Chemically amplified positive resist composition and resist pattern forming process
US-12164231-B2 · Dec 10, 2024 · US
US9612533B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9612533-B2 |
| Application number | US-201514601895-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 21, 2015 |
| Priority date | Jan 24, 2014 |
| Publication date | Apr 4, 2017 |
| Grant date | Apr 4, 2017 |
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A salt which generates an acid by light irradiation, said salt comprising: an acid-labile group having an acetal structure from which group a moiety having a fluorine-containing base-labile group is removed by bring into contact with the acid.
Opening claim text (preview).
What is claimed is: 1. A salt which generates an acid by light irradiation, said salt comprising: an acid-labile group having an acetal structure from which group a moiety having a fluorine-containing base-labile group is removed by bringing into contact with the acid, and having a group represented by formula (a): wherein X a and X b each independently represent an oxygen atom or a sulfur group; * represents a binding site; and X 1 represents a divalent group represented by formula (X 1 -1), formula (X 1 -2), formula (X 1 -3) or formula (X 1 -4): where R 1 , R 2 , R 3 , R 4 , R 5 and R 6 each independently represents a C1-C6 fluoroalkyl group and * represents a binding site to X a or X b . 2. The salt according to claim 1 which consists of a cation and an anion having the acid-labile group. 3. The salt according to claim 2 wherein the cation is an arylsulfonium cation. 4. The salt according to claim 1 which has a moiety represented by formula (a1): Wherein X a , X b and X 1 are as defined in claim 1 ; a ring W represents a C3-C36 alicyclic hydrocarbon group in which a methylene group can be replaced by an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and in which a hydrogen atom can be replaced by a hydroxy group, a C1-C12 alkyl group, a C1-C12 alkoxy group, a C3-C12 alicyclic hydrocarbon group, a C6-C10 aromatic hydrocarbon group or a combination of any two or more of them; and * represents a binding site. 5. The salt according to claim 4 wherein the ring W is a C6-C 10 alicyclic hydrocarbon group in which a methylene group can be replaced by an oxygen atom, a sulfur atom, a carbonyl group or a sulfonyl group, and in which a hydrogen atom can be replaced by a hydroxy group, a C1-C12 alkyl group, a C1-C12 alkoxy group, a C3-C12 alicyclic hydrocarbon group, a C6-C10 aromatic hydrocarbon group or a combination of any two or more of them. 6. The salt according to claim 4 wherein the moiety represented by formula (a1) forms an anion represented by formula (a2): in which X a , X b , X 1 and the ring W are as defined in claim 4 ; L b1 represents a C1-C24 divalent saturated hydrocarbon group where a methylene group can be replaced by an oxygen atom or a carbonyl group and where a hydrogen atom can be replaced by a fluorine atom or a hydroxy group; and Q 1 and Q 2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group. 7. The salt according to claim 6 wherein L b1 is *—CO—O—(CH 2 ) t — where t is an integer of 0 to 6 and * represents a binding site to C(Q 1 )(Q 2 ), or *—CH 2 —O—CO— where * represents a binding site to C(Q 1 ) (Q 2 ). 8. An acid generator which comprises the salt according to claim 1 . 9. A photoresist composition comprising the acid generator according to claim 8 and a resin which has an acid-labile group. 10. The photoresist composition according to claim 9 , further comprising a salt which generates an acid having an acidity weaker than an acid generated from the acid generator. 11. A process for producing a photoresist pattern comprising the following steps (1) to (5): (1) a step of applying the photoresist composition according claim 9 on a substrate, (2) a step of forming a composition film by conducting drying, (3) a step of exposing the composition film to radiation, (4) a step of baking the exposed composition film, and (5) a step of developing the baked composition film.
with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title
with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title
containing halogen · CPC title
the macromolecular compound having an alicyclic moiety in a side chain · CPC title
spiro-condensed with carbocyclic rings · CPC title
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