Salt and photoresist composition comprising the same

US9612533B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9612533-B2
Application numberUS-201514601895-A
CountryUS
Kind codeB2
Filing dateJan 21, 2015
Priority dateJan 24, 2014
Publication dateApr 4, 2017
Grant dateApr 4, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A salt which generates an acid by light irradiation, said salt comprising: an acid-labile group having an acetal structure from which group a moiety having a fluorine-containing base-labile group is removed by bring into contact with the acid.

First claim

Opening claim text (preview).

What is claimed is: 1. A salt which generates an acid by light irradiation, said salt comprising: an acid-labile group having an acetal structure from which group a moiety having a fluorine-containing base-labile group is removed by bringing into contact with the acid, and having a group represented by formula (a): wherein X a and X b each independently represent an oxygen atom or a sulfur group; * represents a binding site; and X 1 represents a divalent group represented by formula (X 1 -1), formula (X 1 -2), formula (X 1 -3) or formula (X 1 -4): where R 1 , R 2 , R 3 , R 4 , R 5 and R 6 each independently represents a C1-C6 fluoroalkyl group and * represents a binding site to X a or X b . 2. The salt according to claim 1 which consists of a cation and an anion having the acid-labile group. 3. The salt according to claim 2 wherein the cation is an arylsulfonium cation. 4. The salt according to claim 1 which has a moiety represented by formula (a1): Wherein X a , X b and X 1 are as defined in claim 1 ; a ring W represents a C3-C36 alicyclic hydrocarbon group in which a methylene group can be replaced by an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and in which a hydrogen atom can be replaced by a hydroxy group, a C1-C12 alkyl group, a C1-C12 alkoxy group, a C3-C12 alicyclic hydrocarbon group, a C6-C10 aromatic hydrocarbon group or a combination of any two or more of them; and * represents a binding site. 5. The salt according to claim 4 wherein the ring W is a C6-C 10 alicyclic hydrocarbon group in which a methylene group can be replaced by an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and in which a hydrogen atom can be replaced by a hydroxy group, a C1-C12 alkyl group, a C1-C12 alkoxy group, a C3-C12 alicyclic hydrocarbon group, a C6-C10 aromatic hydrocarbon group or a combination of any two or more of them. 6. The salt according to claim 4 wherein the moiety represented by formula (a1) forms an anion represented by formula (a2): in which X a , X b , X 1 and the ring W are as defined in claim 4 ; L b1 represents a C1-C24 divalent saturated hydrocarbon group where a methylene group can be replaced by an oxygen atom or a carbonyl group and where a hydrogen atom can be replaced by a fluorine atom or a hydroxy group; and Q 1 and Q 2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group. 7. The salt according to claim 6 wherein L b1 is *—CO—O—(CH 2 ) t — where t is an integer of 0 to 6 and * represents a binding site to C(Q 1 )(Q 2 ), or *—CH 2 —O—CO— where * represents a binding site to C(Q 1 ) (Q 2 ). 8. An acid generator which comprises the salt according to claim 1 . 9. A photoresist composition comprising the acid generator according to claim 8 and a resin which has an acid-labile group. 10. The photoresist composition according to claim 9 , further comprising a salt which generates an acid having an acidity weaker than an acid generated from the acid generator. 11. A process for producing a photoresist pattern comprising the following steps (1) to (5): (1) a step of applying the photoresist composition according claim 9 on a substrate, (2) a step of forming a composition film by conducting drying, (3) a step of exposing the composition film to radiation, (4) a step of baking the exposed composition film, and (5) a step of developing the baked composition film.

Assignees

Inventors

Classifications

  • G03F7/0045Primary

    with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title

  • with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title

  • containing halogen · CPC title

  • the macromolecular compound having an alicyclic moiety in a side chain · CPC title

  • C07D317/72Primary

    spiro-condensed with carbocyclic rings · CPC title

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Frequently asked questions

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What does patent US9612533B2 cover?
A salt which generates an acid by light irradiation, said salt comprising: an acid-labile group having an acetal structure from which group a moiety having a fluorine-containing base-labile group is removed by bring into contact with the acid.
Who is the assignee on this patent?
Sumitomo Chemical Co
What technology area does this patent fall under?
Primary CPC classification G03F7/0045. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 04 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).