Methods and apparatus segmented calibration of a sensing optical fiber

Patent metadata

Field	Value
Publication number	US-9606021-B2
Application number	US-201414899827-A
Country	US
Kind code	B2
Filing date	Jun 16, 2014
Priority date	Jun 18, 2013
Publication date	Mar 28, 2017
Grant date	Mar 28, 2017

Abstract

Optical frequency domain reflectometry (OFDR) circuitry to perform tasks on an optical fiber to generate calibration or correction data for calibrating or correcting a reference OFDR data set. A segmented technique is used which permits precise and accurate determination of the correction data for even initial and long fiber lengths. Correction information for each segment is stitched together to generate the correction data for the fiber.

First claim

The invention claimed is:

1. A method comprising the steps of:
a—placing an optical fiber into an initial configuration;
b—determining an initial optical frequency domain reflectometry (OFDR) data set including phase information for the optical fiber in the initial configuration;
c—placing a first segment of the optical fiber into a predetermined configuration;
d—determining a first segment OFDR data set including phase information for the first segment of the optical fiber in the predetermined configuration;
e—placing a next segment of the optical fiber into the predetermined configuration, the next segment overlapping a portion of the first segment in the predetermined configuration;
f—determining a next segment OFDR data set including phase information for the next segment of the optical fiber in the predetermined configuration;
g—matching the first segment OFDR data set with a corresponding first portion of the initial OFDR data set;
h—matching the next segment OFDR data set with a corresponding next portion of the initial OFDR data set;
i—comparing phase information from matching OFDR data sets for the first and next segments in the overlapping portion of the first segment and the overlapping portion of the next segment to determine a phase difference for the overlapping portions;
j—using the phase difference to correct the next segment phase information;
k—extending the first segment phase information using the corrected next segment phase information to generate segment correction data, where at least some of the corrected next segment phase information is for a portion of the next segment that does not overlap the first segment; and
l—storing the segment correction data.

2. The method in claim 1 , further comprising modifying the initial OFDR data set using the segment correction data to generate an OFDR reference data set.

3. The method in claim 1 , wherein the correction data compensates for changes in temperature or strain that occur between the OFDR data set for initial configuration and the OFDR data set for the predetermined configuration.

4. The method in claim 1 , further comprising:
generating a measurement OFDR data set for a sensing application;
comparing the measurement OFDR data set to the initial OFDR data set to determine tracked phase differences;
combining the segment correction data to correct the tracked phase differences; and using the corrected phase differences in the sensing application.

5. The method in claim 1 , further comprising:
determining a phase differential between the segment correction data and initial OFDR data set;
modifying the initial OFDR data set with the determined phase differential to generate a reference OFDR data set; and
using the reference OFDR data set in processing a measurement OFDR data set for a sensing application.

6. The method in claim 1 , wherein the initial configuration is the fiber wrapped around a spool.

7. The method in claim 1 , wherein the predetermined configuration is a straight line.

8. The method in claim 1 , wherein a length of the fiber is greater than 2 meters and a length of the first segment is on the order of 1 meter.

9. The method in claim 1 , wherein the first segment is located along the optical fiber at other than either end of the fiber.

10. The method in claim 1 , wherein the optical fiber includes multiple cores and the method further comprises using the segment correction data to correct for a wobble factor associated with the optical fiber.

11. The method in claim 1 , wherein the optical fiber includes multiple cores and the method further comprises using the segment correction data to correct for a twist factor associated with the multiple cores in the optical fiber.

12. The method in claim 1 , further comprising:
performing steps c-1 for additional segments of the optical fiber to generate and store further segment correction data for the additional segments of the optical fiber.

13. The method in claim 1 , further comprising:
determining different stitching locations along the overlapped portion between the first and next segments;
determining corrected next segment phase information for each of the different stitching locations;
evaluating the corrected next segment phase information for each of the different stitching locations; and
selecting one of the different stitching locations to use based on the evaluation.

14. The method in claim 12 , wherein the extending step includes stitching together segment phase information for the first, next, and additional segments of the optical fiber.

15. The method in claim 13 , wherein the fiber is a multicore fiber with multiple cores, and wherein the selected stitching location is associated with a lowest twist discontinuity for the multiple cores relative to the other stitching locations.

16. Apparatus comprising:
optical frequency domain reflectometry (OFDR) circuitry configured to perform the following tasks:
a—determine an initial OFDR data set including phase information for an optical fiber positioned in an initial configuration;
b—determine a first segment OFDR data set including phase information for the first segment of the optical fiber in a predetermined configuration;
c—determine a next segment OFDR data set including phase information for a next segment of the optical fiber positioned into the predetermined configuration, the next segment overlapping a portion of the first segment in the predetermined configuration;
d—match the first segment OFDR data set with a corresponding first portion of the initial OFDR data set;
e—match the next segment OFDR data set with a corresponding next portion of the initial OFDR data set;
f—compare phase information from matching OFDR data sets for the first and next segments in the overlapping portion of the first segment and the overlapping portion of the next segment to determine a phase difference for the overlapping portions;
g—use the phase difference to correct the next segment phase information;
h—extend the first segment phase information using the corrected next segment phase information to generate segment correction data, where at least some of the corrected next segment phase information is for a portion of the next segment that does not overlap the first segment; and

a memory configured to store the segment correction data.

17. The apparatus in claim 16 , wherein the OFDR circuitry is further configured to modify the initial OFDR data set using the segment correction data to generate an OFDR reference data set.

18. The apparatus in claim 16 , wherein the correction data compensates for changes in temperature or strain that occur between the OFDR data set for initial configuration and the OFDR data set for the predetermined configuration.

19. The apparatus in claim 16 , wherein the OFDR circuitry is further configured to:
generate a measurement OFDR data set for a sensing application;
compare the measurement OFDR data set to the initial OFDR data set to determine tracked phase differences;
combine the segment correction data to correct the tracked phase differences; and use the corrected phase differences in the sensing application.

20. The apparatus in claim 16 , wherein the OFDR circuitry is further configured to:
determine a phase differential between the segment correction data and initial OFDR data set;
modify the initial OFDR data set with the determined phase differential to generate a reference OFDR data set; and
use the reference OFDR data set in processing a me

Assignees

• Intuitive Surgical Operations

Inventors

• Lally Evan M
• White Matthew
• Reaves Matthew T
• Horrell Emily E
• Klute Sandra M
• Castellucci Matthew
• Froggatt Mark E

Classifications

• G01D18/00

  Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 · CPC title

• G01M11/3172 Primary

  Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection · CPC title

• G01K11/32

  using changes in transmittance, scattering or luminescence in optical fibres · CPC title

• G01D5/35354

  Sensor working in reflection · CPC title