Position measurement with illumination profile having regions confined to peripheral portion of pupil

Patent metadata

Field	Value
Publication number	US-9605947-B2
Application number	US-201314391304-A
Country	US
Kind code	B2
Filing date	Feb 7, 2013
Priority date	Apr 12, 2012
Publication date	Mar 28, 2017
Grant date	Mar 28, 2017

Abstract

An apparatus (AS) measures positions of marks ( 202 ) on a lithographic substrate (W). An illumination arrangement ( 940, 962, 964 ) provides off-axis radiation from at least first and second regions. The first and second source regions are diametrically opposite one another with respect to an optical axis (O) and are limited in angular extent. The regions may be small spots selected according to a direction of periodicity of a mark being measured, or larger segments. Radiation at a selected pair of source regions can be generated by supplying radiation at a single source feed position to a self-referencing interferometer. A modified half wave plate is positioned downstream of the interferometer, which can be used in the position measuring apparatus. The modified half wave plate has its fast axis in one part arranged at 45° to the fast axis in another part diametrically opposite.

First claim

The invention claimed is:

1. A method of measuring a position of a mark on a substrate, the mark comprising features periodic in at least a first direction, the method comprising:
illuminating the mark with a spot of radiation via an objective lens and receiving radiation diffracted by the mark via the same objective lens;
processing the diffracted radiation in a self-referencing interferometer;
detecting variations in an intensity of radiation output by the interferometer while scanning the mark with the spot of radiation; and
calculating from the detected variations a position of the mark in at least a first direction of measurement,
wherein said spot of radiation is formed using radiation from source regions confined to a peripheral portion within a pupil of said objective lens, said source regions comprising at least first and second regions diametrically opposite one another with respect to an optical axis of the objective lens and being limited in angular extent with respect to said optical axis.

2. The method of claim 1 wherein said first and second source regions are offset from one another in a direction transverse to said first direction of periodicity of the mark.

3. The method of claim 1 further comprising:
performing further illuminating and processing steps using radiation from at least third and fourth source regions of said pupil plane, said third and fourth source regions being diametrically opposite one another with respect to said optical axis, and being similar in angular and radial extent to the first and second source regions but rotated 90 degrees with respect to said optical axis;
detecting variations in intensity while scanning a mark having features periodic in a second direction orthogonal to said first direction; and
calculating from the detected variations a position of the mark in at least a second direction of measurement.

4. The method of claim 3 wherein radiation from said first, second, third and fourth source regions is used simultaneously to form said radiation spot, and wherein portions of the diffracted radiation are masked selectively depending on whether a mark or part of a mark currently being scanned has features periodic in the first direction or the second direction.

5. The method of claim 3 wherein radiation is supplied selectively either at said first and second source regions or at said third and fourth source regions, depending on whether a mark or part of a mark currently being scanned has features periodic in the first direction or the second direction.

6. The method of claim 3 wherein radiation from said first, second, third and fourth source regions is used simultaneously to form said radiation spot, but with high frequency modulations of intensity and in said detection step radiation originating from the first and second source regions is distinguished from radiation originating from the third and fourth source regions using knowledge of said modulations, whereby the intensity variations used in said calculating step are selected depending on whether a mark or part of a mark currently being scanned has features periodic in the first direction or the second direction.

7. The method of claim 1 wherein coherent radiation at said first and second source regions is generated by feeding radiation at a single source feed position into a second self-referencing interferometer, said first and second source regions being determined by said source feed position.

8. The method of claim 7 wherein the radiation fed into said second interferometer in said illumination step is polarized at 45 degrees to principal axes of said second interferometer.

9. The method of claim 7 wherein the radiation at said first and second source regions emerges from said second interferometer with different polarizations, each polarization being parallel to a different one of said principal axes, and wherein said illumination step further comprises adjusting a polarization of the radiation at one of said source regions to match the polarization at the other source region.

10. The method of claim 1 , further comprising:
measuring asymmetry of the mark or a mark that has undergone similar processing; and
using the measured asymmetry in said calculating step to apply a correction to the measured position,
wherein said asymmetry is measured by comparing intensities of radiation output by the interferometer while illuminating the mark with a spot of radiation using radiation from each of said first and second source regions one at a time.

11. An apparatus for measuring positions of marks on a substrate, the apparatus comprising:
an illumination arrangement for supplying radiation with a predetermined illumination profile across a pupil of the apparatus;
an objective lens for forming a spot of radiation on a mark using radiation supplied by said illumination arrangement while scanning said spot of radiation across the mark in a scanning direction;
a self-referencing interferometer for processing radiation that is diffracted by the mark and re-enters said objective lens; and
a detection arrangement for detecting variations in an intensity of radiation output by the interferometer during said scanning and for calculating from the detected variations a position of the mark in at least a first direction of measurement,
wherein for measuring a position of a mark comprising features periodic in at least a first direction, said illumination profile contains radiation from source regions confined to a peripheral portion within a pupil of said objective lens, said source regions comprising at least first and second regions diametrically opposite one another with respect to an optical axis of the objective lens and being limited in angular extent with respect to said optical axis.

12. The apparatus of claim 11 wherein said first and second source regions are offset from one another in a direction transverse to said first direction of periodicity of the mark.

13. The apparatus of claim 11 wherein for measuring a position of a mark comprising features periodic in a second direction orthogonal to said first direction, said illumination arrangement is further operable to supply radiation from at least third and fourth source regions of said pupil plane, said third and fourth source regions being diametrically opposite one another with respect to said optical axis, and being similar in angular and radial extent to the first and second source regions but rotated 90 degrees with respect to said optical axis.

14. The apparatus of claim 13 wherein said illumination arrangement is operable such that radiation is supplied selectively either at said first and second source regions or at said third and fourth source regions, depending on whether a mark or part of a mark currently being scanned has features periodic in the first direction or the second direction.

15. The apparatus of claim 11 further comprising a beam splitter having a mirrored portion corresponding to each of said source regions for diverting radiation from said source region into said objective lens, wherein the mirrored portion for each source region serves also to stop radiation from the diametrically opposite source region entering the interferometer after zero order reflection from the mark.

16. The apparatus of claim 11 wherein said illumination arrangement includes a second self-referencing interferometer arranged for generating coherent radiation at said first and second source regions from radiation supplied to the second interferometer at a single source feed position, said first and second source regions being d

Assignees

• Asml Holding Nv
• Asml Netherlands Bv

Inventors

• Kreuzer Justin Lloyd
• Den Boef Arie Jeffrey
• Mathijssen Simon Josephus

Classifications

• G03F9/7069 Primary

  Alignment mark illumination, e.g. darkfield, dual focus · CPC title

• F25D3/06

  Movable containers · CPC title

• G01B11/14 Primary

  for measuring distance or clearance between spaced objects or spaced apertures (G01B11/26 takes precedence; rangefinders G01C3/00) · CPC title

• G03F9/7088

  Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection · CPC title

• G01B9/0207

  Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer · CPC title