Phase measurement device and method in microwave tomography system

US9678124B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9678124-B2
Application numberUS-201414496447-A
CountryUS
Kind codeB2
Filing dateSep 25, 2014
Priority dateSep 26, 2013
Publication dateJun 13, 2017
Grant dateJun 13, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

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A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.

First claim

Opening claim text (preview).

What is claimed is: 1. A phase measurement device in a microwave tomography system, comprising: a reference frequency generator configured to generate a reference frequency signal; a transmit (Tx) frequency generator configured to generate a first continuous wave frequency signal using the reference frequency signal and to generate a second continuous wave frequency signal using the reference frequency signal, the first continuous wave frequency signal and the second continuous wave frequency signal being separated by a predetermined frequency amount and further configured to transmit from a transmit antenna the first continuous wave frequency signal and the second continuous wave frequency signal; a local oscillation frequency generator that receives the reference frequency signal from the reference frequency generator and is configured to generate a first local oscillation frequency signal using the reference signal and is configured to generate a second local oscillation frequency signal using the reference signal, the second local oscillation frequency signal being separated from the second continuous wave frequency signal by a predetermined intermediate frequency amount; a low noise amplifier (LNA) configured to receive from a receive antenna a first receive frequency signal corresponding to the first continuous wave frequency signal and a second receive frequency signal corresponding to the second continuous wave frequency signal, to low-noise-amplify the first receive frequency signal and the second receive frequency signal, and to output a respective amplified first receive frequency signal and amplified second receive frequency signal; a mixer configured to generate a first mixed signal by mixing the amplified first receive frequency signal and the first local oscillation frequency signal, and generate a second mixed signal by mixing the amplified second receive frequency signal and the second local oscillation frequency signal; an intermediate frequency (IF) filter configured to generate a first IF signal obtained by filtering an IF band from the first mixed signal, and generate a second IF signal obtained by filtering the IF band from the second mixed signal; a phase measurement unit configured to measure a first phase value from the first IF signal, and measure a second phase value from the second IF signal; and an unwrapped phase calculation unit configured to determine an unwrapped phase value based on a first phase difference calculated from a difference between the first and second phase values and a second phase difference corresponding to the discrete frequency. 2. The phase measurement device of claim 1 , wherein the unwrapped phase calculation unit determines the first phase value as the unwrapped phase value, when the first phase difference is smaller than the second phase value. 3. The phase measurement device of claim 1 , wherein when the first phase difference is not smaller than the second phase difference, the unwrapped phase calculation unit corrects the first phase value using an elapsed period between the first and second continuous wave frequency signals, and determines the corrected first phase value as the unwrapped phase value. 4. The phase measurement device of claim 3 , wherein the elapsed period comprises an integer value obtained by dividing the first phase difference by the second phase difference. 5. The phase measurement device of claim 4 , wherein the unwrapped phase calculation unit multiplies the integer value by 360, adds the multiplication result and the first phase value, and determines the addition result as the unwrapped phase value.

Assignees

Inventors

Classifications

  • G01R25/00Primary

    Arrangements for measuring phase angle between a voltage and a current or between voltages or currents · CPC title

  • Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (G01N3/00 - G01N17/00, G01N24/00 take precedence) · CPC title

  • G01V3/12Primary

    operating with electromagnetic waves {(operating with millimetre waves G01V8/005)} · CPC title

  • Investigating or analysing materials by the use of electric, electrochemical, or magnetic means (G01N3/00 – G01N25/00 take precedence; measurement or testing of electric or magnetic variables or of electric or magnetic properties of materials G01R) · CPC title

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What does patent US9678124B2 cover?
A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequ…
Who is the assignee on this patent?
Electronics & Telecommunications Res Inst
What technology area does this patent fall under?
Primary CPC classification G01R25/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 13 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).