Isolated probe with digital multimeter or digital voltmeter

US9625495B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9625495-B2
Application numberUS-201314061327-A
CountryUS
Kind codeB2
Filing dateOct 23, 2013
Priority dateAug 22, 2013
Publication dateApr 18, 2017
Grant dateApr 18, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

First claim

Opening claim text (preview).

The invention claimed is: 1. A probe for use with a test and measurement instrument, comprising: a digital multimeter or voltmeter with an analog-to-digital converter configured to receive a signal from a device under test and determine a digital measurement from the signal; a first controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter; a digital communication interface connected to the first controller configured to communicate with the first controller; a communication link connected to the digital communication interface to communicate with the test and measurement instrument; analog measurement circuitry connected to the device under test configured to receive a signal from a device under test and process the signal from the device under test; an analog signal interface connected to the analog measurement circuitry and the communication link; and a second controller connected to the communication link for connecting the probe to the test and measurement instrument; wherein the second controller communicates with the digital communication interface to receive the digital measurement and the analog signal interface to receive an analog signal from the analog measurement circuitry. 2. The probe of claim 1 , wherein the communication link is an optical fiber, a conductor, a wireless communication link or a radio frequency communication link. 3. The probe of claim 2 , wherein the communication link is the optical fiber. 4. The probe of claim 1 , wherein the controller and the communication link have two-way communication. 5. The probe of claim 1 , wherein the probe is a sensor or transducer. 6. A test and measurement system, comprising: a probe, including: a digital multimeter or voltmeter with an analog-to-digital converter configured to receive signal from a device under test and determine a digital measurement from the signal; a first controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter; a digital communication interface connected to the controller configured to communicate with the first controller; analog measurement circuitry connected to the device under test configured to receive a signal from a device under test and process the signal from the device under test; an analog signal interface connected to the analog measurement circuitry and the communication link; a communication link connected to the digital communication interface and the analog signal interface; a second controller connected to the communication link; and an oscilloscope connected to the probe through the second controller and the communication link; wherein the second controller communicates with the digital communication interface to receive the digital measurement and the analog signal interface to receive an analog signal from the analog measurement circuitry. 7. The test and measurement system of claim 6 , wherein the communication link is an optical fiber, a conductor, a wireless communication link or a radio frequency communication link. 8. The test and measurement system of claim 7 , wherein the communication link is the optical fiber. 9. A method of using a probe with a test and measurement instrument, comprising: measuring a signal from a device under test at the probe; determining a digital measurement from the signal with a digital multimeter or voltmeter with an analog-to-digital converter located within the probe; receiving the digital measurement by a first controller within the probe; communicating the digital measurement from the first controller to a digital communication interface within the probe; communicating the digital measurement from the digital communication interface to a second controller through a communication link; measuring the signal from a device under test and processing the signal from the device under test by analog measurement circuit within the probe; receiving the processed output at an analog signal interface within the probe; sending the digital measurement or the processed output to the test and measurement instrument through the communication link and the second controller; and displaying the digital measurement or the processed output on a display of the test and measurement instrument; wherein the second controller communicates with the digital communication interface to receive the digital measurement and the analog signal interface to receive an analog signal from the analog measurement circuitry. 10. The method of claim 9 , wherein the communication link is an optical fiber, a conductor, a wireless communication link or a radio frequency communication link.

Assignees

Inventors

Classifications

  • for measuring voltage only, e.g. digital volt meters (DVM's) (G01R19/2506 - G01R19/257 take precedence) · CPC title

  • G01R15/125Primary

    for digital multimeters · CPC title

  • Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments (end pieces terminating in a probe H01R11/18) · CPC title

  • for sampling · CPC title

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Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9625495B2 cover?
The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from th…
Who is the assignee on this patent?
Tektronix Inc
What technology area does this patent fall under?
Primary CPC classification G01R15/125. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 18 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).