Image symmetry for dip determination

Patent metadata

Field	Value
Publication number	US-9619731-B2
Application number	US-201414781082-A
Country	US
Kind code	B2
Filing date	Mar 31, 2014
Priority date	Mar 29, 2013
Publication date	Apr 11, 2017
Grant date	Apr 11, 2017

Abstract

Methods for dip determination from an image obtained by a down-hole imaging tool. For each pixel forming the image, a probability that a symmetry axis coincides with the pixel is determined. A probability map is then generated, depicting the determined probability of each pixel coinciding with the symmetry axis. The probability map and the image are then superposed to generate a mapped image. The symmetry axis is then estimated based on the mapped image. Image pixels coinciding with a boundary of the geologic feature are then selected in multiple depth zones, and a segment of a sinusoid is fitted to the selected image pixels within each depth zone. Dip within each of the depth zones is then determined based on the fitted sinusoid segments therein.

First claim

What is claimed is:

1. A method, comprising:
conveying a downhole imaging tool of a dip determination system within a borehole, wherein the borehole extends from a wellsite surface to a subterranean formation, and wherein the dip determination system further comprises surface equipment disposed at the wellsite surface;
operating the downhole imaging tool to obtain an image of a geologic feature within the subterranean formation; and
operating the dip determination system to determine an aspect of the geologic feature by:
determining a symmetry axis of the image;
determining a longitudinal component of the feature based on the determined symmetry axis;
determining a transverse component of the feature based on the determined symmetry axis;
splitting the longitudinal component into sections;
combining the longitudinal component sections with the transverse component to determine one or more corresponding sinusoid segments; and
assigning a single dip value to each depth based on the one or more sinusoid segments.

2. The method of claim 1 wherein the image is of a substantially horizontal portion of the borehole.

3. The method of claim 1 wherein determining a symmetry axis of the image comprises determining a probability of symmetry existence at each of a plurality of pixels associated with the geologic feature in the image.

4. The method of claim 3 wherein determining a symmetry axis of the image comprises generating a probability image in which, for each pixel in a given row and column of the image, an associated pixel value corresponds to the probability of the associated pixel being the symmetry axis.

5. The method of claim 4 wherein the row and column of the pixel respectively correspond to depth and azimuth within the borehole.

6. A method, comprising:
conveying a downhole imaging tool of a dip determination system within a borehole, wherein the borehole extends from a wellsite surface to a subterranean formation, and wherein the dip determination system further comprises surface equipment disposed at the wellsite surface;
operating the downhole imaging tool to obtain an image of a geologic feature within the subterranean formation; and
operating the dip determination system to determine an aspect of the geologic feature by:
for each of a plurality of pixels forming the image, determining a probability that a symmetry axis coincides with the pixel;
generating a probability map depicting the determined probability of each pixel coinciding with the symmetry axis;
superposing the probability map and the image to generate a mapped image;
estimating the symmetry axis based on the mapped image;
selecting a plurality of image pixels coinciding with a boundary of the geologic feature in each of a plurality of depth zones;
fitting a segment of a sinusoid to the plurality of selected image pixels within each of the plurality of depth zones; and
determining dip within each of the plurality of depth zones based on the fitted sinusoid segments therein.

7. The method of claim 6 wherein estimating the symmetry axis based on the mapped image comprises:
selecting ones of the plurality of pixels that have a symmetry axis coincidence probability exceeding a predetermined threshold;
interpolating the selected ones to estimate the symmetry axis.

8. The method of claim 6 wherein the symmetry axis defines transverse dip components at any depth.

9. The method of claim 6 wherein determining dip within each of the plurality of depth zones comprises averaging dip values within each of the plurality of depth zones that includes a plurality of overlapping sinusoid segments.

10. The method of claim 6 wherein determining dip within ones of the plurality of depth zones that lack sinusoid segments comprises interpolating dip values from adjacent ones of the plurality of depth zones.

11. The method of claim 10 further comprising flagging the ones of the plurality of depth zones with interpolated dip values as being low quality.

12. The method of claim 6 wherein determining a probability that a symmetry axis coincides with a pixel comprises evaluating similarity between the image of the geologic feature at the same depth and delimited by a first azimuth interval and a mirror image curve at the same depth and delimited by a second azimuth interval, wherein the first and second azimuth intervals extend equally in opposite azimuthal directions from the azimuthal location of the pixel.

13. The method of claim 6 wherein fitting a sinusoid segment to the plurality of selected image pixels within each of the plurality of depth zones comprises fitting the sinusoid segment to the plurality of selected image pixels and a mirror image of the plurality of selected image pixels, wherein the mirror image is relative to the symmetry axis.

14. An apparatus, comprising:
a dip determination system comprising:
a downhole imaging tool conveyable within a borehole that extends from a wellsite surface to a subterranean formation, wherein the downhole imaging tool is operable to obtain an image of a geologic feature within the subterranean formation while disposed in the borehole proximate the geologic feature; and
surface equipment disposed at the wellsite surface and in electrical communication with the downhole image tool;

wherein the dip determination system is operable to determine an aspect of the geologic feature by:
for each of a plurality of pixels forming the image, determining a probability that a symmetry axis coincides with the pixel;
generating a probability map depicting the determined probability of each pixel coinciding with the symmetry axis;
superposing the probability map and the image to generate a mapped image;
estimating the symmetry axis based on the mapped image;
selecting a plurality of image pixels coinciding with a boundary of the geologic feature in each of a plurality of depth zones;
fitting a segment of a sinusoid to the plurality of selected image pixels within each of the plurality of depth zones; and
determining dip within each of the plurality of depth zones based on the fitted sinusoid segments therein.

15. The apparatus of claim 14 wherein estimating the symmetry axis based on the mapped image comprises:
selecting ones of the plurality of pixels that have a symmetry axis coincidence probability exceeding a predetermined threshold;
interpolating the selected ones to estimate the symmetry axis.

16. The apparatus of claim 14 wherein determining dip within each of the plurality of depth zones comprises averaging dip values within each of the plurality of depth zones that includes a plurality of overlapping sinusoid segments.

17. The apparatus of claim 14 wherein determining dip within ones of the plurality of depth zones that lack sinusoid segments comprises interpolating dip values from adjacent ones of the plurality of depth zones.

18. The apparatus of claim 14 wherein determining a probability that a symmetry axis coincides with a pixel comprises evaluating similarity between the image of the geologic feature at the same depth and delimited by a first azimuth interval and a mirror image curve at the same depth and delimited by a second azimuth interval, wherein the first and second azimuth intervals extend equally in opposite azimuthal directions from the azimuthal location of the pixel.

19. The apparatus of claim 14 wherein fitting a sinusoid segment to the plurality of selected image pixels within each of the plurality of depth zones comprises fitting the sinusoid segment to the plurality of

Assignees

• Schlumberger Technology Corp

Inventors

• Akama Taketo
• Kherroubi Josselin
• Etchecopar Arnaud

Classifications

• G06T2207/20076

  Probabilistic image processing · CPC title

• G06T2207/10136

  3D ultrasound image · CPC title

• G06T7/68

  of symmetry · CPC title

• G01V2210/64

  Geostructures, e.g. in 3D data cubes · CPC title

• G01V1/301 Primary

  for determining seismic cross-sections or geostructures · CPC title