Radiation inspecting apparatus

Patent metadata

Field	Value
Publication number	US-9606072-B2
Application number	US-201514735112-A
Country	US
Kind code	B2
Filing date	Jun 9, 2015
Priority date	Jun 9, 2015
Publication date	Mar 28, 2017
Grant date	Mar 28, 2017

Abstract

In an X-ray inspecting apparatus, a rotational fluctuation amount of a stage is calculated around a power transmission part of the stage and a stage drive unit as a base point, i.e., the X-axis and Y-axis sliding parts, in accordance with detected positional information from a position detecting sensor. Then, a stage shift amount is calculated in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position on the stage. Here, the stage shift amount corresponds to a positional deviation of the stage at the imaging position caused by an attitude variation of the stage in a yawing direction, and thus is an error in repeated positioning. Accordingly, a tomographic image with high resolution can be generated in consideration of the error in repeated positioning.

First claim

The invention claimed is:

1. A radiation inspecting apparatus having a radiation source emitting X-ray radiation to an inspection object, a radiation detector detecting X-ray radiation passing through the inspection object to capture projection images, and a stage disposed between the radiation source and the radiation detector for supporting the inspection object placed thereon, the stage being held movably in a substantially linear direction relative to guiding units, the radiation inspecting apparatus comprising:
a stage drive unit transmitting driving power to the stage for moving the stage;
a position detecting sensor detecting a position of the stage;
a rotational fluctuation amount calculating unit calculating a rotational fluctuation amount of the stage representing inclination of the stage relative to the guiding units in accordance with detected positional information from the position detecting sensor upon imaging of the inspection object;
a stage shift amount calculating unit calculating a stage shift amount in accordance with the rotational fluctuation amount; and
an image reconstructing unit correcting a positional deviation of the stage in accordance with the stage shift amount and reconstructing the images.

2. The radiation inspecting apparatus according to claim 1 , wherein
the rotational fluctuation amount calculating unit calculates the rotational fluctuation amount of the stage in accordance with the detected positional information from the position detecting sensor upon calibration of the stage drive unit with a calibration phantom and the detected positional information from the position detecting sensor upon the imaging of the inspection image.

3. The radiation inspecting apparatus according to claim 1 , wherein
the stage drive unit is disposed adjacent to a first edge of the stage, and the position detecting sensor is disposed adjacent to a second edge of the stage opposite to the first edge.

4. The radiation inspecting apparatus according to claim 2 , wherein
the stage drive unit is disposed adjacent to a first edge of the stage, and the position detecting sensor is disposed adjacent to a second edge of the stage opposite to the first edge.

5. The radiation inspecting apparatus according to claim 1 , wherein
the stage is moved in at least two directions along an X-axis and a Y-axis,
the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are each disposed in parallel on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and
an additional guiding unit is disposed on only one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis.

6. The radiation inspecting apparatus according to claim 2 , wherein
the stage is moved in at least two directions along an X-axis and a Y-axis,
the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are each disposed in parallel on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and
an additional guiding unit is disposed on only one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis.

7. The radiation inspecting apparatus according to claim 3 , wherein
the stage is moved in at least two directions along an X-axis and a Y-axis,
the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are each disposed in parallel on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and
an additional guiding unit is disposed on only one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis.

8. The radiation inspecting apparatus according to claim 5 , wherein
the position detecting sensor is disposed on either the X-axis or the Y-axis with a larger gap, the larger gap being recognized through comparison of a gap between the guiding unit on one of the edges of the stage along the X-axis disposed opposite to the stage drive unit on the X-axis and the stage drive unit on the X-axis with a gap between the guiding unit on one of the edges of the stage along the Y-axis disposed opposite to the stage drive unit on the Y-axis and the stage drive unit on the Y-axis.

9. The radiation inspecting apparatus according to claim 1 , wherein
the stage is moved in at least two moving directions along the X-axis and the Y-axis, and
the stage drive unit and the position detecting sensor are provided in each of the moving directions.

10. The radiation inspecting apparatus according to claim 2 , wherein
the stage is moved in at least two moving directions along the X-axis and the Y-axis, and
the stage drive unit and the position detecting sensor are provided in each of the moving directions.

11. The radiation inspecting apparatus according to claim 3 , wherein
the stage is moved in at least two moving directions along the X-axis and the Y-axis, and
the stage drive unit and the position detecting sensor are provided in each of the moving directions.

12. The radiation inspecting apparatus according to claim 1 , further comprising:
an imaging system drive unit driving at least either the radiation source or the radiation detector.

13. A radiation inspecting apparatus having a radiation source emitting X-ray radiation to an inspection object, a radiation detector detecting X-ray radiation passing through the inspection object to capture a projection image, and a stage disposed between the radiation source and the radiation detector for supporting the inspection object placed thereon, the stage being held movably in a substantially linear direction relative to guiding units, the radiation inspecting apparatus comprising:
a stage drive unit transmitting driving power to the stage for moving the stage;
a position detecting sensor detecting a position of the stage;
a rotational fluctuation amount calculating unit calculating a rotational fluctuation amount of the stage representing inclination of the stage relative to the guiding units in accordance with detected positional information from the position detecting sensor upon imaging of the inspection object;
a stage shift amount calculating unit calculating a stage shift amount in accordance with the rotational fluctuation amount;
a pixel shift amount converting unit converting the stage shift amount into a pixel shift amount on the projection image; and
a positional deviation correcting unit moving the projection image in accordance with the pixel shift amount in a direction in which a positional deviation is eliminated.

Assignees

• Shimadzu Corp

Inventors

• Tagawa Yusuke
• Oohara Hiroshi
• Ueno Yoshihiro

Classifications

• G01T7/08

  Means for conveying samples received · CPC title

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title