Sic epitaxial wafer production method
US-2015354090-A1 · Dec 10, 2015 · US
US9598792B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9598792-B2 |
| Application number | US-201213527198-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 19, 2012 |
| Priority date | Jun 21, 2011 |
| Publication date | Mar 21, 2017 |
| Grant date | Mar 21, 2017 |
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A film-forming apparatus and method comprising a film-forming chamber for supplying a reaction gas into, a cylindrical shaped liner provided between an inner wall of the film-forming chamber and a space for performing a film-forming process, a main-heater for heating a substrate placed inside the liner, from the bottom side, a sub-heater cluster provided between the liner and the inner wall, for heating the substrate from the top side, wherein the main-heater and the sub-heater cluster are resistive heaters, wherein the sub-heater cluster has a first sub-heater provided at the closest position to the substrate, and a second sub-heater provided above the first sub-heater, wherein the first sub-heater heats the substrate in combination with the main-heater, the second sub-heater heats the liner at a lower output than the first sub-heater, wherein each temperature of the main-heater, the first sub-heater, and the second sub-heater is individually controlled.
Opening claim text (preview).
What is claimed is: 1. A film-forming apparatus comprising: a film-forming chamber; a cylindrical shaped liner provided between an inner wall of the film-forming chamber and a space for performing a film-forming process; a main-heater configured to heat a substrate placed inside the liner, from the bottom side; a sub-heater cluster provided between the liner and the inner wall, apart from the innter wall and above an outer periphery of the suspector, the sub-heater cluster being configured to heat the substrate from the top side; wherein the main-heater and the sub-heater cluster are resistive heaters; wherein the sub-heater cluster has a first sub-heater provided at the closest position to the substrate, and a second sub-heater provided above the first sub-heater; wherein the first sub-heater heats the substrate in combination with the main-heater, the second sub-heater heats the liner at a lower output than the first sub-heater; wherein each temperature of the main-heater, the first sub-heater, and the second sub-heater is individually controlled. 2. The film-forming apparatus according to claim 1 , wherein the main-heater has a disk-shaped in-heater; a ring-shaped out-heater provided above the in-heater and at the position corresponding to the periphery of the substrate; wherein each temperature of the in-heater and the out-heater are individually controlled. 3. The film-forming apparatus according to claim 1 , further compromising: at least one other sub-heater for heating the liner at a lower output than the first sub-heater; wherein the other sub-heater is provided above the second sub-heater, and the temperature of the other sub-heater is controlled independently of the first sub-heater and the second sub-heater. 4. The film-forming apparatus according to claim 2 , further comprising: at least one other sub-heater for heating the liner at a lower output than the first sub-heater; wherein the other sub-heater is provided above the second sub-heater, and the temperature of the other sub-heater is controlled independently of the first sub-heater and the second sub-heater. 5. A method for forming a film comprising: placing a substrate on a susceptor in a liner provided between an inner wall of a film-forming chamber and a space for performing the film-forming process in the film-forming chamber; heating the substrate to form a film onto the surface of the substrate; wherein the substrate is heated by a main-heater from the bottom side, the substrate is heated by a first sub-heater from the top side, the first sub-heater is provided between the liner and the inner wall, apart from the inner wall and above an outer periphery of the susceptor; wherein an output of the main-heater is controlled depending on the temperature of the substrate, and an output of the first sub-heater is controlled depending on the output of the main-heater; and wherein the liner is heated by a second sub-heater at a lower output than the first sub-heater, the second sub-heater is provided between the liner and the inner wall above the first sub-heater. 6. A film-forming apparatus comprising: a film-forming chamber; a cylindrical shaped liner provided between an inner wall of the film-forming chamber and a space for performing a film-forming process; a main-heater configured to heat a substrate placed on a susceptor inside the liner, from the bottom side; a sub-heater cluster provided between the liner and the inner wall, apart from the inner wall and above an outer periphery of the susceptor, the sub-heater cluster being configured to heat the substrate from the top side; wherein the main-heater and the sub-heater cluster are resistive heaters; wherein the sub-heater cluster has a first sub-heater provided at the closest position to the substrate, and a second sub-heater provided above the first sub-heater; wherein the first sub-heater heats the substrate in combination with the main-heater, the second sub-heater heats the liner at the same output as the first sub-heater; wherein each temperature of the main-heater, the first sub-heater, and the second sub-heater is individually controlled. 7. The film-forming apparatus according to claim 6 , wherein the main-heater has a disk-shaped in-heater; a ring-shaped out-heater provided above the in-heater and at the position corresponding to the periphery of the substrate; wherein each temperature of the in-heater and the out-heater are individually controlled. 8. The film-forming apparatus according to claim 6 , further comprising: at least one other sub-heater for heating the liner is at the same output as the first sub-heater; wherein the other sub-heater is provided above the second sub-heater, and the temperature of the other sub-heater is controlled independently of the first sub-heater and the second sub-heater. 9. The film-forming apparatus according to claim 7 , further comprising: at least one other sub-heater for heating the liner at the same output as the first sub-heater; wherein the other sub-heater is provided above the second sub-heater, and the temperature of the other sub-heater is controlled independently of the first sub-heater and the second sub-heater. 10. A method for forming a film comprising: placing a substrate on a susceptor in a liner provided between an inner wall of a film-forming chamber and a space for performing the film-forming process in the film-forming chamber; heating the substrate to form a film onto the surface of the substrate; wherein the substrate is heated by a main-heater from the bottom side, the substrate is heated by a first sub-heater from the top side, the first sub-heater is provided and between the liner and the inner wall, apart from the inner wall and above an outer periphery of the susceptor; wherein an output of the main-heater is controlled depending on the temperature of the substrate, and an output of the first sub-heater is controlled depending on the output of the main-heater; and wherein the liner is heated by a second sub-heater at a lower output than the first sub-heater, the second sub-heater is provided between the liner and the inner wall above the first sub-heater. 11. A film-forming apparatus comprising: a film-forming chamber; a cylindrical shaped liner provided between an inner wall of the film-forming chamber and a space for performing a film-forming process; a main-heater configured to heat a substrate on a susceptor placed inside the liner, from the bottom side; a sub-heater cluster provided between the liner and the inner wall, apart from the inner wall and above an outer periphery of the susceptor, the sub-heater cluster being configured to heat the substrate from the top side; wherein the main-heater and the sub-heater cluster are resistive heaters; wherein the sub-heater cluster has a first sub-heater provided at the closest position to the substrate, and a second sub-heater provided above the first sub-heater; wherein the first sub-heater heats the substrate in combination with the main-heater, the surface of the second sub-heater heats the liner at the same temperature, or lower temperature, than the surface of first sub-heater; wherein each temperature of the main-heater, the first sub-heater, and the second sub-heater is individually controlled. 12. The film-forming apparatus according to claim 11 , wherein the main-heater has a disk-shaped in-heater; a ring-shaped out-heater provided above the in-heater and at the position corresponding to the periphery of the substrate; wherein each temperature of the in-heater and the out-heater are individually controlled. 13. The film-forming appara
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