Photo device inspection apparatus and photo device inspection method

Patent metadata

Field	Value
Publication number	US-9651607-B2
Application number	US-201414327383-A
Country	US
Kind code	B2
Filing date	Jul 9, 2014
Priority date	Jul 10, 2013
Publication date	May 16, 2017
Grant date	May 16, 2017

Abstract

A photo device inspection apparatus is an apparatus for inspecting a solar cell panel, which is a photo device. The photo device inspection apparatus includes an irradiation part configured to irradiate the solar cell panel with pulsed light radiated from a femtosecond laser, which is a light source, an electromagnetic wave detection part configured to detect a pulse of an electromagnetic wave radiated from the solar cell panel in response to irradiation with the pulsed light, and a current detection part configured to detect a current generated by the solar cell panel in response to irradiation with the pulsed light.

First claim

What is claimed is:

1. A photo device inspection apparatus for inspecting a photo device, comprising:
an irradiation part configured to irradiate said photo device with light from a light source;
an electromagnetic wave detection part configured to detect an electromagnetic wave radiated from said photo device in response to irradiation with said light, wherein
said irradiation part comprises a scanning mechanism configured to scan an inspection target area of said photo device with said light;
a current detection part configured to detect a current generated by said photo device in response to irradiation with said light;
a current intensity distribution image generation part coupled to the current detection part and configured to generate a current intensity distribution image that indicates an intensity distribution of said current generated in said inspection target area,
said current intensity distribution image is an image generated based on a current value detected by said current detection part:
an electromagnetic wave intensity distribution image generation part configured to generate an electromagnetic wave intensity distribution image that indicates an intensity distribution of said electromagnetic wave generated in said inspection target area; and
an image composition part configured to composite said current intensity distribution image and said electromagnetic wave intensity distribution image.

2. The photo device inspection apparatus according to claim 1 , wherein
said light source is a femtosecond laser, and
said detection part includes:
a detector configured to detect said electromagnetic wave by receiving probe light radiated from said femtosecond laser; and
a delay part configured to delay a timing of incidence of said probe light on said detector relative to a timing of incidence of said electromagnetic wave on said detector,
said photo device inspection apparatus further comprising:
a temporal waveform restoration part configured to restore a temporal waveform of said electromagnetic wave on the basis of an electric field strength of said electromagnetic wave detected by operating said delay part.

3. The photo device inspection apparatus according to claim 2 , further comprising:
an inspection position setting part configured to set a position to which said irradiation part applies said light, in order to restore said temporal waveform.

4. The photo device inspection apparatus according to claim 1 , further comprising:
a determining part configured to determine whether or not said current detected by said current detection part has an intensity that satisfies a pre-set reference value;
wherein said scanning mechanism scans an area in which said reference value is not satisfied with said light, and said electromagnetic wave detection part detects an electromagnetic wave generated by the scanning.

Assignees

• Dainippon Screen Mfg
• Univ Osaka
• Screen Holdings Co Ltd

Inventors

• Nakanishi Hidetoshi
• Ito Akira
• Kawayama Iwao
• Tonouchi Masayoshi

Classifications

• H02S50/10

  Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

• H02S50/00 Primary

  Monitoring or testing of PV systems, e.g. load balancing or fault identification · CPC title

• G01R31/2605 Primary

  Physics · mapped topic

• Y02E10/50

  Photovoltaic [PV] energy · CPC title

• G01R31/2607 Primary

  Circuits therefor (G01R31/2642 takes precedence) · CPC title