Quantitative analysis method for measuring target element in specimen using laser-induced plasma spectrum

Patent metadata

Field	Value
Publication number	US-9606065-B2
Application number	US-201314104888-A
Country	US
Kind code	B2
Filing date	Dec 12, 2013
Priority date	Dec 13, 2012
Publication date	Mar 28, 2017
Grant date	Mar 28, 2017

Abstract

Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for analyzing a composition ratio of a target element by calculating peak intensities when peaks overlap each other in a spectrum, and a method for selecting a peak of a wavelength at which the highest precision and reproducibility are secured through linearity of a correlation plot of the peak intensities and a value by dividing a standard deviation value of calibration curve data (peak intensity ratios) by a slope when an internal standard method is used for quantitative analysis of a target element.

First claim

What is claimed is:

1. A quantitative analysis method for measuring a target element in a specimen, comprising:
obtaining a spectrum generated from laser-induced plasma upon irradiation of a laser beam to a specimen including a target element;
obtaining a fitting curve of a remaining element from the spectrum using Lorentzian function as a curve fitting method;
obtaining a peak curve of the target element by subtracting the fitting curve of a remaining element from the spectrum;
calculating a peak intensity of the peak curve of the target element and a peak intensity of the fitting curve of a remaining element; and
obtaining a composition ratio of the target element based on a ratio of the peak intensity of the peak curve of the target element to the peak intensity of the fitting curve of the remaining element,
wherein, when the correlation plot is represented by a straight line passing through the origin, the selected wavelengths are wavelengths at which a slope change is small with respect to laser energy change.

2. The quantitative analysis method according to claim 1 , wherein the composition ratio of the target element is measured by applying peak intensities at wavelengths, selected by analyzing a correlation plot of peak intensities obtained by changing laser energy, to an internal standard method.

3. The quantitative analysis method according to claim 2 , wherein, when the correlation plot is represented by a straight line passing through the origin, the selected wavelengths are wavelengths at which a coefficient of determination R 2 is large.

4. The quantitative analysis method according to claim 2 , wherein, when the correlation plot obtained from the peak intensities at the selected wavelengths is represented by a straight line passing through the origin, a slope of the straight line is compared with a slope of a fitted straight line of a correlation plot of a material, the composition ratio of the target element of which is known in advance.

5. The quantitative analysis method according to claim 1 , wherein the obtaining a composition ratio of the target element comprises:
obtaining a calibration curve using each peak intensity ratio and a composition ratio of each element;
calculating values of

σ

R
i

S

(σ Ri is a standard deviation of ratios of the peak intensities, and S is a slope of the calibration curve) from the calibration curve; and
selecting peaks at wavelengths at which the values of

σ

R
i

S

are small, and measuring the composition ratio of the target element by applying the intensities of the selected peaks to an internal standard method.

6. The quantitative analysis method according to claim 5 , wherein ratios of peak intensities at the selected wavelengths are substituted into the calibration curve to obtain the composition ratio of the target element.

7. The quantitative analysis method according to claim 1 , wherein a transformation equation for peak fitting is represented by Equation 1:

y
=

1
π

⁢

∑
i

⁢

(

A
i

⁢

γ
i

(

x
-

x
i

)

2

+

γ
i
2

)

+
ax
+
b

,

wherein A i is peak intensity.

Assignees

• Gwangju Inst Science & Tech

Inventors

• Jeong Sungho
• In Jeonghwan
• Kim Chan Kyu
• Lee Seokhee

Classifications

• G01J3/28

  Investigating the spectrum (using colour filters G01J3/51) · CPC title

• G01J3/443

  Emission spectrometry · CPC title

• G01N21/718 Primary

  Laser microanalysis, i.e. with formation of sample plasma · CPC title

• G01N21/31 Primary

  Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)} · CPC title

• G01N21/71

  thermally excited · CPC title