Ceramic electronic device, powder material, paste material, and manufacturing method of ceramic electronic device
US-12073996-B2 · Aug 27, 2024 · US
US9683112B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9683112-B2 |
| Application number | US-201414519404-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 21, 2014 |
| Priority date | Oct 21, 2014 |
| Publication date | Jun 20, 2017 |
| Grant date | Jun 20, 2017 |
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The present invention provides a thick-film paste for printing the front side of a solar cell device having one or more insulating layers and a method for doing so. The thick-film paste comprises a source of an electrically conductive metal and a lead-tungsten-based oxide dispersed in an organic medium. The invention also provides a semiconductor device comprising an electrode formed from the thick-film paste.
Opening claim text (preview).
What is claimed is: 1. A thick-film paste composition comprising: a) 80-99.5 wt % of a source of electrically conductive metal; b) 0.5 to 20 wt % of a vanadium-free, tellurium-free lead-tungsten-based oxide; and c) an organic medium; wherein said source of electrically conductive metal and said vanadium-free, tellurium-free lead-tungsten-based oxide are dispersed in said organic medium and wherein the above wt % are based on the total weight of said source of electrically conductive metal and said vanadium-free, tellurium-free lead-tungsten-based oxide, said vanadium-free, tellurium-free lead-tungsten-based oxide consisting of 75-88wt % PbO and 12-25 wt % WO 3 , wherein the wt % of PbO and WO 3 are based on the total weight of said vanadium-free tellurium-free lead-tungsten-based oxide. 2. The thick-film paste composition of claim 1 , wherein said electrically conductive metal is selected from the group consisting of Ag, Cu, Au, Pd, Pt, Sn, Al and Ni. 3. The thick-film paste composition of claim 2 , wherein said electrically conductive metal is Ag. 4. A semiconductor device comprising an electrode formed from a thick-film paste composition comprising: a) 80-99.5 wt % of a source of electrically conductive metal; b) 0.5 to 20 wt % of a vanadium-free, tellurium-free lead-tungsten-based oxide; and c) an organic medium; wherein said source of electrically conductive metal and said vanadium-free, tellurium-free lead-tungsten-based oxide are dispersed in said organic medium and wherein the above wt % are based on the total weight of said source of electrically conductive metal and said vanadium-free, tellurium-free lead-tungsten-based oxide, said vanadium-free, tellurium-free lead-tungsten-based oxide consisting of 75-88 wt % PbO and 12-25 wt % WO 3 , wherein the wt % of PbO and WO 3 are based on the total weight of said vanadium-free tellurium-free lead-tungsten-based oxide. 5. The semiconductor device of claim 4 , wherein said electrically conductive metal is selected from the group consisting of Ag, Cu, Au, Pd, Pt, Sn, Al and Ni. 6. The semiconductor device of claim 5 , wherein said electrically conductive metal is Ag.
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