Method for producing an optoelectronic semiconductor component, and optoelectronic semiconductor component

Patent metadata

Field	Value
Publication number	US-9653670-B2
Application number	US-201314378610-A
Country	US
Kind code	B2
Filing date	Jan 17, 2013
Priority date	Feb 13, 2012
Publication date	May 16, 2017
Grant date	May 16, 2017

Abstract

In at least one embodiment, the semiconductor component includes at least one optoelectronic semiconductor chip having a radiation exit side. The surface-mountable semiconductor component comprises a shaped body that covers side surfaces of the semiconductor chip directly and in a positively locking manner. The shaped body and the semiconductor chip do not overlap, as seen in a plan view of the radiation exit side.

First claim

The invention claimed is:

1. An optoelectronic semiconductor component comprising:
at least one optoelectronic semiconductor chip having a radiation exit side;
a shaped body, which covers side surfaces of the semiconductor chip directly and in a positively locking manner; and
a metallic heat spreader with a constant thickness that is disposed directly on an underside of the at least one optoelectronic semiconductor chip that is opposite the at least one optoelectronic semiconductor chip from the radiation exit side, and that is further disposed directly on an underside of the shaped body, wherein the underside of the at least one optoelectronic semiconductor chip is free of a material of the shaped body and is completely covered with the heat spreader;
wherein the semiconductor component is surface-mountable, wherein the heat spreader is a part of a mounting side of the optoelectronic semiconductor component, wherein the mounting side is opposite the optoelectronic semiconductor component from a radiation exit side of the optoelectronic semiconductor component, and wherein the optoelectronic semiconductor component is configured to be fixed to an external carrier at the mounting side; and
wherein the shaped body and the semiconductor chip do not overlap, as seen in a plan view of the radiation exit side.

2. The optoelectronic semiconductor component according to claim 1 , wherein the at least one semiconductor chip comprises at least four of the semiconductor chips:
wherein the heat spreader is structured to form at least two electrical contact locations for externally making electrical contact with the semiconductor component, or the heat spreader is electrically insulated from a semiconductor layer sequence of the semiconductor chips, wherein the heat spreader has a thickness of between 10 μm and 250 μm inclusive;
wherein the component further comprises an electrical feedthrough from the mounting side to a body top side of the shaped body that is situated opposite said mounting side; and
wherein the component further comprises a plurality of electrical connections that run at and parallel to the body top side and that electrically connect some of the semiconductor chips or all of the semiconductor chips in series, wherein the semiconductor chips are densely packed, such that the semiconductor chips constitute at least an area proportion of 30% of the semiconductor component, within an arrangement region of the semiconductor chips and as seen in a plan view of radiation main sides.

3. The optoelectronic semiconductor component according to claim 2 , wherein coefficients of thermal expansion of the semiconductor chip and of the shaped body deviate from one another by at most a factor of 4.

4. A method for producing an optoelectronic semiconductor component, the method comprising:
providing an intermediate carrier having a carrier top side;
arranging a plurality of optoelectronic semiconductor chips with a radiation exit side directly on the carrier top side, wherein the semiconductor chips are spaced apart from one another;
producing a shaped body that directly surrounds the semiconductor chips all around in a lateral direction and mechanically permanently connects them to one another, wherein at least one main side of the semiconductor chips which faces away from the intermediate carrier remains free of a material of the shaped body;
removing the intermediate carrier; and
after producing the shaped body and after removing the intermediate carrier, applying a metallic heat spreader with a constant thickness directly to undersides of the semiconductor chips that are opposite the radiation exit side and that face away from the intermediate carrier, and directly to an underside of the shaped body that faces away from the intermediate carrier,
wherein the undersides of the semiconductor chips are completely covered with the heat spreader, and
wherein the heat spreader is a part of a mounting side of the semiconductor component, wherein the mounting side is opposite the semiconductor component from a radiation exit side of the semiconductor component, and wherein the semiconductor component is configured to be fixed to an external carrier at the mounting side.

5. The method according to claim 4 , wherein the heat spreader is electrically conductive and is produced to form at least two electrical contact locations of the semiconductor component.

6. The method according to claim 4 , wherein the heat spreader is electrically insulated from a semiconductor layer sequence of the semiconductor chips.

7. The method according to claim 4 , wherein each semiconductor chip of the plurality of optoelectronic semiconductor chips comprises exactly two electrical contact locations that are disposed on a side of the respective semiconductor chip that faces away from the heat spreader, wherein the exactly two electrical contact locations of each semiconductor chip are located in a corner region, when seen in a top view, of the respective semiconductor chip, and wherein each of the exactly two electrical contact locations terminate flush with the shaped body when seen in a cross sectional view.

8. The method according to claim 4 ,
wherein a thickness of the heat spreader is between 10 μm and 250 μm inclusive;
wherein the heat spreader is electrically conductive and is produced to form at least two electrical contact locations of the semiconductor component, or the heat spreader is electrically insulated from a semiconductor layer sequence of the semiconductor chips,
wherein radiation exit sides of the semiconductor chips face the carrier top side when the semiconductor chips are arranged; and
wherein coefficients of thermal expansion of the semiconductor chips and of the shaped body deviate from one another by at most a factor of 4.

9. The method according to claim 8 ,
wherein an electrical interconnection of the semiconductor chips is effected after the intermediate carrier has been removed, wherein the electrical interconnection is effected by applying electrical connectors on the radiation exit sides and on a body top side of the shaped body that runs therewith in one plane;
wherein the connectors are formed by conductor tracks that run parallel to the radiation exit side and a body top side of the body and are in direct contact with them;
wherein the radiation exit side and the body top side lie in a common plane; and
wherein the shaped body and the semiconductor chip do not overlap, as seen in a plan view of the radiation exit side.

10. The method according to claim 8 , wherein the heat spreader is applied continuously across at least three of the semiconductor chips and wherein the heat spreader is not subsequently structured.

11. The method according to claim 8 , wherein the heat spreader is applied electrolytically or in the form of a prestructured film.

12. The method according to claim 4 , wherein coefficients of thermal expansion of the semiconductor chips and of the shaped body deviate from one another by at most a factor of 4.

13. The method according to claim 4 , wherein the semiconductor chips are applied to the intermediate carrier in such a way that all electrical contact locations of the semiconductor chips are situated at a side facing the intermediate carrier.

14. The method according to claim 1 , wherein the semiconductor chips are arranged in a matrix-like fashion on the intermediate carrier, wherein a distance between adjacent semiconductor chips is between 10 μm and 250 μm inclusive.

15. The method according to claim 4 , wherein arranging the semiconductor chips comprises densely arranging the pl

Assignees

• Osram Opto Semiconductors Gmbh

Inventors

• Illek Stefan
• Wegleiter Walter
• Weidner Karl
• Stegmeier Stefan

Classifications

• H10W90/753

  between laterally-adjacent chips · CPC title

• H10W90/00

  Package configurations · CPC title

• H01L2933/0066

  Electricity · mapped topic

• H01L2924/00014

  Electricity · mapped topic

• H01L33/62

  Electricity · mapped topic