Test handler that picks up electronic devices for testing and an orientation-changing apparatus for use in a test handler

Patent metadata

Field	Value
Publication number	US-9618573-B2
Application number	US-201514603251-A
Country	US
Kind code	B2
Filing date	Jan 22, 2015
Priority date	Jan 23, 2014
Publication date	Apr 11, 2017
Grant date	Apr 11, 2017

Abstract

A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.

First claim

The invention claimed is:

1. A test handler comprising:
an orientation changing device comprising a device holder configured to hold electronic devices, the device holder having a vertical rotary axis;
a rotary turret comprising a plurality of pick heads arranged on the rotary turret, each pick head being configured to pick up electronic devices from the device holder at a first position;
a conveying device positioned and configured to convey electronic devices to the device holder at a second position;
a rotary motor connected to the device holder, the rotary motor configured to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on the device holder; and
a mechanism positioned and configured to drive the device holder between the first position spaced from the conveying device, and the second position next to the conveying device.

2. The test handler as claimed in claim 1 , further comprising a cam follower on which the device holder is mounted, and a cam mechanism operative to drive the device holder between the first position spaced from the conveying device, and the second position next to the conveying device.

3. The test handler as claimed in claim 2 , wherein the plurality of pick heads pick up electronic devices from the device holder at the first position, and the device holder receives electronic devices from the linear track at the second position.

4. The test handler as claimed in claim 2 , wherein the rotary motor is connected to the device holder by a shaft, and the rotary motor is mounted together with the cam follower such that the rotary motor is movable together with the device holder.

5. The test handler as claimed in claim 1 , wherein the device holder is operative to rotate the electronic device to align opposing edges along a length of the electronic device with corresponding opposing edges along a length of a vacuum suction cavity of each pick 30 head.

6. The test handler as claimed in claim 5 , wherein the device holder rotates the electronic device by 90 degrees.

7. An orientation changing device for a test handler comprising a rotary turret having a plurality of pick heads arranged on the rotary turret, the orientation changing device comprising:
a device holder configured to hold electronic devices received from a conveying device that is operative to convey the electronic devices to the device holder at a first position, the device holder having a vertical rotary axis;
a rotary motor connected to the device holder, the rotary motor configured to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on the device holder before the electronic device is picked up by a pick head at a second position;
wherein the device holder is positioned and configured to be moved between the first position next to the conveying device and the second position spaced from the conveying device.

Assignees

• Yip Shing Kai
• Cheng Chi Wah
• Asm Tech Singapore Pte Ltd

Inventors

• Yip Shing Kai
• Cheng Chi Wah

Classifications

• G01R1/06705

  Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886) · CPC title

• G01R31/2891 Primary

  related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01N1/00

  Sampling; Preparing specimens for investigation · CPC title

• G01R31/2893

  Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00) · CPC title