Array substrate and manufacturing method thereof and display device
US-2015311232-A1 · Oct 29, 2015 · US
US9620536B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9620536-B2 |
| Application number | US-201414426464-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 29, 2014 |
| Priority date | Dec 16, 2014 |
| Publication date | Apr 11, 2017 |
| Grant date | Apr 11, 2017 |
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An LTPS array substrate includes a plurality of LTPS thin-film transistors and a bottom transparent conductive layer, a protective layer, and a top transparent conductive layer. Each LTPS thin-film transistor includes a substrate, a patternized light shield layer, a buffering layer, a patternized poly-silicon layer, a gate insulation layer, a gate line, and a common electrode line, an insulation layer, a drain and a source, and a planarization layer that are formed to sequentially stack on each other. The light shield layer covers the scan line and the source/drain. A patternized third metal layer is between the bottom transparent conductive layer and the protective layer and includes a first zone and a second zone intersecting the first zone. The first zone shields the source line. A portion of the second zone overlaps a side portion of the light shield layer that is close to the source/drain electrode.
Opening claim text (preview).
What is claimed is: 1. A low temperature poly-silicon (LTPS) array substrate, comprising a plurality of LTPS thin-film transistors, a bottom transparent conductive layer, a protective layer formed on the bottom transparent conductive layer, and a top transparent conductive layer formed on the protective layer, each of the LTPS thin-film transistors comprising a substrate; a patternized light shield layer formed on the substrate; a buffering layer formed on the substrate and the patternized light shield layer; a patternized poly-silicon layer formed on the buffering layer; a gate insulation layer formed on the patternized poly-silicon layer and the buffering layer; a first metal layer formed on the gate insulation layer, the first metal layer being patternized to form a scan line, the scan line having an orthogonal projection cast on the light shield layer; an insulation layer formed on the patternized first metal layer; a second metal layer formed on the insulation layer, the second metal layer being patternized to form a data line and a source/drain electrode, the data line and the scan line being arranged to intersect each other; a planarization layer formed on the insulation layer and the patternized second metal layer, the bottom transparent conductive layer being formed on the planarization layer, wherein: the patternized light shield layer covers the scan line and the source/drain electrode, a patternized third metal layer being formed between the bottom transparent conductive layer and the protective layer, the patternized third metal layer comprises a first zone and a second zone arranged to intersect the first zone, the first zone shielding the data line, the second zone having a portion overlapping a side portion of the light shield layer that is close to the source/drain electrode so as to shield, in combination with the light shield layer, the source/drain electrode and a portion of the scan line. 2. The LTPS array substrate as claimed in claim 1 , wherein the patternized third metal layer is a touch sensing electrode layer. 3. The LTPS array substrate as claimed in claim 1 , wherein the scan line comprises an extension zone extending therefrom and covering a portion of the patternized poly-silicon layer, the extension zone being shielded by the light shield layer and the second zone. 4. The LTPS array substrate as claimed in claim 1 , wherein the second zone and the light shield layer are arranged to partly overlap so that the second zone and the light shield layer for a shielding zone in a widthwise direction, the widthwise direction is a direction extending from the scan line of the LTPS thin-film transistor toward the source/drain electrode. 5. The LTPS array substrate as claimed in claim 1 , wherein the patternized second metal layer is electrically connected through a via to the poly-silicon layer. 6. The LTPS array substrate as claimed in claim 1 , wherein the top transparent conductive layer is formed on the protective layer and is electrically connected through a via to the source/drain electrode. 7. The LTPS array substrate as claimed in claim 1 , wherein the gate insulation layer is made of one of silicon oxide, silicon nitride, and silicon oxynitride. 8. The LTPS array substrate as claimed in claim 1 , wherein the first metal layer and the second metal layer comprise materials that are electrically conductive materials of molybdenum/aluminum alloys and chromium metal. 9. The LTPS array substrate as claimed in claim 1 , wherein the bottom transparent conductive layer and the top transparent conductive layer are made of transparent conductive materials. 10. The LTPS array substrate as claimed in claim 1 , wherein the third metal layer has a grid configuration.
Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates · CPC title
Electricity · mapped topic
Physics · mapped topic
Wiring, e.g. gate line, drain line · CPC title
Electricity · mapped topic
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