Construction of entropy-based prior and posterior probability distributions with partial information for fatigue damage prognostics

US9639637B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9639637-B2
Application numberUS-201314015084-A
CountryUS
Kind codeB2
Filing dateAug 30, 2013
Priority dateOct 8, 2012
Publication dateMay 2, 2017
Grant dateMay 2, 2017

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Abstract

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A method for predicting fatigue crack growth in materials includes providing a prior distribution obtained using response measures from one or more target components using a fatigue crack growth model as a constraint function, receiving new crack length measurements, providing a posterior distribution obtained using the new crack length measurements, and sampling the posterior distribution to obtain crack length measurement predictions.

First claim

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What is claimed is: 1. A computer-implemented method for predicting fatigue crack growth in materials, comprising: providing, via a processor, a prior distribution obtained using response measures from one or more target components using a fatigue crack growth model as a constraint function; receiving, via the processor, new crack length measurements; generating, via the processor, a posterior distribution based on the new crack length measurements; sampling, via the processor, the posterior distribution for generating crack length measurement predictions, wherein the prior distribution is expressed as p 0 (θ)∝exp{λM(θ)}, wherein M is the fatigue crack growth model, θ is a fatigue crack growth model parameter, M(θ) is the output of the fatigue crack growth model, and λ is a Lagrange multiplier, and the constraint function is expressed as E p 0 (θ) [M(θ)]= α , wherein α is a mean of the response measures from one or more target components; and the posterior distribution is expressed as p ⁡ ( θ ) ∝ exp ⁡ [ λ ⁢ ⁢ M ⁡ ( θ ) ] ⁢ exp ⁢ { - 1 2 ⁢ ∑ i = 1 n ⁢ ⁢ [ a i - M i ⁡ ( θ ) σ ɛ ] 2 } , where a i represents new crack length measurements associated with the one or more target components, σ ε is a standard deviation of Gaussian likelihood, and n is a total number of new crack length measurements; and wherein the Lagrange multiplier λ is obtained by solving, via the processor, ∂ ln ⁢ ∫ λ ⁢ ⁢ M ⁡ ( θ ) ⁢ ⅆ θ ∂ λ = a _ ; and predicting, via the processor, fatigue crack growth in the material based on the posterior distribution. 2. The computer-implemented method of claim 1 , wherein the posterior distribution is sampled using a Markov-chain Monte-Carlo simulation. 3. The computer-implemented method of claim 1 , wherein σ ε =√{square root over (σ ε 1 2 +σ ε 2 2 )}, wherein σ ε 1 is a standard deviation associated a statistical uncertainty of the fatigue crack growth model M, and σ ε 2 is a standard deviation associated with a measurement uncertainty. 4. The computer-implemented method of claim 1 , further comprising updating the posterior distribution as new crack length measurements are received. 5. The computer-implemented method of claim 1 , wherein the fatigue crack growth model is Paris' model, expressed as ⅆ a ⅆ N = c ⁡ ( Δ ⁢ ⁢ K ) m , wherein a is a crack size, N is a number of applied cyclic loads, Δ ⁢ ⁢ K = π ⁢ ⁢ a ⁢ Δ

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Classifications

  • G06F30/20Primary

    Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) · CPC title

  • Probabilistic or stochastic CAD · CPC title

  • Ageing analysis or optimisation against ageing · CPC title

  • Physics · mapped topic

  • Physics · mapped topic

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What does patent US9639637B2 cover?
A method for predicting fatigue crack growth in materials includes providing a prior distribution obtained using response measures from one or more target components using a fatigue crack growth model as a constraint function, receiving new crack length measurements, providing a posterior distribution obtained using the new crack length measurements, and sampling the posterior distribution to o…
Who is the assignee on this patent?
Guan Xuefei, Zhang Jingdan, Zhou Shaohua Kevin, and 1 more
What technology area does this patent fall under?
Primary CPC classification G06F30/20. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 02 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).