Systems and methods for measuring current with shielded conductors

Patent metadata

Field	Value
Publication number	US-9603230-B2
Application number	US-201314095724-A
Country	US
Kind code	B2
Filing date	Dec 3, 2013
Priority date	Nov 18, 2013
Publication date	Mar 21, 2017
Grant date	Mar 21, 2017

Abstract

Systems and methods for measuring current with shielded conductors are provided. One system includes a first wire within shielding, wherein the first wire is connected between a high voltage source and a filament of an x-ray system. The system also includes a second wire within shielding, wherein the second wire is connected between the high voltage source and the x-ray system and the shielding of the first and second wires is at a high voltage potential of the x-ray system. The system further includes a measurement resistor at a high voltage potential, wherein the measurement resistor is connected between the shielding and one of the first or second wires.

First claim

What is claimed is:

1. A measurement system comprising:
a first wire within shielding, the first wire connected between a high voltage source and a filament of an x-ray system;
a second wire within shielding, the second wire connected between the high voltage source and the x-ray system, wherein the shielding of the first and second wires is at a high voltage potential of the x-ray system;
a measurement resistor having at least one end at the high voltage potential, the measurement resistor connected between the shielding and one of the first or second wires; and
additional shielding surrounding the shielding of the first and second wires.

2. The measurement system of claim 1 , wherein the high voltage potential is defined by a voltage level of the high voltage source, wherein the voltage level is at least 40 kV.

3. The measurement system of claim 1 , wherein the shielding extends into an x-ray tube of the x-ray system.

4. The measurement system of claim 1 , wherein the shielding comprises a single shielding member surrounding the first and second wires.

5. The measurement system of claim 1 , wherein the shielding comprises a separate shielding member surrounding each of the first and second wires.

6. The measurement system of claim 1 , wherein the additional shielding is at the high voltage potential.

7. The measurement system of claim 1 , wherein the additional shielding is at ground.

8. The measurement system of claim 7 , further comprising at least one additional wire within the additional shielding and at the high voltage potential.

9. The measurement system of claim 8 , wherein the at least one additional wire is non-shielded.

10. The measurement system of claim 7 , further comprising at least one common wire within the additional shielding.

11. The measurement system of claim 1 , wherein the shielding is configured to reduce capacitive current flowing through the first and second wires.

12. The measurement system of claim 1 , wherein the x-ray tube comprises a mono-polar x-ray tube.

13. The measurement system of claim 1 , wherein the x-ray tube comprises a bi-polar x-ray tube.

14. The measurement system of claim 1 , wherein the voltage source comprises a high voltage tank and the measurement resistor is located within the high voltage tank.

15. A measurement system comprising:
at least one wire connected to an electrode of an x-ray tube from which an electron beam is emitted, the at least one wire surrounded by shielding, wherein the shielding is at a voltage level different from ground level;
a current measurement device connected between the at least one wire and the shielding; and additional shielding surrounding the shielding of the a least one wire.

16. The measurement system of claim 15 , wherein the electrode is a cathode and the at least one wire is a cathode current supply wire.

17. The measurement system of claim 15 , wherein the current measurement device is a resistor.

18. The measurement system of claim 15 , wherein the current measurement device comprises one of an inductive member or a Hall sensor.

19. The measurement system of claim 15 , further comprising a high voltage tank supplying power to the x-ray tube and the current measurement device is located within the high voltage tank.

20. An x-ray system comprising:
a gantry;
an x-ray tube mounted to the gantry, the x-ray tube including a filament;
a high voltage tank coupled to the x-ray tube, the high voltage tank configured to power the x-ray tube;
a detector mounted to the gantry opposite the x-ray tube assembly;
a current measurement system including a first wire within shielding, the first wire connected between the high voltage tank and the filament of the x-ray tube, a second wire within shielding, the second wire connected between the high voltage tank and the x-ray tube, and a measurement resistor at a high voltage potential within the voltage tank, the measurement resistor connected between the shielding and one of the first or second wires; and
additional shielding surrounding the shielding of the first and second wires.

Assignees

• Gen Electric
• Gen Electric

Inventors

• Wiedmann Uwe
• Baptiste George William

Classifications

• G01R19/0092

  Measuring current only · CPC title

• G01R1/203

  Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts (resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R) · CPC title

• H05G1/265 Primary

  Measurements of current, voltage or power · CPC title