Avalanche photodiode

Patent metadata

Field	Value
Publication number	US-9640703-B2
Application number	US-66609104-A
Country	US
Kind code	B2
Filing date	Oct 25, 2004
Priority date	Oct 25, 2004
Publication date	May 2, 2017
Grant date	May 2, 2017

Abstract

In an avalanche photodiode provided with a substrate including a first electrode and a first semiconductor layer, formed of a first conductivity type, which is connected to the first electrode, the configuration is in such a way that, at least an avalanche multiplication layer, a light absorption layer, and a second semiconductor layer having a bandgap that is larger than that of the light absorption layer are layered on the substrate; a second conductivity type conductive region is formed in the second semiconductor layer; and the second conductivity type conductive region is arranged so as to be connected to a second electrode. With the foregoing configuration, an avalanche photodiode having a small dark current and a high long-term reliability can be provided with a simple process.
Additionally, the configuration is in such a way that, by removing at least the light absorption layer among the layers which are layered on the peripheral portion, of the substrate, on which the second conductivity type conductive region and the second semiconductor layer around the second conductivity type conductive region are surrounded by that layers, a side face of the light absorption layer is formed. With the configuration, the dark current can be further reduced.

First claim

The invention claimed is:

1. An avalanche photodiode, comprising:
an i-type avalanche multiplication layer including Al;
a light absorption layer disposed above a top surface of the avalanche multiplication layer with respect to a light beam;
an i-type window layer disposed above a top surface of the light absorption layer with respect to the light beam;
a p-type conductive region formed in an upper portion of the window layer and surrounded by the window layer;
a p-type electric field relaxation layer disposed between the avalanche multiplication layer and the light absorption layer, the electric field relaxation layer having a higher carrier concentration than a carrier concentration of the light absorption layer;
a first n-type electrode; and
a second p-type electrode electrically connected to the p-type conductive region.

2. The avalanche photodiode according to claim 1 , wherein peripheral ends of the electrical relaxation layer extend over peripheral boundary between the window layer and the conductive region in horizontal direction.

3. The avalanche photodiode according to claim 1 , wherein the window layer is formed of a semiconductor material having a wider band gap than a material of the light absorption layer.

4. The avalanche photodiode according to claim 1 , further comprising a protective film formed of an insulation material and disposed between the conductive region and the second electrode.

5. The avalanche photodiode according to claim 1 , further comprising a stopper groove which reaches at least the electric field relaxation layer from the window layer.

6. The avalanche photodiode according to claim 5 , further comprising an insulation layer disposed on an inner surface of the stopper groove.

7. The avalanche photodiode according to claim 5 , wherein a shape of the stopper groove is ring-shape or track-shape.

8. The avalanche photodiode according to claim 5 , further comprising a second stopper groove which reaches at least the electric field relaxation layer from the window layer.

Assignees

• Yagyu Eiji
• Ishimura Eitaro
• Nakaji Masaharu
• Mitsubishi Electric Corp

Inventors

• Yagyu Eiji
• Ishimura Eitaro
• Nakaji Masaharu

Classifications

• Y02E10/50

  Photovoltaic [PV] energy · CPC title

• H01L31/1075 Primary

  Electricity · mapped topic

• H01L31/035281

  Electricity · mapped topic

• H01L31/03529

  Electricity · mapped topic

• H10F77/148

  Shapes of potential barriers · CPC title