Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits

Patent metadata

Field	Value
Publication number	US-9607306-B2
Application number	US-201514662109-A
Country	US
Kind code	B2
Filing date	Mar 18, 2015
Priority date	Mar 19, 2014
Publication date	Mar 28, 2017
Grant date	Mar 28, 2017

Abstract

A method and apparatus for identification of a counterfeit electronic component, subjecting a suspected counterfeit electronic to an analytical method of ambient surface analysis to desorb and ionize compounds directly from a suspected counterfeit electronic surface with no pretreatment, detecting the resultant ions, comparing the identified ions to known standards, and returning a confidence that the suspected counterfeit electronic being analyzed is counterfeit.

First claim

What is claimed is:

1. A method for identification of a counterfeit electronic, the method comprising subjecting a suspected counterfeit electronic to an ambient desorption/ionization (ADI) source under atmospheric pressure to energize compounds at a surface of the suspected counterfeit electronic, detecting properties of the compounds at the surface, and comparing the properties of the compounds at the surface to a standard, wherein the standard and the suspected counterfeit electronic are not pretreated.

2. The method of claim 1 , wherein the energy source desorbs and ionizes the compounds at the surface of the suspected counterfeit electronic.

3. The method of claim 2 , wherein detecting properties of the compounds at the surface comprises generating a mass spectrum of ions resulting from the compounds at the surface.

4. The method of claim 2 , wherein the energy source is flowing atmospheric pressure afterglow (FAPA).

5. The method of claim 2 , wherein the energy source is direct analysis in real time (DART).

6. The method of claim 1 , wherein the energy source is selected from the group consisting of ultraviolet light, visible light, near-infrared light, infrared light.

7. The method of claim 1 , wherein comparing the properties of the compounds at the surface to a standard comprises using a chemometric method to process data describing the properties of the compounds at the surface.

8. The method of claim 7 , wherein the chemometric method is a multivariate statistical technique.

9. The method of claim 8 , wherein the multivariate statistical technique is principal component analysis (PCA).

10. The method of claim 9 , wherein comparing the properties of the compounds at the surface to a standard further comprises using the bootstrapped error-adjusted single sample technique (BEAST).

11. The method of claim 7 , wherein the chemometric method is the bootstrapped error-adjusted single sample technique (BEAST).

12. The method of claim 11 , wherein detecting properties of the compounds at the surface comprises generating a mass spectrum of ions resulting from the compounds at the surface and the data comprise mass spectra.

13. The method of claim 1 , wherein the suspected counterfeit electronic is a suspected counterfeit integrated circuit and the standard is derived from a genuine integrated circuit.

14. The method of claim 1 , wherein the suspected counterfeit electronic is suspected of being altered by blacktopping.

15. A method for identification of a counterfeit electronic, the method comprising subjecting a suspected counterfeit integrated circuit to an ambient desorption/ionization (ADI) source under atmospheric pressure to ionize and desorb compounds at a surface of the suspected counterfeit electronic, generating a mass spectrum of ions resulting from the compounds at the surface, and comparing the mass spectrum to a standard using a chemometric method.

16. The method of claim 15 , wherein the chemometric method is selected from the group consisting of principal component analysis (PCA), the bootstrapped error-adjusted single sample technique (BEAST), and a combination thereof.

17. An apparatus for identification of a counterfeit electronic, the apparatus comprising an ambient desorption/ionization (ADI) source to desorb and ionize compounds directly from a surface of a suspected counterfeit electronic under atmospheric pressure with no pretreatment, a mass spectrometry detector coupled to the ADI source to detect ions resulting from the surface, and at least one programmable machine programmed for comparing the ions to a standard by a chemometric method and returning a confidence that the suspected counterfeit electronic being analyzed is counterfeit.

18. The apparatus of claim 17 wherein the chemometric method is selected from the group consisting of principal component analysis (PCA) and the bootstrapped error-adjusted single sample technique (BEAST).

19. A method for identification of a counterfeit electronic, the method comprising subjecting a suspected counterfeit electronic to an ambient desorption/ionization (ADI) source under atmospheric pressure to energize compounds at a surface of the suspected counterfeit electronic, detecting properties of the compounds at the surface, and comparing the properties of the compounds at the surface to a standard, wherein the chemometric method is selected from the group consisting of principal component analysis (PCA) and the bootstrapped error-adjusted single sample technique (BEAST).

Assignees

• Univ Indiana Res & Tech Corp
• Us Navy
• Univ Indiana Res & Tech Corp

Inventors

• Hieftje Gary M
• Ray Steven J
• Pfeuffer Kevin P
• Shelley Jacob T
• Caldwell Norris J

Classifications

• G06Q30/0185 Primary

  Product, service or business identity fraud · CPC title

• G06F19/70

  Physics · mapped topic

• H01J49/142

  using a solid target which is not previously vapourised · CPC title

• G16C99/00

  Subject matter not provided for in other groups of this subclass · CPC title