Calibration of plenoptic imaging systems
US-9153026-B2 · Oct 6, 2015 · US
US9613417B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9613417-B2 |
| Application number | US-201514638907-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 4, 2015 |
| Priority date | Mar 4, 2015 |
| Publication date | Apr 4, 2017 |
| Grant date | Apr 4, 2017 |
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Calibration for a plenoptic imaging system. The plenoptic imaging system includes a detector array that is subdivided into superpixels. A plenoptic image captured by the detector array of the plenoptic imaging system is accessed. For a row of superpixels, a slice is selected through the row, the selected slice having a Fourier transform with a stronger fundamental component compared to other slices through the row. A pitch of the row of superpixels is determined based on a frequency of the fundamental component of the selected slice. A rotation of the row of superpixels is determined based on a rotation of the selected slice.
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What is claimed is: 1. A method for calibrating a plenoptic imaging system, the plenoptic imaging system including a microlens array and a detector array, the plenoptic imaging system subdividing the detector array into superpixels, the method comprising a processor executing the steps of: accessing a plenoptic image captured by the detector array of the plenoptic imaging system; for a row of superpixels in the plenoptic image, selecting a one-dimensional slice through the row, the selected slice having a one-dimensional Fourier transform with a stronger fundamental component compared to other one-dimensional slices through the row; and determining a pitch of the row of superpixels based on a frequency of the fundamental component of the selected slice, and determining a rotation of the row of superpixels based on a rotation of the plenoptic image relative to the selected slice, wherein the determined pitch is a pitch of the microlens array in terms of pixel size on the detector array and the determined rotation is a rotation of the microlens array relative to the detector array. 2. The method of claim 1 , the method further comprising: determining a plurality of different rotation angles between the selected slice and the plenoptic image; determining a spectral power of the slice at each of the plurality of rotation angles; and selecting the rotation angle associated with the highest spectral power, the selected rotation angle being the rotation of the row of superpixels. 3. The method of claim 2 , wherein determining a spectral power of the slice at each of the plurality of rotation angles further comprises adjusting each of the spectral powers for spectral leakage. 4. The method of claim 3 , wherein adjusting a spectral power for spectral leakage comprises: for a particular rotation angle, determining a spectral power of the slice for different sample sizes of the slice; and selecting the highest spectral power, of the determined spectral powers. 5. The method of claim 1 , wherein determining a pitch of the row of superpixels based on a frequency of the fundamental component of the selected slice is done for a plurality of different focus settings. 6. The method of claim 1 , wherein the slice spans the entire row of superpixels. 7. The method of claim 1 , further comprising: sampling the plenoptic image using a plurality of one-dimensional slices, including the selected slice, where each slice is through a different row of superpixels; determining the spectral power for each of the slices, and the selected slice is the slice having the highest of the determined spectral powers. 8. A plenoptic imaging system comprising: an image-forming optical module characterized by a pupil plane and an image plane; an array of micro-imaging elements located at the image plane or a conjugate thereof; a detector array located at a conjugate of the pupil plane, wherein the detector array is subdivided into superpixels; a processor configured to execute modules; a memory storing the modules, the modules comprising a processing module, the processing module configured to: access a plenoptic image captured by the detector array of the plenoptic imaging system; for a row of superpixels in the plenoptic image, select a one-dimensional slice through the row, the selected slice having a one-dimensional Fourier transform with a stronger fundamental component compared to other one-dimensional slices through the row; and determine a pitch of the row of superpixels based on a frequency of the fundamental component of the selected slice, and determine a rotation of the row of superpixels based on a rotation of the plenoptic image relative to the selected slice, wherein the determined pitch is a pitch of the array of micro-imaging elements in terms of pixel size on the detector array and the determined rotation is a rotation of the array of micro-imaging elements relative to the detector array. 9. The system of claim 8 , wherein the processing module is further configured to: determine a plurality of different rotation angles between the selected slice and the plenoptic image; determine a spectral power of the slice at each of the plurality of rotation angles; and select the rotation angle associated with the highest spectral power, the selected rotation angle being the rotation of the row of superpixels. 10. The system of claim 9 , wherein the processing module is further configured to: adjust each of the determined spectral powers for spectral leakage. 11. The system of claim 10 , wherein the processing module is further configured to: for a particular rotation angle, determine a spectral power of the slice for different sample sizes of the slice; and select the highest spectral power, of the determined spectral powers. 12. The system of claim 8 , wherein the processing module is further configured to: determine a pitch of the row of superpixels based on a frequency of the fundamental component of the selected slice for a plurality of different focus settings. 13. The system of claim 8 , wherein the slice spans the entire row of superpixels. 14. The system of claim 8 , wherein the processing module is further configured to: sample the plenoptic image using a plurality of one-dimensional slices, including the selected slice, where each slice is through a different row of superpixels; determine the spectral power for each of the slices, and the selected slice is the slice having the highest of the determined spectral powers. 15. A non-transitory computer-readable storage medium storing executable computer program instructions for calibrating a plenoptic imaging system that includes a microlens array and a detector array, the plenoptic imaging system subdividing the detector array into superpixels, the instructions executable by the plenoptic imaging system to perform steps comprising: accessing a plenoptic image captured by the detector array of the plenoptic imaging system; for a row of superpixels in the plenoptic image, selecting a one-dimensional slice through the row, the selected slice having a one-dimensional Fourier transform with a stronger fundamental component compared to other one-dimensional slices through the row; and determining a pitch of the row of superpixels based on a frequency of the fundamental component of the selected slice, and determining a rotation of the row of superpixels based on a rotation of the plenoptic image relative to the selected slice, wherein the determined pitch is a pitch of the microlens array in terms of pixel size on the detector array and the determined rotation is a rotation of the microlens array relative to the detector array. 16. The computer-readable storage medium of claim 15 , further comprising: determining a plurality of different rotation angles between the selected slice and the plenoptic image; determining a spectral power of the slice at each of the plurality of rotation angles; and selecting the rotation angle associated with the highest spectral power, the selected rotation angle being the rotation of the row of superpixels. 17. The computer-readable storage medium of claim 16 , wherein determining a spectral power of the slice at each of the plurality of rotation angles further comprises adjusting each of the spectral powers for spectral leakage. 18. The computer-readable storage medium of claim 17 , wherein adjusting a spectral power for spectral leakage comprises: for a particular rotation angle, determining a spectral power of the slice for different sample siz
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