Multilayer ceramic capacitor
US-2015179339-A1 · Jun 25, 2015 · US
US9627312B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9627312-B2 |
| Application number | US-201113995525-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 1, 2011 |
| Priority date | Oct 1, 2011 |
| Publication date | Apr 18, 2017 |
| Grant date | Apr 18, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An on-chip capacitor a semiconductive substrate is fabricated in a passivation layer that is above the back-end metallization. At least three electrodes are configured in the on-chip capacitor and power and ground vias couple at least two of the at least three electrodes. The first via has a first-coupled configuration to at least one of the first- second- and third electrodes and the second via has a second-coupled configuration to at least one of the first- second- and third electrodes.
Opening claim text (preview).
What is claimed is: 1. An on-chip capacitor, comprising: a semiconductive substrate including an active surface and a backside surface; a back-end metallization disposed upon the active surface; a passivation structure disposed upon the back-end metallization, wherein the passivation structure includes: at least first, second, and third electrodes that are parallel planar; capacitor first and second dielectric layers between the first and third electrodes; fourth and fifth electrodes; a first via; and a second via; wherein (a) the capacitor first dielectric layer and the capacitor second dielectric layer have the same qualitative chemistries, (b) the first via contacts and penetrates the first electrode and the second via contacts and penetrates the third electrode, (c) the fourth electrode is coplanar with the first electrode and is contacted by the second via, (d) the second electrode is a floater, (e) the fifth electrode is coplanar with the third electrode and contacted by the first via, and (f) the second electrode is above the first electrode and below the third electrode. 2. The on-chip capacitor of claim 1 , wherein the first and fifth electrodes are spaced apart by the second electrode. 3. The on-chip capacitor of claim 1 , wherein the third and the fourth electrodes are spaced apart by the second electrode. 4. The on-chip capacitor of claim 1 , wherein the second via penetrates the fourth electrode. 5. The on-chip capacitor of claim 1 , wherein the first via penetrates the fifth electrode. 6. The on-chip capacitor of claim 5 , wherein the second via penetrates the fourth electrode. 7. The on-chip capacitor of claim 1 , wherein the first via is a power via and the second via is a ground via.
relative to the surface, e.g. recessed, protruding · CPC title
Cross-sectional shape, i.e. in side view · CPC title
Bond pads having multiple stacked layers · CPC title
Materials · CPC title
Structures or relative sizes · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.