Testing apparatus for electronic device

US9607536B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9607536-B2
Application numberUS-201514677705-A
CountryUS
Kind codeB2
Filing dateApr 2, 2015
Priority dateOct 22, 2014
Publication dateMar 28, 2017
Grant dateMar 28, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A testing apparatus to establish a fault by a process of elimination includes an input unit, a signal converting unit, a switch unit, and a display unit. The input unit receives an input signal and outputs a switch signal. The signal converting unit receives the switch signal and outputs a control signal. The switch unit receives the control signal and outputs a test signal. The display unit receives the test signal and runs a built in self test (BIST) program to test the proper functioning of the display unit. The signal converting unit outputs a data signal and a clock signal to the display unit when the display unit works normally. The signal converting unit not output the data signal and the clock signal to the display unit when the input signal and resulting control signal are repeated.

First claim

Opening claim text (preview).

What is claimed is: 1. A testing apparatus comprising: an input unit configured to receive an input signal and to output a switch signal; a signal converting unit configured to receive the switch signal and to output a control signal; a switch unit configured to receive the control signal and to output a test signal; and a display unit configured to receive the test signal and run a built in self test (BIST) program to test the display unit, wherein the signal converting u…

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Next steps

Free tools are coming soon. Tell us what you want to track and we'll notify you.

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9607536B2 cover?
A testing apparatus to establish a fault by a process of elimination includes an input unit, a signal converting unit, a switch unit, and a display unit. The input unit receives an input signal and outputs a switch signal. The signal converting unit receives the switch signal and outputs a control signal. The switch unit receives the control signal and outputs a test signal. The display unit re…
Who is the assignee on this patent?
Hong Fu Jin Prec Ind (Wuhan) Co Ltd, Hon Hai Prec Ind Co Ltd
What technology area does this patent fall under?
Primary CPC classification G09G3/006. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 28 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).