Optical measuring system for measuring optical polarization properties of a sample

Patent metadata

Field	Value
Publication number	US-9683929-B2
Application number	US-201514668880-A
Country	US
Kind code	B2
Filing date	Mar 25, 2015
Priority date	Mar 26, 2014
Publication date	Jun 20, 2017
Grant date	Jun 20, 2017

Abstract

An optical measuring system measures polarization optical properties of a sample. The system includes (a) a light source that emits measuring light along an optical axis of an analysis beam path, (b) a polarization state generator, arranged downstream with respect to the light source in the analysis beam path which provides light with a defined polarization state, (c) a sample holder, arranged downstream with respect to the polarization state generator in the analysis beam path which accommodates the sample, (d) a polarization state analyzer, arranged downstream with respect to the sample holder in the analysis beam path which measures the polarization state of the measuring light after passing through the sample, and (e) a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached. Also described is a method for producing such an optical measuring system.

First claim

The invention claimed is:

1. Optical measuring system for measuring optical polarization properties of a sample, the optical measuring system, comprising:
a light source, adapted to emit measuring light along an optical axis of an analysis beam path of the optical measuring system;
a polarization state generator which is arranged downstream with respect to the light source in the analysis beam path and configured to provide the measuring light with a defined polarization state;
a sample holder, which is arranged downstream with respect to the polarization state generator in the analysis beam path and which is designed to accommodate the sample to be measured;
a polarization state analyzer, which is arranged downstream with respect to the sample holder in the analysis beam path and which is configured to measure the polarization state of the measuring light after passing through the sample;
a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached, wherein the mechanical support structure consists of a solid component; and
a temperature control device attached to the mechanical support structure in such a manner that a sample located in the sample holder can be indirectly temperature-controlled by the mechanical support structure.

2. Optical measuring system as set forth in claim 1 , wherein the temperature control device is attached to a first side of the mechanical support structure, and the sample holder is attached to a second side of the mechanical support structure, wherein the first side is opposite the second side.

3. Optical measuring system as set forth in claim 1 , wherein the temperature control device is a thermoelectric temperature control device which comprises one thermoelectric element or a plurality of thermoelectric elements.

4. Optical measuring system as set forth in claim 3 , wherein the at least one thermoelectric element is clamped between a cooling element of the thermoelectric temperature control device and the mechanical support structure.

5. Optical measuring system as set forth in claim 3 , wherein the support structure and the at least one thermoelectric element are connected to each other in an at least approximately torsion-free manner.

6. Optical measuring system as set forth in claim 1 , further comprising:
a temperature regulation circuit for a regulated temperature controlling of a sample accommodated in the sample holder.

7. Optical measuring system as set forth in claim 1 , wherein the solid component is a solid metallic plate.

8. Optical measuring system as set forth in claim 1 , wherein the sample holder is realized by means of a recess which is formed in the mechanical support structure.

9. Method for producing an optical measuring system, the method comprising:
providing a mechanical support structure, wherein the mechanical support structure consists of a solid component;
providing a light source, adapted to emit measuring light along an optical axis of an analysis beam path of the optical measuring system;
attaching, directly at the mechanical support structure, a polarization state generator downstream with respect to the light source in the analysis beam path, wherein the polarization state generator is configured to provide the measuring light with a defined polarization state;
attaching or forming, directly at the mechanical support structure, a sample holder downstream with respect to the polarization state generator in the analysis beam path, wherein the sample holder is designed to accommodate the sample to be measured;
attaching, directly at the mechanical support structure, a polarization state analyzer downstream with respect to the sample holder in the analysis beam path, wherein the polarization state analyzer is configured to measure the polarization state of the measuring light after passing through the sample; and
attaching a temperature control device to the mechanical support structure in such a manner that a sample being located in the sample holder can be indirectly temperature controlled by the mechanical support structure.

10. Optical measuring system as set forth in claim 1 , wherein the polarization state generator is mounted on the mechanical support structure such that it is reproducibly temperature controlled to have the same temperature as the measuring temperature of the sample in the sample holder.

11. Optical measuring system as set forth in claim 1 , wherein the polarization state analyzer is mounted on the mechanical support structure such that it is reproducibly temperature controlled to have the same temperature as the measuring temperature of the sample in the sample holder.

12. Optical measuring system as set forth in claim 1 , wherein a side of the mechanical support structure forms a part of a housing.

13. Optical measuring system as set forth in claim 12 , wherein the temperature control device is located outside the housing.

14. Optical measuring system as set forth in claim 12 , wherein the sample holder is located outside the housing.

15. Optical measuring system as set forth in claim 12 , wherein dissipation of heat from a cooling element affects neither an interior of the optical measuring system nor a sample chamber.

16. The method of claim 9 , wherein providing a mechanical support structure includes providing a torsion free chassis.

17. The method of claim 9 , wherein the steps of attaching directly at the mechanical support structure each of the polarization state generator, the sample holder, and the polarization state analyzer are performed along a single surface of the mechanical support structure.

18. The method of claim 9 , wherein the temperature control device is attached along a second surface of the mechanical support structure opposed to the single surface of the mechanical support structure.

19. The method of claim 9 , further comprising:
controlling a temperature of the polarization state generator by a separate temperature control.

20. The method of claim 9 , further comprising:
controlling a temperature of the polarization state analyzer by a separate temperature control.

21. The method of claim 9 , wherein providing a mechanical support structure includes forming a part of a housing.

22. The method of claim 9 , wherein both the temperature control device and the sample holder are located outside of a housing.

23. The method as set forth in claim 9 , wherein the solid component is a solid metallic plate.

24. The method as set forth in claim 9 , wherein the sample holder is realized by means of a recess which is formed in the mechanical support structure.

Assignees

• Anton Paar Gmbh

Inventors

• Ostermeyer Martin

Classifications

• G01N21/21 Primary

  Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

• G01N2201/061

  Sources · CPC title

• G01N21/01

  Arrangements or apparatus for facilitating the optical investigation · CPC title

• G01N21/05

  Flow-through cuvettes (G01N21/09 takes precedence; handling fluid samples G01N1/10) · CPC title

• G01N21/0332

  with temperature control (control of temperature G05D23/00; cryostats F17C3/08) · CPC title