Testing resonant sensor circuits using signal sources and controllable resistors

Patent metadata

Field	Value
Publication number	US-9618565-B2
Application number	US-201514611752-A
Country	US
Kind code	B2
Filing date	Feb 2, 2015
Priority date	Feb 2, 2015
Publication date	Apr 11, 2017
Grant date	Apr 11, 2017

Abstract

A test system (and methodology) suitable for testing a resonant sensor circuit configured to drive a sensor resonator with a negative resistance. Example embodiments include a test sensor resonator setup configured to simulate a sensor resonator with a selectable loss factor Rs, and includes, in a single-ended configuration, a first oscillator signal source that generates a first oscillation signal, coupled to a first controllable resistor that provides a controlled resistance R 1 that simulates a selectable sensor resonator loss factor Rs, which together generate a first oscillation voltage signal based on the controlled resistance R 1 . A DUT resonant sensor circuit is coupled to receive the first oscillation voltage signal at a first input, and generate a negative resistance −Ra that substantially counterbalances the resistance R 1 (corresponding to sustained oscillation). A differential configuration includes first and second oscillator signal sources, coupled to first and second controllable resistors R 1 and R 2.

First claim

The inventiom claimed is:

1. A test system suitable for testing a resonant sensor circuit operable with a sensor resonator characterized by a loss factor Rs, the resonant sensor circuit to monitor resonator oscillation voltage, and to drive the sensor resonator with a negative resistance controlled to sustain resonator oscillation, comprising:
a test sensor resonator setup to simulate a sensor resonator with a selectable loss factor Rs, and including
a first oscillator signal source to generate a first oscillation signal, coupled to
a first controllable resistor to provide a controlled resistance R 1 to simulate a selectable sensor resonator loss factor Rs,
the first oscillator signal source and the first controllable resistor to generate a first oscillation voltage signal based on the controlled resistance R 1 ;

a device-under-test (DUT) resonant sensor circuit:
coupled to receive the first oscillation voltage signal at a first input; and
to generate, in response to the first oscillation voltage signal, a negative resistance −Ra that substantially counterbalances the resistance R 1 corresponding to a state of sustained oscillation at the first input.

2. The system of claim 1 , wherein:
the test sensor resonator setup further includes:
a second oscillator signal source to generate a second oscillation signal anti-phase to the first oscillation signal, coupled to
a second controllable resistor to provide a controlled resistance R 2 that simulates the selectable sensor resonator loss factor Rs;

the first and second anti-phase oscillator signal sources and controlled resistances R 1 and R 2 to generate differential first and second oscillation voltage signals at differential first and second inputs to the DUT resonant sensor circuit; and
the DUT resonant sensor circuit to generate, in response to the differential first and second oscillation voltage signals, the negative resistance −Ra that substantially counterbalances the resistances R 1 and R 2 .

3. The system of claim 1 , wherein the DUT resonant sensor circuit is configured for single-ended input, and wherein a boundary condition R 1 <−Ra is used for stability.

4. The system of claim 2 , wherein a boundary condition (2*R 1 =2*R 2 )<−Ra is used for stability.

5. The system of claim 1 , wherein the test sensor resonator setup further includes a first series coupling capacitor between the first controllable resistor and the first input to the DUT resonant sensor circuit to provide an AC impedance that is substantially less than R 1 −Ra.

6. The system of claim 2 , wherein the test sensor resonator setup further includes first and second series coupling capacitors between respectively the first and second controllable resistors, and the differential first and second inputs to the DUT resonant sensor circuit, to provide an AC impedance that is substantially less than 2*R 1 −Ra.

7. The system of claim 1 , wherein the DUT resonant sensor circuit comprises:
a resonant inductive sensor circuit operable with a sensor LC resonator; and
the DUT resonant sensor circuit to generate the negative resistance −Ra by controlling the average amplitude of the first oscillation voltage signal.

8. A method suitable for testing a resonant sensor circuit operable with a sensor resonator characterized by a loss factor Rs, the resonant sensor circuit to monitor resonator oscillation voltage, and to drive the sensor resonator with a negative resistance controlled to sustain resonator oscillation, comprising:
generating a first oscillation voltage signal with a first oscillator signal source, coupled to a first controllable resistor that provides a controlled resistance R 1 that simulates a selectable sensor resonator loss factor Rs;
thereby simulating a sensor resonator with a selectable loss factor Rs;
receiving the first oscillation voltage signal at a first input to a device-under-test (DUT) resonant sensor circuit; and
operating the DUT resonant sensor circuit to generate, in response to the first oscillation voltage signal, a negative resistance −Ra that substantially counterbalances the resistance R 1 corresponding to a state of sustained oscillation at the first input to the DUT resonant sensor circuit.

9. The method of claim 8 :
further comprising generating a second oscillation voltage signal with a second oscillator signal source that is anti-phase to the first oscillation signal source, and a second controllable resistor that provides a controlled resistance R 2 that simulates the selectable sensor resonator loss factor Rs;
the first and second anti-phase oscillator signal sources and controlled resistances R 1 and R 2 generating differential first and second oscillation voltage signals at differential first and second inputs to the DUT resonant sensor circuit; and
the DUT resonant sensor circuit generating, in response to the differential first and second oscillation voltage signals, the negative resistance −Ra that substantially counterbalances the resistances R 1 and R 2 .

10. The method of claim 8 , wherein the DUT resonant sensor circuit is configured for single-ended input, and wherein a boundary condition R 1 <−Ra is used for stability.

11. The method of claim 9 , wherein a boundary condition (2*R 1 =2*R 2 )<−Ra is used for stability.

12. The method of claim 8 , further including a first series coupling capacitor between the first controllable resistor and the first input to the DUT resonant sensor circuit to provide an AC impedance that is substantially less than R 1 −Ra.

13. The method of claim 9 , further including first and second series coupling capacitors between respectively the first and second controllable resistors, and the differential first and second inputs to the DUT resonant sensor circuit, to provide an AC impedance that is substantially less than 2*R 1 −Ra.

14. The method of claim 8 , wherein the DUT resonant sensor circuit is a resonant inductive sensor circuit operable with a sensor LC resonator, to generate the negative resistance −Ra by controlling the average amplitude of the first oscillation voltage signal.

15. A test system suitable for testing a resonant sensor circuit operable with a sensor resonator characterized by a loss factor Rs, the resonant sensor circuit to monitor resonator oscillation voltage, and to drive the sensor resonator with a negative resistance controlled to sustain resonator oscillation, comprising:
a test sensor resonator setup to simulate a sensor resonator with a selectable loss factor Rs, and including
a first oscillator signal source to generate a first oscillation signal, coupled to a first controllable resistor to provide a controlled resistance R 1 that simulates a selectable sensor resonator loss factor Rs,
a second oscillator signal source to generate a second oscillation signal anti-phase to the first oscillation signal, coupled to a second controllable resistor to provide a controlled resistance R 2 that simulates the selectable sensor resonator loss factor Rs;

the first and second anti-phase oscillator signal sources and controlled resistances R 1 and R 2 to generate differential first and second oscillation voltage signals at differential first and second inputs to the DUT resonant sensor circuit; and
a device-under-test (DUT) resonant sensor circuit:
coupled to receive the differential first and second oscillation voltage signal at differential first and second inputs; and
to generate a negative resistance −Ra to control the average amplitude of the differential first and second oscillation voltage signals to substantial counterbalance the first and second resistances

Assignees

• Texas Instruments Inc

Inventors

• Paclibon Frederick
• Reitsma George P

Classifications

• G01R31/2829 Primary

  Testing of circuits in sensor or actuator systems (testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844) · CPC title

• G01R31/2824

  testing of oscillators or resonators · CPC title

• G01R27/26

  Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants {; Measuring impedance or related variables} · CPC title

• G01R27/28

  Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46) · CPC title