On-chip terahertz thin-film devices
US-2024429627-A1 · Dec 26, 2024 · US
US9608313B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9608313-B2 |
| Application number | US-201615096743-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 12, 2016 |
| Priority date | Apr 13, 2015 |
| Publication date | Mar 28, 2017 |
| Grant date | Mar 28, 2017 |
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Provided is a waveguide feeder. The waveguide feeder includes: a probe aligned at a center of a waveguide aperture at a metal wiring layer of a semiconductor substrate to input and output an electric signal; and an open stub located at a contact surface of a waveguide flange on a ground surface of a semiconductor chip in order to form a ground path of the probe on a surface of the waveguide flange.
Opening claim text (preview).
What is claimed is: 1. A waveguide feeder comprising: a semiconductor substrate; a probe located at a semiconductor metal wiring layer to output an electric signal as an electromagnetic wave or to convert the electromagnetic wave into the electric signal; and an open stub located at a contact surface of an aperture flange in order to form a ground path of the probe on a metallic aperture or a surface of the waveguide flange, wherein the probe and the open stub are configured on the semiconductor substrate. 2. The waveguide feeder of claim 1 , wherein the open stub is configured at a ground surface on the semiconductor substrate which is aligned the contact surface of the waveguide flange. 3. The waveguide feeder of claim 1 , wherein the open stub has a butterfly shape or a rectangular shape, and an upper blade of the open stub is aligned parallel to a lower metal surface of the aperture. 4. The waveguide feeder of claim 1 , wherein the probe is electrically insulated from the open stub. 5. The waveguide feeder of claim 1 , wherein the open stub and the probe are configured by forming a semiconductor wiring layer in a single layer or a multi-layer to be connected to each other through a via, and the open stub is connected to the semiconductor substrate through a contact via. 6. The waveguide feeder of claim 1 , wherein the open stub has a length of L 2 , the length L 2 is adjusted to configure a short circuit with the waveguide flange surface under a chip when a termination of the open stub is viewed from a drive point of a center of the open stub. 7. The waveguide feeder of claim 1 , wherein the probe comprises two poles having a U shape at a termination of the probe. 8. The waveguide feeder of claim 7 , wherein the probe having the U shape is provided parallel to the open probe facing a top surface of the probe by a predetermined length so that a slot line mode is formed. 9. The waveguide feeder of claim 1 , wherein the semiconductor substrate is located at a center of the waveguide aperture rightward and leftward and is aligned at an upper blade surface of the open stub and a bottom surface of the aperture of the waveguide upward and downward. 10. The waveguide feeder of claim 1 , wherein a metal reflector is installed at a point spaced apart from the aperture of the waveguide by a predetermined distance D, and the distance D is adjusted according to an operation frequency. 11. The waveguide feeder of claim 1 , wherein an aperture having a rectangular shape formed on a metal surface on a dielectric substrate is driven using the probe and is used as an aperture antenna. 12. The waveguide feeder of claim 1 , wherein a single pole probe is integrally formed with the open stub. 13. The waveguide feeder of claim 1 , wherein the waveguide feeder has a structure to couple a signal with a transmission line located at a rear surface of an aperture by driving an aperture having a rectangular shape formed on a metal surface on a dielectric substrate using a single pole probe. 14. A transmitter module embedding an on-chip waveguide feeder, the transmitter module comprising: an on-chip waveguide feeder configured to transfer a millimeter wave signal to a waveguide; a power amplifier connected to the waveguide feeder to amplify a signal; and a frequency divider configured to receive a reference signal to provide the millimeter wave signal, wherein waveguide feeder comprises: a semiconductor substrate; a probe located at an aperture of a waveguide to input and output an electric signal; and an open stub located at a contact surface of a waveguide flange in order to form a ground path of the probe on a waveguide flange surface, wherein the probe and the open stub are configured on the semiconductor substrate. 15. The transmitter module of claim 14 , wherein the open stub is configured at a ground surface on the semiconductor substrate which is aligned at the contact surface of the waveguide flange. 16. A receiver module embedding an on-chip waveguide feeder, the receiver module comprising: an on-chip waveguide feeder configured to receive a millimeter wave signal; a low noise amplifier connected to the waveguide feeder to low-noise amplify the received millimeter wave signal; a frequency mixer configured to convert the low-noise amplified signal into a predetermined band; and a frequency divider configured to transfer a location oscillation signal of the frequency mixer, wherein waveguide feeder comprises: a semiconductor substrate; a probe located at an aperture of a waveguide to receive an electric signal; and an open stub located at a contact surface of a waveguide flange in order to form a ground path of the probe on a waveguide flange surface, wherein the probe and the open stub are configured on the semiconductor substrate. 17. The receiver module of claim 16 , wherein the open stub is configured at a ground surface on the semiconductor substrate which is aligned at the contact surface of the waveguide flange. 18. A multi-dimensional array transceiver comprising: a plurality of waveguides configured to serve as an aperture antenna by forming an aperture at a metal surface; and a plurality of transceiving chips having a waveguide feeder structure, the waveguide feeder structure comprises: a semiconductor substrate; a probe located at an aperture of a waveguide to receive an electric signal; and an open stub located at a contact surface of a waveguide flange in order to form a ground path of the probe on a waveguide flange surface, wherein the probe and the open stub are configured on the semiconductor substrate.
for antennas · CPC title
for HF amplifiers · CPC title
Waveguides, e.g. strip lines · CPC title
at high-frequency [HF] or radio frequency [RF] · CPC title
provided with a flange or a choke · CPC title
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