Pogo pin and probe card, and method of manufacturing a semiconductor device using the same

US9651577B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9651577-B2
Application numberUS-201414472449-A
CountryUS
Kind codeB2
Filing dateAug 29, 2014
Priority dateSep 10, 2013
Publication dateMay 16, 2017
Grant dateMay 16, 2017

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  1. Title

    What the patent document calls the invention.

  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A pogo pin may include a housing, a resilient connecting member and a switching unit. The housing may be arranged between a printed circuit board (PCB) and a probing head. The resilient connecting member may be arranged in the housing to electrically connect the PCB with the probing head. The switching unit may be provided in the housing to selectively cut off an electrical connection between the PCB and the probing head. Thus, because the PCB may not require additional switching substrates, the PCB may have a small size so that the probe card may also have a small size. A semiconductor device may be manufactured using the probe card.

First claim

Opening claim text (preview).

What is claimed is: 1. A probe card comprising: a printed circuit board (PCB) having a circuit pattern through which a test current passes; a probing head arranged under the PCB, the probing head including circuitry through which the test current passes; a plurality of needles provided to the probing head to supply the test current to an object; and a plurality of pogo pins positioned between the PCB and the probing head, each pogo pin including a housing arranged between the PCB and the probing head, a resilient connecting member arranged in the housing to electrically connect the PCB with the probing head, and a switching unit provided in the housing to selectively cut off an electrical connection between the PCB and the probing head, wherein the resilient connecting member comprises a first spring electrically connected to the PCB, and a second spring electrically connected to the probing head, and wherein the switching unit is configured to move any one of the first spring and the second spring to selectively disconnect the first spring from the second spring. 2. The probe card of claim 1 , further comprising, for each pogo pin: a first connecting pin at a first end of the resilient connecting member; and a second connecting pin at a second, opposite end of the resilient connecting member, wherein the switching unit electrically disconnects the first connecting pin from the second connecting pin. 3. The probe card of claim 2 , wherein: the switching unit includes an actuator connected to any one of the first spring and the second spring, the actuator configured to move any one of the first spring and the second spring so as to electrically disconnect the first connecting pin from the second connecting pin. 4. A pogo pin connected to a printed circuit board (PCB) and a probing head of a probe card and positioned to pass signals between circuitry of the PCB and circuitry of the probing head, the pogo pin comprising: a housing arranged between the PCB and the probing head; at least a first spring arranged to electrically connect and disconnect the PCB and the probing head; at least a first connecting pin between the first spring and the PCB; at least a second connecting pin between the first spring and the probing head; and an actuator and disconnecting member arranged to selectively electrically connect and disconnect one of the first pin and the second pin from the first spring. 5. The pogo pin of claim 4 , wherein the disconnecting member includes one of a raising/lowering element to raise and lower the first spring, and an insulating member that electrically disconnects the first pin or second pin from the first spring. 6. A pogo pin comprising: a housing arranged between a printed circuit board (PCB) and a probing head of a probe card; a resilient connecting member arranged in the housing to electrically connect the PCB with the probing head; and a switching unit provided in the housing to selectively cut off an electrical connection between the PCB and the probing head, wherein the resilient connecting member comprises a first spring electrically connected to the PCB, and a second spring electrically connected to the probing head, and wherein the switching unit is configured to move any one of the first spring and the second spring to selectively disconnect the first spring from the second spring. 7. The pogo pin of claim 6 , wherein the first spring and the second spring comprise a tensile spring. 8. The pogo pin of claim 7 , wherein the switching unit comprises: a switching rod connected to the first spring; and an actuator configured to move the switching rod to disconnect the first spring from the second spring. 9. The pogo pin of claim 7 , wherein the switching unit comprises: an insulating plate selectively interposed between the first spring and the second spring; and an actuator configured to selectively move the insulating plate between the first spring and the second spring. 10. The pogo pin of claim 6 , wherein the first spring and the second spring comprise a compressive spring. 11. The pogo pin of claim 10 , wherein the switching unit comprises: a switching rod connected to the first spring; and an actuator configured to move the switching rod to connect the first spring with the second spring. 12. The pogo pin of claim 6 , wherein the switching unit comprises: a switching rod connected to the resilient connecting member; and an actuator configured to move the switching rod to electrically connect and disconnect at least a portion of the resilient connecting member from the PCB. 13. The pogo pin of claim 6 , further comprising: a first connecting pin arranged between the housing and the PCB to electrically connect the resilient connecting member with the PCB; and a second connecting pin arranged between the housing and the probing head to electrically connect the resilient connecting member with the probing head. 14. The pogo pin of claim 13 , wherein the switching unit comprises: an insulating plate selectively interposed between the first connecting pin and the PCB; and an actuator configured to selectively move the insulating plate between the first connecting pin and the PCB. 15. The pogo pin of claim 13 , wherein the switching unit comprises: an insulating plate selectively interposed between the second connecting pin and the probing head; and an actuator configured to selectively move the insulating plate between the second connecting pin and the probing head.

Assignees

Inventors

Classifications

  • using an intermediate card or back card with apertures through which the probes pass · CPC title

  • Spring-loaded · CPC title

  • using an intermediate adapter, e.g. space transformers (G01R1/07371 takes precedence) · CPC title

  • G01R1/067Primary

    Measuring probes · CPC title

Patent family

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What does patent US9651577B2 cover?
A pogo pin may include a housing, a resilient connecting member and a switching unit. The housing may be arranged between a printed circuit board (PCB) and a probing head. The resilient connecting member may be arranged in the housing to electrically connect the PCB with the probing head. The switching unit may be provided in the housing to selectively cut off an electrical connection between t…
Who is the assignee on this patent?
Samsung Electronics Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01R1/07378. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 16 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).