Method to determine BER (bit error rate) from an eye diagram

Patent metadata

Field	Value
Publication number	US-9672089-B2
Application number	US-201414519703-A
Country	US
Kind code	B2
Filing date	Oct 21, 2014
Priority date	Oct 21, 2014
Publication date	Jun 6, 2017
Grant date	Jun 6, 2017

Abstract

A system and method for calculating a bit error rate for a mask is described. For each time during the time duration of the mask, the minimum and maximum voltages of the mask at that time are determined. The maximum bit error rate can be calculated for each time by integrating between those voltages. The maximum bit error rate for all times during the time duration of the mask can be selected as the maximum bit error rate for the mask.

First claim

What is claimed is:

1. A system, comprising:
a test and measurement instrument;
a memory in the test and measurement instrument capable of storing a probability distribution function (PDF) for an eye diagram;
an extrema unit to determine a minimum voltage and a maximum voltage for a mask in the eye diagram at each time during a time duration of the mask in the eye diagram, the mask having a pre-determined time duration and a pre-determined voltage range;
a sum unit to calculate a bit error rate (BER) at each time from the PDF using the minimum voltage and the maximum voltage at each time during the time duration of the mask in the eye diagram; and
a mask BER unit to determine a BER for the mask in the eye diagram from the BER at each time during the time duration of the mask in the eye diagram.

2. The system according to claim 1 , further comprising:
a receiver to receive a signal that produces the eye diagram; and
a PDF determiner to determine the PDF for the eye diagram.

3. The system according to claim 1 , wherein the sum unit includes a scaling unit to scale the calculated BER by a factor no less than 0.5 and no greater than 1.

4. The system according to claim 1 , wherein the sum unit includes an integrator to integrate the PDF from the minimum voltage to the maximum voltage at each time.

5. The system according to claim 1 , wherein:
the extrema unit is operative to determine a minimum voltage and a maximum voltage for each polygon in the mask in the eye diagram at each time during the time duration of the mask in the eye diagram; and
the sum unit is operative to calculate a BER at each time from the PDF using the minimum voltage and the maximum voltage over all polygons at each time during the time duration of the mask in the eye diagram.

6. The system according to claim 5 , wherein the sum unit includes a scaling unit to scale the calculated BER by a factor.

7. The system according to claim 1 , further comprising a display.

8. The system according to claim 7 , wherein:
the memory is capable of storing a maximum acceptable BER for the mask in the eye diagram;
the system further comprises a comparator to compare the BER for the mask in the eye diagram with the maximum acceptable BER for the mask in the eye diagram; and
the display is operative to indicate whether the BER for the mask in the eye diagram is no greater than the maximum acceptable BER for the mask in the eye diagram.

9. The system according to claim 8 , further comprising a shifter to shift the mask in the eye diagram if the BER for the mask in the eye diagram is greater than the maximum acceptable BER for the mask in the eye diagram.

10. The system according to claim 7 , wherein the display is operative to present the BER for the mask in the eye diagram.

11. The system according to claim 7 , wherein the display is operative to present the eye diagram.

12. The system according to claim 11 , wherein the display is further operative to present the mask in the eye diagram.

13. A method for determining a bit error rate (BER) for a mask in an eye diagram, comprising:
receiving a probability distribution function (PDF) for the eye diagram;
at each time during a time duration of the mask in the eye diagram, the mask having a pre-determined time duration and a pre-determined voltage range, determining a minimum voltage of the mask in the eye diagram at that time and a maximum voltage of the mask in the eye diagram at that time;
at each time during the time duration of the mask in the eye diagram, calculating, using a test and measurement instrument, a BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time; and
determining, using the test and measurement instrument, a BER for the mask in the eye diagram as a maximum of all BERs at each time during the time duration of the mask in the eye diagram.

14. The method according to claim 13 , wherein receiving the probability distribution function for the eye diagram includes:
receiving a signal that produces an eye diagram; and
determining the PDF from the signal.

15. The method according to claim 13 , further comprising applying the mask to the eye diagram.

16. The method according to claim 13 , further comprising:
identifying a maximum acceptable BER for the mask in the eye diagram according to a standard;
comparing the BER for the mask in the eye diagram with the maximum acceptable BER for the mask in the eye diagram; and
asserting that the mask in the eye diagram satisfies the standard if the BER for the mask in the eye diagram is no greater than the maximum acceptable BER for the mask in the eye diagram.

17. The method according to claim 16 , further comprising, if the BER for the mask in the eye diagram is greater than the maximum acceptable BER for the mask in the eye diagram, shifting the mask in the eye diagram.

18. The method according to claim 17 , wherein shifting the mask in the eye diagram includes horizontally shifting the mask in the eye diagram.

19. The method according to claim 17 , wherein shifting the mask in the eye diagram includes vertically shifting the mask in the eye diagram.

20. The method according to claim 13 , wherein calculating a BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time includes scaling the calculated BER by a factor no less than 0.5 and no greater than 1.

21. The method according to claim 13 , wherein calculating a BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time includes calculating an integral of the PDF from the minimum voltage at that time to the maximum voltage at that time.

22. The method according to claim 13 , wherein:
determining the minimum voltage at that time and the maximum voltage at that time includes determining a minimum voltage at that time and a maximum voltage at that time for each polygon in the mask in the eye diagram; and
calculating a BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time includes calculating the BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time over all polygons in the mask in the eye diagram.

23. The method according to claim 22 , wherein calculating the BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time over all polygons in the mask in the eye diagram includes scaling the sum of the PDF for the minimum voltage at that time and the PDF for the maximum voltage at that time for each polygon in the mask in the eye diagram.

24. The method according to claim 13 , further comprising displaying the eye diagram.

25. The method according to claim 24 , wherein displaying the eye diagram includes displaying the mask in the eye diagram.

Assignees

• Tektronix Inc

Inventors

• Poulo Richard J

Classifications

• G06F11/076 Primary

  by exceeding a count or rate limit, e.g. word- or bit count limit · CPC title

• G01R31/3171

  BER [Bit Error Rate] test · CPC title

• G01R13/029 Primary

  Software therefor · CPC title