Mass spectrometer

US9672330B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9672330-B2
Application numberUS-73933510-A
CountryUS
Kind codeB2
Filing dateOct 23, 2007
Priority dateOct 23, 2007
Publication dateJun 6, 2017
Grant dateJun 6, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A product ion spectrum is created on the basis of MS 2 analysis data respectively obtained for a parent compound and a metabolite (S 1 and S 2 ). Additionally, a neutral loss spectrum, in which the mass of each product ion is replaced with a mass difference between the mass of the product ion and that of a precursor ion, is created (S 3 ). Then, a common peak having the same mass on the neutral loss spectrums of both the parent compound and the metabolite is extracted (S 4 ), and a complementary peak appearing on the product ion spectrum of the metabolite is extracted (S 5 ); this peak appears at a position corresponding to the difference between the mass of the common peak and that of the precursor ion. The ion corresponding to the complementary peak is designated as a precursor ion for the next MS 3 analysis (S 6 ), and this MS 3 analysis is performed (S 7 ). By a dissociation operation, if a portion common to the parent compound and the metabolite is desorbed in the form of a neutral molecule while a different portion remains in the form of an ion, an MS 3 analysis in which the ion of the different portion is used as the precursor ion is performed to obtain structural information of a site of metabolism.

First claim

Opening claim text (preview).

The invention claimed is: 1. A mass spectrometer, comprising: a mass analyzer unit that provides an MS n analysis (where n is an integer greater than two), the mass analyzer unit including an ion source and a detector, and the mass analyzer unit performing MS m−1 analysis (where m is an integer greater than two and no greater than n) on a first component and a second component to obtain mass analysis data for the first component and mass analysis data for the second component from the detector and performing an MS m analysis including a dissociation operation on the first component and/or the second component; a controller configured to control the dissociation operation; and a data processor configured for a) creating an MS m−1 spectrum (where m is an integer greater than two and no greater than n) based on the mass analysis data for the first component, and creating an MS m−1 spectrum based on the mass analysis data for the second component; b) extracting a common peak having a same mass to charge ratio in the two MS m−1 spectrums relating to the first component and the second component; c) either excluding an ion corresponding to the common peak, or giving a low degree of priority to this ion, as a candidate of a precursor ion for an m-1-th stage of the dissociation operation in the MS m analysis on the first component and/or the second component; d) designating an ion corresponding to a complementary peak as the precursor ion for the m−1-th stage of the dissociation operation in the MS m analysis on the first component and/or the second component while excluding or giving a low degree of priority to the ion corresponding to the common peak; and e) acquiring a subsequent MS m spectrum from the dissociation operation. 2. A method of providing an MS n analysis (where n is an integer greater than two), comprising: a) performing MS m−1 analysis (where m is an integer greater than two and no greater than n) on a first component and a second component using a mass spectrometer, including an ion source and a detector, to obtain mass analysis data for the first component and mass analysis data for the second component from the detector; b) creating an MS m−1 spectrum (where m is an integer greater than two and no greater than n) based on the mass analysis data obtained by the MS m−1 analysis performed for the first component, and creating the MS m−1 spectrum based on the mass analysis data obtained by the MS m−1 analysis performed for the second component; c) extracting a common peak having a same mass to charge ratio in the two MS m−1 spectrums relating to the first component and the second component; d) either excluding an ion corresponding to the common peak, or giving a low degree of priority to this ion, as a candidate of a precursor ion for an m−1-th stage of a dissociation operation in an MS m analysis on the first component and/or the second component, e) designating an ion corresponding to a complementary peak as the precursor ion for the M−1-th stage of the dissociation operation in the MSm analysis on the first component and/or the second component while excluding or giving a low degree of priority to the ion corresponding to the common peak; f) performing the MS m analysis including a dissociation operation on the first component and/or the second component using the mass spectrometer; and g) acquiring a subsequent MS m spectrum from the dissociation operation.

Assignees

Inventors

Classifications

  • Methods for using particle spectrometers · CPC title

  • G16C20/20Primary

    Identification of molecular entities, parts thereof or of chemical compositions · CPC title

  • Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

  • Methods of protein analysis involving mass spectrometry · CPC title

  • G06F19/703Primary

    Physics · mapped topic

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What does patent US9672330B2 cover?
A product ion spectrum is created on the basis of MS 2 analysis data respectively obtained for a parent compound and a metabolite (S 1 and S 2 ). Additionally, a neutral loss spectrum, in which the mass of each product ion is replaced with a mass difference between the mass of the product ion and that of a precursor ion, is created (S 3 ). Then, a common peak having the same mass on the neutr…
Who is the assignee on this patent?
Yamaguchi Shinichi, Shimadzu Corp
What technology area does this patent fall under?
Primary CPC classification G16C20/20. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 06 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).