Sputtering target and method for producing same

US9607812B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9607812-B2
Application numberUS-201314380610-A
CountryUS
Kind codeB2
Filing dateFeb 15, 2013
Priority dateFeb 24, 2012
Publication dateMar 28, 2017
Grant dateMar 28, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

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Provided is a sputtering target which contains Na in high concentration and, despite this, is inhibited from discoloration, generating spots, and causing abnormal electrical discharge and which has high strength and rarely breaks. Also provided is a method for producing the sputtering target. The sputtering target has a component composition that contains 10 to 40 at % of Ga and 1.0 to 15 at % of Na as metal element components other than F, S, and Se, with the remainder composed of Cu and unavoidable impurities, wherein the Na is contained in the form of at least one Na compound selected from sodium fluoride, sodium sulfide, and sodium selenide. The sputtering target has a theoretical density ratio of 90% or higher, a flexural strength of 100 N/mm 2 or higher, and a bulk resistivity of 1 mΩ·cm or less. The number of 0.05 mm 2 or larger aggregates of the at least one of sodium fluoride, sodium sulfide, and sodium selenide present per cm 2 area of the target surface is 1 or less on average.

First claim

Opening claim text (preview).

What is claimed is: 1. A sputtering target having a component composition that contains 10 to 40 at % of Ga and 1.0 to 15 at % of Na as metal element components other than F, S, and Se, with the remainder composed of Cu and unavoidable impurities, wherein the Na is contained in the form of at least one Na compound selected from sodium fluoride, sodium sulfide, and sodium selenide, the sputtering target has a theoretical density ratio of 90% or higher, a flexural strength of 100 N/mm 2 or higher, a bulk resistivity of 1 mΩ·cm or less, a content of oxygen of 200 to 2000 ppm, and the number of 0.05 mm 2 or larger aggregates of the Na compound present per cm 2 area of the target surface is 1 or less on average. 2. The sputtering target according to claim 1 , wherein the sputtering target has a structure in which a Na compound phase is dispersed in a target material and the average particle diameter of the Na compound phase is 10 μm or less. 3. The sputtering target according to claim 1 , wherein the average particle diameter of a metal phase in the target material is 20 μm or less. 4. A method for producing the sputtering target according to claim 1 , the method comprising: a step of drying an Na compound powder at a temperature of 70° C. or higher prior to preparing a powder mixture of Na compound powder into the powder and Cu—Ga powder, a step of sintering the powder mixture, wherein the Cu—Ga powder is composed of Cu—Ga alloy powder or Cu—Ga alloy powder and Cu powder, the average particle diameter of the Cu—Ga powder is 1 to 45 μm, and the proportion of the Cu—Ga powder particles having a particle diameter of 30 μm or less is over half of the total powder weight of the Cu—Ga powder. 5. The method for producing a sputtering target according to claim 1 , the method comprising: a step of sintering a powder mixture of Na compound powder and Cu—Ga powder, a step of drying the powder mixture at a temperature of 70° C. or higher, wherein the Cu—Ga powder is composed of Cu—Ga alloy powder or Cu—Ga alloy powder and Cu powder, the average particle diameter of the Cu—Ga powder is 1 to 45 μm, and the proportion of the Cu—Ga powder particles having a particle diameter of 30 μm or less is over half of the total powder weight of the Cu—Ga powder. 6. The method for producing a sputtering target according to claim 4 , the method comprising: sintering the powder mixture in a non-oxidizing atmosphere or in a vacuum in the step of sintering the powder mixture.

Assignees

Inventors

Classifications

  • Use of vacuum · CPC title

  • Sulfides, selenides or tellurides · CPC title

  • Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy · CPC title

  • Plural materials · CPC title

  • Sintering only · CPC title

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What does patent US9607812B2 cover?
Provided is a sputtering target which contains Na in high concentration and, despite this, is inhibited from discoloration, generating spots, and causing abnormal electrical discharge and which has high strength and rarely breaks. Also provided is a method for producing the sputtering target. The sputtering target has a component composition that contains 10 to 40 at % of Ga and 1.0 to 15 at % …
Who is the assignee on this patent?
Mitsubishi Materials Corp
What technology area does this patent fall under?
Primary CPC classification H01J37/3429. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 28 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).