Impairment compensation

Patent metadata

Field	Value
Publication number	US-9602225-B2
Application number	US-201113283116-A
Country	US
Kind code	B2
Filing date	Oct 27, 2011
Priority date	Jun 28, 2011
Publication date	Mar 21, 2017
Grant date	Mar 21, 2017

Abstract

A method is provided for compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network. The method includes measuring an impaired electrical signal received at an electronic analyzer via the impairment network; applying a stimulus signal to the impairment network; estimating an impairment transfer function corresponding to the impairment based on the applied stimulus signal; and correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.

First claim

What is claimed is:

1. A method of compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network, the method comprising:
measuring an impaired electrical signal received at an electronic analyzer via the impairment network;
applying a stimulus signal to the impairment network, the stimulus signal having a corresponding stimulus waveform;
estimating an impairment transfer function corresponding to the impairment based on the applied stimulus signal; and
correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.

2. The method of claim 1 , wherein the applied stimulus signal comprises a coded pulse sequence.

3. The method of claim 1 , wherein the impairment network comprises a cable and at least one connector connecting the DUT and the electronic analyzer.

4. The method of claim 2 , wherein the impairment network further comprises at least one internal component of the electronic analyzer that drifts with time or at least one internal component of the DUT.

5. The method of claim 1 , wherein estimating the impairment transfer function comprises inferring the impairment transfer function using S-parameter S 11 of the impairment network or directly measuring the impairment transfer function using one of S-parameter S 21 or S 12 of the impairment network.

6. The method of claim 1 , wherein estimating the impairment transfer function comprises:
adjusting the calibration signal to match the electrical signal output from the DUT; and
dividing the measured electrical signal by the adjusted calibration signal.

7. The method of claim 1 , wherein estimating the impairment transfer function comprises:
adjusting a calibration signal to match a negative of the electrical signal output from the DUT; and
mixing the adjusted calibration signal with the electrical signal output from the DUT.

8. The method of compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network, the method comprising:
measuring an impaired electrical signal received at an electronic analyzer via the impairment network;
applying a stimulus signal to the impairment network;
estimating an impairment transfer function corresponding to the impairment based on the applied stimulus signal; and
correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT,
wherein the applied stimulus signal comprises a waveform having variable amplitude so that the impairment transfer function includes nonlinear characteristics of the impairment.

9. The method of claim 2 , wherein the coded pulse sequence comprises one of a pseudorandom bit sequence (PRBS), a prescribed binary sequence, a prescribed pulse sequence of varying pulse widths and pulse amplitudes.

10. The method of claim 2 , wherein the coded pulse sequence is applied continuously in the background.

11. The method of claim 1 , wherein the stimulus signal is applied only during a retrace period or a non-acquisition time of the electronic analyzer.

12. The method of claim 1 , wherein correcting the estimated response of the electrical signal comprises:
dividing the estimated response by the impairment transfer function to obtain corrected estimated response of the electrical signal.

13. The method of claim 1 , further comprising:
correcting a subcarrier distortion of a modulated signal, associated with the electrical signal output by the DUT, during post-processing using the impairment transfer function.

14. A system for compensating for impairment of a test signal transmitted through an impairment network, the system comprising:
a signal generator configured to apply a stimulus signal to the impairment network, the stimulus signal having a corresponding stimulus waveform; and
a processing device configured to measure the test signal after the test signal passes through the impairment network, to estimate an impairment transfer function of the impairment based on a corresponding response to the applied stimulus signal from the impairment network, and to determine impairment correction information based on the measured test signal and the estimated impairment transfer function; and
a correction circuit configured to apply the impairment correction information received from the processing device to the test signal after the test signal passes through the impairment network to provide a corrected test signal.

15. The system of claim 14 , wherein the stimulus signal applied by the signal generator includes a pulse sequence having variable amplitude and variable pulse width.

16. The system of claim 14 , further comprising:
an arbitrary waveform generator configured to generate a calibration signal,
wherein the processor adjusts the calibration signal to match the electrical signal, and estimates the impairment transfer function by dividing the measured electrical signal by the adjusted calibration signal.

17. The method of claim 1 , wherein the stimulus waveform of the applied stimulus signal provides for spectral energies at calibration frequencies.

18. The method of claim 1 , wherein the stimulus waveform of the applied stimulus signal comprises a swept sinusoidal waveform.

19. The method of claim 1 , wherein the stimulus waveform of the applied stimulus signal comprises a stepped-frequency sinusoidal waveform.

20. The method of claim 1 , wherein the impairment transfer function is frequency dependent, and a frequency of the stimulus waveform spans a measurement frequency range of interest, and
wherein a power spectrum of the stimulus signal provides sufficient power at frequencies across a frequency range where correction of the measured electrical signal is required.

Assignees

• Baney Douglas
• Keysight Technologies Inc

Inventors

• Baney Douglas

Classifications

• H04B17/21

  for calibration; for correcting measurements · CPC title

• H04B17/17

  Detection of non-compliance or faulty performance, e.g. response deviations (H04B17/18 takes precedence) · CPC title

• H04B17/0085 Primary

  using test signal generators · CPC title