Thermal camera calibration

Patent metadata

Field	Value
Publication number	US-9621823-B2
Application number	US-88356810-A
Country	US
Kind code	B2
Filing date	Sep 16, 2010
Priority date	Sep 16, 2010
Publication date	Apr 11, 2017
Grant date	Apr 11, 2017

Abstract

A system for calibrating a thermal camera with a calibration target. The calibration target may have a pattern which can be seen on an infrared image captured by the camera. The pattern may be of various kinds. For example, the pattern may be a checkerboard with some, such as every other square, having one emissitivity and the remaining squares having a different emissitivity, or having infrared light sources placed at corners of the squares. A difference between the emmissitivities may be sufficient so that the checkerboard pattern appears in an infrared image captured by the camera for calibration. The calibration may aid in determining intrinsic and extrinsic parameters of the camera. The parameters may provide a basis for transforming camera pixel coordinates to a world coordinate system which allows measurement of real world entities by the thermal camera. Measurements may incorporate distances between objects, heights of objects, and so forth.

First claim

What is claimed is:

1. A system for calibrating a first thermal camera comprising:
a calibration target; and
the first thermal camera, to be calibrated, positioned to capture a first infrared image of calibration target; and
a second thermal camera positioned to capture a second infrared image of the calibration target;
wherein:
the calibration target comprises:
a checkerboard pattern of a plurality of symbols each comprising corner points, wherein at least some of the symbols have a first value of emissitivity and at least some of the symbols have a second value of emissitivity wherein the first value of emissitivity is at least 20% different from the second value of emissitivity; and
a plurality of active infrared light sources, wherein an active infrared light source is positioned at each corner point;

the at first and second values of emissitivities have a contrast perceptible in the first infrared image captured by the first thermal camera;
wherein the first infrared image captured by the first thermal camera is compared with the second infrared image captured by the second thermal camera; and
using the first and second infrared images for calibrating one of the first or second thermal cameras with the other of the first or second thermal cameras.

2. The system of claim 1 , wherein:
every other symbol of the pattern has a first value of emissitivity; and
the remaining symbols of the pattern have a second value of emissitivity.

3. The system of claim 1 , further comprising:
an electro-optic camera for capturing a non-infrared image of the calibration target; and
comparing the first infrared image captured by the first thermal camera with the non-infrared image captured by the electro-optic camera; and
using the first infrared image and the non-infrared image for geometrical calibration of the first thermal camera relative to the electro-optical camera.

4. The system of claim 1 , further comprising:
a processor connected to the first thermal camera; and
wherein:
the first thermal camera is a digital camera;
the processor compares the first infrared image with a standard reference infrared image of the calibration target in a memory of the processor;
if there are one or more differences between the first infrared image and the standard reference infrared image, the processor calibrates the first thermal camera to reduce the one or more differences between the first infrared image and the standard reference infrared image.

5. A method for calibrating a first thermal camera, comprising:
providing a surface of a first material;
placing a diagram of a pattern, having two or more delineated areas, on the surface of the first material;
coating at least one but not all of the delineated areas with a second material having a emissitivity different than a emissitivity of the surface of the first material;
providing a plurality of active infrared light sources on the surface of the first or second material at a plurality of corners of the first or second material; and
using the first thermal camera to capture a first infrared image of the surface of the first material having the second material; and
wherein the first infrared image shows the pattern of the delineated areas with the second material as being distinguishable from the surface of the first material;
the surface of the first material having the second material has a checkerboard pattern of geometric symbols having alternating first and second materials;
the checkerboard pattern is a calibration target; and
a camera calibration toolbox is used to calibrate the first thermal camera relative to intrinsic and extrinsic parameters.

6. The method of claim 5 , further comprising determining calibration characteristics of the first thermal camera from the checkerboard pattern in the first infrared image of the surface of the first material having the second material.

7. The method of claim 5 , further comprising:
using a second thermal camera to capture a second image of the surface of the first material having the second material;
comparing the first and second images; and
calibrating one camera relative to the other camera of the first and second thermal cameras based on the comparing the first and second images.

8. The method of claim 5 , wherein:
the emissitivity of the first material is at least X percent different than the emissitivity of the second material; and
X is 20 percent.

9. The method of claim 5 , wherein the checkerboard pattern comprises geometric symbols exhibiting at least two different emissitivities.

10. The method of claim 5 , further comprising:
using an electro-optical camera for capturing a non-infrared image of the surface of the first material having the second material; and
comparing the first infrared image and the non-infrared image; and
using the first infrared image and the non-infrared image for geometrical calibration of the first thermal camera relative to the electro-optical camera.

11. The method of claim 5 , further comprising comparing the first infrared image with a reference infrared image of the surface of the first material having the second material for calibration of the first thermal camera.

12. An approach for thermal camera calibration, comprising:
providing an infrared calibration target including one or more infrared light emitting diodes;
positioning a thermal camera for capturing an infrared image of the calibration target;
calibrating the thermal camera with the infrared image of the calibration target; and
wherein the calibration target comprises a pattern of shapes having an ascending gradation of a plurality of different emissitivities, wherein a shape of the pattern of shapes has an emissitivity at least 20% different from an adjacent shape.

13. The approach of claim 12 , further comprising:
obtaining intrinsic and/or extrinsic parameters of the thermal camera from the calibrating the thermal camera; and
transforming pixel coordinates of the thermal camera to world coordinates based on the intrinsic and/or extrinsic parameters of the thermal camera.

14. The approach of claim 12 , wherein:
the light emitting diodes are situated at corner points of the shapes.

Assignees

• Ramegowda Dinesh
• Mohideen Mohammed Ibrahim
• Boregowda Lokesh Rayasandra
• Sai Bin
• Venkoparao Vijendran Gopalan
• Honeywell Int Inc

Inventors

• Ramegowda Dinesh
• Mohideen Mohammed Ibrahim
• Boregowda Lokesh Rayasandra
• Sai Bin
• Venkoparao Vijendran Gopalan

Classifications

• H04N17/002 Primary

  for television cameras · CPC title

• H04N23/23

  from thermal infrared radiation · CPC title

• H04N5/33 Primary

  Transforming infrared radiation (cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20) · CPC title