portion of said receiving surface or provided on one or more intermediate structures supported by said receiving surface; wherein said thin film comprises a crystalline material, has a thickness from 0.1 nm to 10 μm, has a first side facing said receiving surface and a second side opposite to said first side and said second side of said thin film comprises one or more probe tip relief features wherein each probe tip relief feature terminates at a distal end having

Assignees

• King William P
• Martin Lane W
• Fletcher Patrick C
• Univ Illinois

Inventors

• King William P
• Martin Lane W
• Fletcher Patrick C

Classifications

• G01Q60/30

  Scanning potential microscopy · CPC title

• H01J1/02 Primary

  Main electrodes · CPC title

• B82Y35/00

  Methods or apparatus for measurement or analysis of nanostructures · CPC title

• H01J2235/06

  Cathode assembly · CPC title

• H01J9/02

  Manufacture of electrodes or electrode systems · CPC title