System for detection and imaging by spectral analysis in several wavelength bands

Patent metadata

Field	Value
Publication number	US-9683893-B2
Application number	US-201414778494-A
Country	US
Kind code	B2
Filing date	Mar 19, 2014
Priority date	Mar 19, 2013
Publication date	Jun 20, 2017
Grant date	Jun 20, 2017

Abstract

The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analyzed in a first wavelength band, and at least one second image of the scene to be analyzed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing.

First claim

The invention claimed is:

1. An infrared imaging and detection system by spectral analysis in several bands of wavelengths including:
an imaging sensor including a plurality of elementary sensors forming together a matrix sensitive surface;
an imaging optics being an optical focusing system, adapted for forming on the sensitive surface-of the imaging sensor, a first image (Pb 1 ) of the scene to be analyzed in a first band of wavelengths (B 1 ), and at least one second image (Pb 2 ) of the scene to be analyzed in a second band of wavelengths (B 2 ),
an optical device adapted for shifting the first image (Pb 1 ) relatively to the second image (Pb 2 ) in the plane of the sensitive surface,
wherein the optical device adapted for shifting the first image (Pb 1 ) relatively to the second image (Pb 2 ) in the plane of the sensitive surface includes a single fixed optical plate with parallel faces, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the distance (p, dd) between two elementary sensors of the matrix sensitive surface along this direction or to a multiple of this distance, the single fixed optical plate with parallel faces being positioned between the imaging optics and the imaging sensor.

2. The imaging and detection system according to claim 1 , wherein the fixed optical device is a plate with planar and parallel faces made in a chromatic material, said plate being fixed and tilted with respect to the plane of the sensitive surface of the imaging sensor.

3. The imaging and detection system according to claim 1 , wherein the tilt angle (α) of said plate, the thickness (e) of the latter and its material, are adapted so that the shift distance is equal to the distance (p, dd) between two elementary sensors of the matrix sensitive surface along the shift direction or to a multiple of this spacing (p, dd).

4. The imaging and detection system according to claim 1 , wherein the chromatic optical material of the plate, has a chromatic dispersion coefficient of more than 0.002 and preferably more than 0.005.

5. The imaging and detection system according to claim 1 , wherein the plate is a material which is selected from the following materials: sapphire, calcium fluoride, barium fluoride, sodium fluoride, magnesium fluoride or magnesium oxide and silica.

6. The imaging and detection system according to claim 1 , wherein it includes a band-pass filter adapted for optimizing the ratio of the intensities of the radiations in the first (B 1 ) and the second (B 2 ) band of wavelengths.

7. The imaging and detection system according to claim 1 , wherein the imaging optics is adapted so that its optical resolution is of dimensions substantially equal to those of an elementary sensor of the sensitive matrix surface.

8. The imaging and detection system according to claim 1 , wherein it includes a spatially selective pass-band filter consisting of an alternation of first elementary filters letting through the wavelengths comprised in the first band of wavelengths (B 1 ) and of second elementary filters letting through the wavelengths comprised in the second band of wavelengths (B 2 ) and positioned in the vicinity of the sensitive surface of the imaging sensor.

9. The imaging and detection system according to claim 8 , wherein the first elementary filters and the second elementary filters of the spatially selective band-pass filter are positioned according to a checkerboard matrix distribution and are of a width equal to the distance (p, dd) between two elementary sensors in the shift direction.

10. The imaging and detection system according to claim 8 , wherein the first elementary filters and the second elementary filters are positioned in bands perpendicular to the direction of the shift and are of a width equal to the distance (p, dd) between two elementary sensors in the shift direction.

11. The imaging and detection system according to claim 8 wherein the imaging optics is adapted so that its optical resolution is of a dimension substantially equal to twice the distance (p, dd) between two elementary sensors of the matrix sensitive surface in the shift direction.

12. The imaging and detection system according to claim 8 wherein the imaging optics is adapted so that its optical resolution has a dimension along the direction perpendicular to that of the shift substantially equal to the distance (p, dd) between two elementary sensors of the sensitive matrix surface.

13. The imaging and detection system according to claim 1 , wherein the imaging sensor and the fixed optical device are placed in a cryogenic chamber.

14. The imaging and detection system according to claim 1 , wherein the plate forms a window of a cryogenic chamber containing the imaging sensor.

15. The imaging and detection system according to claim 1 , wherein both spectral bands (B 1 ) and (B 2 ) are selected from the following spectral bands:
infrared bands IIa or IIb;
infrared band I;
one or two infrared laser bands;
near infrared band.

Assignees

• Sagem Defense Securite

Inventors

• Dufresne De Virel Francois
• Bousquet Marc

Classifications

• H04N23/20

  for generating image signals from infrared radiation only · CPC title

• G01J3/36 Primary

  Investigating two or more bands of a spectrum by separate detectors · CPC title

• F41G3/147

  based on detection of a firing weapon · CPC title

• G01S3/781

  Details · CPC title

• G01S3/784

  using a mosaic of detectors · CPC title