Integrated chip with heating element and reference circuit

Patent metadata

Field	Value
Publication number	US-9651981-B2
Application number	US-201213570630-A
Country	US
Kind code	B2
Filing date	Aug 9, 2012
Priority date	Aug 9, 2012
Publication date	May 16, 2017
Grant date	May 16, 2017

Abstract

Some aspects of the present disclosure relate to an apparatus that includes an integrated chip having a bandgap reference circuit and one or more heating elements. The bandgap reference circuit is located within a subset of the integrated chip and outputs a reference voltage having a temperature dependence. The one or more of the heating elements vary the temperature of the subset of the integrated chip.

First claim

What is claimed is:

1. An integrated chip, comprising:
a bandgap reference circuit comprised within a subset of an integrated chip, adjacent to a second section of the integrated chip, and configured to output a reference voltage having a temperature dependence;
one or more heating elements comprised within the integrated chip and configured to vary a temperature of the subset by a first amount and to vary a temperature of the second section of the integrated chip by a second amount less than the first amount, wherein the one or more heating elements are configured to vary the temperature of the subset over a temperature range in a step-wise manner that provides for a plurality of discrete temperatures;
wherein the one or more heating elements are configured to be coupled to a control element configured to iteratively provide one or more control signals to the one or more heating elements, measure the reference voltage produced by the bandgap reference circuit, and adjust a value of the one or more control signals, so as to measure a plurality of reference voltages at a plurality of step-wise increasing temperature, wherein the control signals vary the temperature of the subset based upon a current value of the control signals or a number of heating elements being driven by the control signals;
one or more switching elements coupled between the control element and the one or more heating elements and configured to selectively couple the control element to the one or more heating elements; and
a switching controller that is separate from the control element and configured to generate a third control signal that selectively operates the one or more switching elements to connect the control element to the one or more heating elements, wherein upon connecting the control element to the one or more heating elements the one or more heating elements produce heat.

2. The integrated chip of claim 1 , wherein the one or more heating elements comprise dummy devices configured to improve lithographic processing parameters for one or more elements within the integrated chip.

3. The integrated chip of claim 1 , further comprising:
a memory element configured to store data corresponding to a predetermined sequence of operation for the one or more switching elements,
wherein the switching controller is configured to operate the one or more switching elements according to the predetermined sequence to adjust a value of the control signals so as to achieve a plurality of discrete temperatures in the subset.

4. The integrated chip of claim 1 , wherein the control element comprises an on-chip current source configured to output a selected current value to the one or more heating elements.

5. The integrated chip of claim 1 , wherein the heating elements are positioned to surround the bandgap reference circuit.

6. The integrated chip of claim 1 , further comprising:
a measurement element configured to ascertain the plurality of reference voltages by measuring a reference voltage output from the bandgap reference circuit at a plurality of discrete temperatures over a temperature range and to determine a temperature coefficient of the bandgap reference circuit from the plurality of reference voltages.

7. The integrated chip of claim 6 , wherein the measurement element is further configured to generate a second control signal that operates to trim one or more elements within the bandgap reference circuit to reduce a variation of the temperature coefficient.

8. The integrated chip of claim 1 , further comprising:
the control element configured to iteratively provide the one or more control signals to the one or more heating elements, measure the reference voltage produced by the bandgap reference circuit, and adjust the value of the one or more control signals, so as to measure the plurality of reference voltages at the plurality of step-wise increasing temperatures.

9. A testing circuit, comprising:
a device under test comprised within a subset of an integrated chip, adjacent to a second section of the integrated chip, and having a temperature dependence, such that operation of the device under test is configured to vary as a function of temperature, wherein the device under test comprises a bandgap reference circuit configured to output a reference voltage having a value that is temperature dependent;
one or more dummy devices comprising dummy transistors comprised within the integrated chip and configured to produce heat to vary a temperature of the device under test by a first amount and to vary a temperature of the second section of the integrated chip by a second amount less than the first amount; and
a measurement element configured to:
ascertain a plurality of reference voltages by measuring a reference voltage output from the bandgap reference circuit at a plurality of discrete temperatures over a temperature range;
determine a temperature coefficient of the bandgap reference circuit from the plurality of reference voltages; and
perform trimming of one or more elements within the bandgap reference circuit based on the temperature coefficient.

10. The testing circuit of claim 9 , further comprising:
a control element configured to generate a control signal and to provide the control signal to the one or more dummy devices, wherein the one or more dummy devices are configured to produce heat responsive to the control signal;
one or more switching elements coupled between the control element and the one or more dummy devices; and
a switching controller configured to selectively operate the one or more switching elements to connect the control element to the one or more dummy devices, wherein upon connecting the control element to the one or more dummy devices, the one or more dummy devices produce heat.

11. The testing circuit of claim 10 ,
wherein the control element comprises a current source having a plurality of output nodes;
wherein respective output nodes are configured to generate a control signal having a current value that is independent of a current value of control signals that are output from other output nodes.

12. The testing circuit of claim 9 , wherein the one or more dummy devices are configured to improve lithographic processing parameters for one or more elements within the integrated chip.

13. A method of determining a temperature coefficient for a reference circuit, comprising:
providing an integrated chip comprising a reference circuit configured to output a reference voltage having a temperature dependence and a second section of the integrated chip adjacent to the reference circuit;
providing one or more control signals to one or more heating elements comprised within the integrated chip, wherein upon receiving a control signal the one or more heating elements are configured to produce heat that raises a temperature of the reference circuit by a first amount and that raises a temperature of the second section of the integrated chip by a second amount less than the first amount;
iteratively providing the one or more control signals to the one or more heating elements, measuring a corresponding reference voltage produced by the reference circuit, and adjusting a value of the one or more control signals, so as to measure a plurality of reference voltages at a plurality of step-wise increasing temperatures;
adjusting a value of at least one of the one or more control signals to generate a plurality of discrete temperatures for the reference circuit;
measuring reference voltages produced by reference circuit at the plurality of discrete temperatures to generate a plurality of measured reference voltages;
determining a temperature co

Assignees

• Lindholm Christian
• Hassander Henrik
• Infineon Technologies Austria Ag

Inventors

• Lindholm Christian
• Hassander Henrik

Classifications

• H10W40/10

  Arrangements for heating · CPC title

• G05F3/30 Primary

  Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities (G05F3/26 takes precedence) · CPC title

• H01L23/345

  Electricity · mapped topic

• H01L2924/0002

  Electricity · mapped topic

• G01K1/00

  Details of thermometers not specially adapted for particular types of thermometer (circuits for reducing thermal inertia G01K7/42) · CPC title