System and method for phase-contrast X-ray imaging using a multi-sector source grating

Patent metadata

Field	Value
Publication number	US-9632040-B2
Application number	US-201514701812-A
Country	US
Kind code	B2
Filing date	May 1, 2015
Priority date	May 9, 2014
Publication date	Apr 25, 2017
Grant date	Apr 25, 2017

Abstract

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.

First claim

What is claimed is:

1. A method for phase contrast imaging of an object using an interferometer comprising a multi-sector source grating, a beam-splitter grating, and an analyzer grating, wherein the object is positioned between the beam-splitter grating and the analyzer grating, the method comprising:
directing an X-ray beam onto the multi-sector source grating, wherein each sector of the multi-sector source grating is offset by a predetermined amount;
obtaining multiple images during a single exposure by translating the object or the interferometer, wherein the multiple images have a different interferometer phasing; and
combining the multiple images that were obtained to produce a phase contrast image of the object.

2. The method according to claim 1 , wherein the multi-sector source grating has greater than three different sectors.

3. The method according to claim 1 , wherein the multiple images are acquired at different angles through the object.

4. The method according to claim 1 , wherein the interferometer has a length about 1.8 m.

5. The method according to claim 1 , wherein the analyzer grating has a thickness of about several tens of centimeters.

6. The method according to claim 1 , wherein the multiple images are obtained using a line detector or a slot scan detector separated by about 1 cm that is positioned behind the analyzer grating.

7. The method according to claim 1 , wherein the multiple images of the object are obtained at angular increments of about 0.3°.

8. The method according to claim 1 , wherein the multiple images comprises four images and an angular range between the four images is about 0.9°.

9. The method according to claim 1 , wherein the analyzer grating comprises multiple glancing angle gratings stacked in order to cover a length of a detector.

10. A device for phase contrast imaging of an object comprising:
an interferometer comprising a multi-sector source grating, a beam-splitter grating, and an analyzer grating, wherein the object is positioned between the beam-splitter grating and the analyzer grating;
an X-ray source operable to direct an X-ray bean onto the multi-sector source grating, wherein each sector of the multi-sector source grating is offset by a predetermined amount;
a translation mechanism operable to translate the object or the interferometer;
a detector operable to obtain multiple images of the object during a single exposure; and
a processor operable to combine the multiple images that were obtained to produce a phase contrast image of the object.

11. The device according to claim 10 , wherein the multi-sector source grating has greater than three different sectors.

12. The device according to claim 10 , wherein the multiple images are acquired at different angles through the object.

13. The device according to claim 10 , wherein the interferometer has a length about 1.8 m.

14. The device according to claim 10 , wherein the analyzer grating has a thickness of about several tens of centimeters.

15. The device according to claim 10 , wherein the detector is a line detector or a slot scan detector and the multiple images are obtained using the line detector or the slot scan detector separated by about 1 cm that is positioned behind the analyzer grating.

16. The device according to claim 10 , wherein the multiple images of the object are obtained at angular increments of about 0.3°.

17. The device according to claim 10 , wherein the multiple images comprises four images and an angular range between the four images is about 0.9°.

18. The device according to claim 10 , wherein the analyzer grating comprises multiple glancing angle gratings stacked in order to cover a length of the detector.

Assignees

• Univ Johns Hopkins

Inventors

• Stutman Dan

Classifications

• A61B6/484

  involving phase contrast X-ray imaging · CPC title

• G01N2223/33

  scanning, i.e. relative motion for measurement of successive object-parts · CPC title

• A61B6/5205

  involving processing of raw data to produce diagnostic data · CPC title

• G01N23/046

  using tomography, e.g. computed tomography [CT] · CPC title

• A61B6/4291

  the detector being combined with a grid or grating · CPC title